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Equipment Information
Àü±âºÐ¹« ÀÌ¿ÂÀ̵¿µµ ºÐ¼® - Áú·® ºÐ¼®±â(Electrospray ionization Ion mobility - Mass spectrometry)
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Equip. Info.
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Reservation
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10145736
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Àü±âºÐ¹« ÀÌ¿ÂÀ̵¿µµ ºÐ¼® - Áú·® ºÐ¼®±â
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Electrospray ionization Ion mobility - Mass spectrometry
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AGILENT
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Agilent 6560
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******[Àåºñ »ç¿ë ¹× ¿¹¾à ¹®ÀÇ]****** 

´ã´çÀÚ : ³ëµ¿¿¬

¿¬¶ôó : nodongyeon@postech.ac.kr

´ã´çÀÚ : ÀÓ´ÙÇý

¿¬¶ôó : imdahye@postech.ac.kr

*******************************


 Q-TOF Mode Specifications

- Mass resolving power : > 42,000 at 2722 m/z

- Mass accuracy : <1 ppm RMS

- Mass range : 100-10,000 m/z extended mass range, 50-1,700 or 100-3,200 m/z for both high resolution and extended dynamic range modes, quadrupole up to 4,000 m/z 


* Ion Mobility Q-TOF Mode Specifications 

- Drift resolution : Greater  than 50

- Collisional cross section accuracy < 2%

Ȱ¿ëºÐ¾ß

The Agilent IM-QTOF LC/MS system is a major advance in the commercial development of analytical ion mobility‑mass spectrometry. Optimized development of a uniform drift field mobility cell and interface to a high resolution Q-TOF instrument gives a significant gain in ion mobility performance. The use of ion funnel technology pioneered by Agilent for both triple quadrupole and Q-TOF instruments over the past three years has been incorporated into the new IM-QTOF system. This has resulted in combined ion mobility separation and mass resolution with high sensitivity.

Recent work with several collaborators has confirmed that the instrument delivers:

• Greater separation of lipids and glycopeptides

• More accurate collision cross section measurements enabling more confident characterization of structural conformations and isomeric compounds 

• Greater numbers of trace level peptides in complex matrices 

• Preservation of structural fidelity of metallo-proteins in liquid phase solutions 


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RIST1µ¿ 1317È£
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À̿ ũ·Î¸¶Åä±×·¡ÇÇ ½Ã½ºÅÛ(Ion Chromatography System)
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Nittoseiko Analytech
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AQF-2100H
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RIST1µ¿ 1318È£
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ijÇÊ·¯¸® À̿ ũ·Î¸¶Åä±×·¡ÇÇ(Capillary Ion Chromatography System)
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Thermo Scientific
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Dionex ICS-5000
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RIST1µ¿ 1320È£
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·¹ÀÌÀú ȸÀý ÀÔÀÚ ºÐ¼®±â(Laser Diffraction Particle Size Analyzer)
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Malvern Instruments
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MASTERSIZER 2000
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RIST1µ¿ 1320È£
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¸¶ÀÌÅ©·ÎÆÄ ½Ã·á ºÐÇØ ½Ã½ºÅÛ(Advanced Microwave Digestion System)
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Milestone
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ETHOS 1
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RIST1µ¿ 1334È£
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HPT-E-CAPº¹ÇÕÇÁ·¹½º(HPT-E-CAP Compound Press System)
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(ÁÖ)¸ðÀνýº
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Ư¼öÁ¦ÀÛ
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RIST1µ¿ 2022È£
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Ź»óÇü Àý´Ü±â(Tabletop Cut-off Machine)
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Struers
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Discotom-100
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RIST2µ¿ 2177È£
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Àüµ¿ µðÁöÅÐ Çö¹Ì°æ(Opto-digital Motorizing Microscope)
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OLYMPUS
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DSX100
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RIST2µ¿ 2179È£
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º¹ÇÕ ºÎ½Ä ½ÃÇè±â(Cyclic Corrosion Tester)
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Q-LAB
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Q-FOG CCT 1100
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RIST3µ¿ 3011È£
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º¹ÇÕ »çÀÌŬ ½ÃÇè±â(Cyclic Corrosion Test Chamber)
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Ascott Analytical
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CC1000iP
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RIST3µ¿ 3016È£
Àåºñ¸í
º¹ÇÕ ºÎ½Ä ½ÃÇè±â(Cyclic Corrosion Tester)
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Q-LAB
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Q-FOG CCT 1100
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RIST3µ¿ 3016È£
Àåºñ¸í
UV-vis ºÐ±¤±¤µµ°è(UV-vis Spectrometer)
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Agilent Technologies
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Cary 4000
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RIST3µ¿ 3102
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Áø°ø è¹ö Á¤¹Ð ºÐ¼® Àåºñ(Vacuum Chamber I-V Probing System)
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MS TECH
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MST5000
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RIST3µ¿ 3102È£
Àåºñ¸í
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System)
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Selcos
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Cetus-E
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RIST3µ¿ 3104È£
Àåºñ¸í
¿­ È­ÇÐ ±â»ó ÁõÂø ÀåÄ¡(Thermal Chemical Vapor Deposition (CVD) System)
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SNTEK
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TCS5000
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RIST3µ¿ 3104È£
Àåºñ¸í
Á¤¹ÐÀÚµ¿Àý´Ü±â(Linear Precision Saw)
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BUEHLER
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ISOMET4000
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RIST3µ¿ 3132È£
Àåºñ¸í
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System)
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iNFOVION
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-
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RIST3µ¿ 3147È£
Àåºñ¸í
½Ç½Ã°£ PCR ½Ã½ºÅÛ(Real-time Polymerase Chain Reaction (PCR) System)
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Roche
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LightCycler96
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RIST3µ¿ 3153È£
Àåºñ¸í
PC Á¦¾î À̹ÌÁö ÀÎ½Ä µµÆ÷ ½Ã½ºÅÛ(PC Control Image Recognition Dispensing System)
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MUSASHI ENGINEERING, INC.
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IMAGE MASTER 350PC SMART/SHOTMASTER 300DS-S
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RIST3µ¿ 3170È£
Àåºñ¸í
3D º¯ÇüÃøÁ¤½Ã½ºÅÛ(3D Deformation Analysis System)
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GOM international AG
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ARAMIS 12M
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RIST3µ¿ 3188È£
Àåºñ¸í
ÁÖ»ç Åõ°ú ÀüÀÚÇö¹Ì°æ(Scanning Transmission Electron Microscope (STEM))
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COXEM
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CX-200
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RIST3µ¿ 3188È£
Àåºñ¸í
RIE ½Ã½ºÅÛ(Reactive Ion Etching (RIE) System)
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SNTEK
¸ðµ¨¸í
-
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RIST3µ¿ 3219È£
Àåºñ¸í
ÇöóÁ ¿øÀÚÃþ ÁõÂø ½Ã½ºÅÛ(Plasma Enhanced Atomic Layer Deposition (PE-ALD) System)
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ForALL
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OZONE
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RIST3µ¿ 3223È£
Àåºñ¸í
ÆÞ½º ·¹ÀÌÀú ÁõÂø ½Ã½ºÅÛ(Pulsed Laser Deposition (PLD) System)
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HIGGSLAB
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PLD SYSTEM
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RIST3µ¿ 3263È£
Àåºñ¸í
Ãʰí¼Ó µðÁöÅÐ Ä«¸Þ¶ó ÀåÄ¡(High-speed Digital Camera System)
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Photron Ltd.
¸ðµ¨¸í
FASTCAM SA1
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RIST3µ¿ 3267È£
Àåºñ¸í
Ãʰí¼Ó µðÁöÅÐ Ä«¸Þ¶ó ÀåÄ¡(High-speed Digital Camera System)
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Photron Ltd.
¸ðµ¨¸í
FASTCAM SA2
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RIST3µ¿ 3267È£
Àåºñ¸í
ÀüÁö ¼º´É ½ÃÇè±â(Multi-cycling Battery Test System)
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Korea Thermo-Tech
¸ðµ¨¸í
SERIES 4000
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RIST3µ¿ 3278È£
Àåºñ¸í
´Ùä³Î Potentiostat(Multi-channel Potentiostat)
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HS Technologies
¸ðµ¨¸í
-
¼³Ä¡Àå¼Ò
RIST3µ¿ 3278È£
Àåºñ¸í
¿­Áß·®-½ÃÂ÷Áֻ翭·®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
Á¦ÀÛ»ç
TA Instruments
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SDT Q600
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RIST3µ¿ 3278È£
Àåºñ¸í
ÆÞ½º ·¹ÀÌÀú ÁõÂø ½Ã½ºÅÛ(Pulsed Laser Deposition (PLD) System)
Á¦ÀÛ»ç
COHERENT
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COMPex Pro 102 F
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RIST3µ¿ 3282È£
Àåºñ¸í
UV-vis ºÐ±¤±¤µµ°è(UV-vis Spectrometer)
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Agilent Technologies
¸ðµ¨¸í
Cary 5000
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RIST3µ¿ 3306È£
Àåºñ¸í
GPC ½Ã½ºÅÛ(Gel Permeation Chromatography (GPC) System)
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Waters
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1525/2414/410
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RIST3µ¿ 3312È£
Àåºñ¸í
¹ÝµµÃ¼ Ư¼º ºÐ¼®±â(Semiconductor Characterization System)
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KEITHLEY Instruments
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4200
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RIST3µ¿ 3340È£
Àåºñ¸í
´Ü°áÁ¤ ¿¢½º·¹ÀÌ È¸ÀýÀåÄ¡(Single Crystal X-ray Diffractometer)
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Bruker
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APEXII Quazar
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RIST3µ¿ 3352/3354È£
Àåºñ¸í
ºÐ¸»½Ã·á ¿¢½º·¹ÀÌ È¸ÀýÀåÄ¡(Powder X-ray Diffractometer)
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Bruker
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D8 Advance
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RIST3µ¿ 3352/3354È£
Àåºñ¸í
X-¼±±¤ÀüÀںб¤ºÐ¼®±â(XPS xonnectable Deposition system)
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ULVAC-PHI, Inc.
¸ðµ¨¸í
PHI GENESIS Multi-tech Scanning XPS
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RIST3µ¿ 3360/3362È£
Àåºñ¸í
½Ç½Ã°£ PCR ½Ã½ºÅÛ(Real-time Polymerase Chain Reaction (PCR) System)
Á¦ÀÛ»ç
Roche
¸ðµ¨¸í
LightCycler480
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°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
Àåºñ¸í
5Ãà º¹ÇÕ °¡°ø±â(5-axis Computerized Numerical Control (CNC) Turning Center)
Á¦ÀÛ»ç
DMG
¸ðµ¨¸í
CTX Beta 1250 TC
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±â°è°øÀÛµ¿ 100È£
Àåºñ¸í
Ãʰí¼Ó µðÁöÅÐ Ä«¸Þ¶ó ÀåÄ¡(High-speed Digital Camera System)
Á¦ÀÛ»ç
Photron Ltd.
¸ðµ¨¸í
FASTCAM Mini UX100
¼³Ä¡Àå¼Ò
±â°è½ÇÇ赿 108È£
Àåºñ¸í
·¹ÀÌÀú ±¸µ¿ ±¤¿ø(Laser-driven Light Source (LSDS))
Á¦ÀÛ»ç
ENERGETIQ TECHNOLOGY
¸ðµ¨¸í
EQ-1500
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±â°è½ÇÇ赿 206È£
Àåºñ¸í
°í¼Ó ¿ø¼ÒºÐ¼®ÀÌ °¡´ÉÇÑ Àü°è ¹æÃâÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(FE-SEM with high speed EDS system)
Á¦ÀÛ»ç
JEOL LTD.
¸ðµ¨¸í
JSM-7800F Prime
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø 101È£
Àåºñ¸í
Áý¼ÓÀ̿ºö(Focused Ion Beam (FIB))
Á¦ÀÛ»ç
FEI
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Nanolab G3 CX
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø 105-4È£
Àåºñ¸í
ÀÌÂ÷ÀÌ¿ÂÁú·®ºÐ¼®±â(Secondary Ion Mass Spectrometry (SIMS))
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CAMECA Instruments
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IMS 6F
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø 105È£
Àåºñ¸í
Áý¼ÓÀ̿ºö(Focused Ion Beam (FIB))
Á¦ÀÛ»ç
FEI
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Helios 600
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³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 104È£
Àåºñ¸í
Áý¼ÓÀ̿ºö(Focused Ion Beam (FIB))
Á¦ÀÛ»ç
FEI
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Helios 650
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³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 104È£
Àåºñ¸í
°¡½º Èñ¼® ½Ã½ºÅÛ(Computerized Gas Dilution System)
Á¦ÀÛ»ç
Environics
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Series 4040
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³ª³ëÀ¶ÇÕ±â¼ú¿ø 311È£
Àåºñ¸í
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope (Cs-corrected HR-STEM))
Á¦ÀÛ»ç
JEOL
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JEM-2200FS
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³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM-2200FS½Ç
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À̿¿¬¸¶±â(Ion Milling System)
Á¦ÀÛ»ç
GL CORPORATION
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PIPS1 691
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³ª³ëÀ¶ÇÕ±â¼ú¿ø ½ÃÆíÁغñ½Ç 312È£
Àåºñ¸í
Àú¿¡³ÊÁö À̿ ¿¬¸¶±â(Gentle Mill (Low Energy Ion Milling System))
Á¦ÀÛ»ç
TechnoOrg Linda
¸ðµ¨¸í
IV5
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø ½ÃÆíÁغñ½Ç 312È£
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
Á¦ÀÛ»ç
LEO Elektronrnmikroskopie GmbH
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FE-SEM
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System)
Á¦ÀÛ»ç
Korea Vacuum Tech
¸ðµ¨¸í
KVE-C300160
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
À¯±â¹° ÁõÂø±â(Organic Molecular Beam Deposition (OMBD) & Thermal Evaporator)
Á¦ÀÛ»ç
alpha-plus
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OMBD & Thermal
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
¼öÀÛ¾÷ ½À½Ä ¼¼Á¤ÀåÄ¡(Air Station (Wet, Gas))
Á¦ÀÛ»ç
ATIS
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Manual Wet Station
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
¼öÀÛ¾÷ ½À½Ä ¼¼Á¤ÀåÄ¡(Air Station (Wet, Gas))
Á¦ÀÛ»ç
ATIS
¸ðµ¨¸í
Manual Wet Station
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
±Ý¼Ó À¯±â¹° È­Çбâ»óÁõÂø ½Ã½ºÅÛ(Metalorganic Chemical Vapor Deposition (MOVCD) System)
Á¦ÀÛ»ç
Jusung Eng.
¸ðµ¨¸í
Eureka 2000
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
¿øÀÚÃþ ÁõÂø±â(Atomic Layer Deposition (ALD))
Á¦ÀÛ»ç
QUROS
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Plus 200
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System)
Á¦ÀÛ»ç
Korea Vacuum Tech
¸ðµ¨¸í
KVE-4000
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³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
ÀÓ°èÄ¡¼ö ÃøÁ¤ ÁÖ»çÀüÀÚÇö¹Ì°æ(Critical Dimension Scanning Electron Microscope (CD-SEM))
Á¦ÀÛ»ç
HITACHI
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S-9380
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³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
½À½Ä ¼¼Á¤ÀåÄ¡(Wet Station (Acid))
Á¦ÀÛ»ç
High Integrated Technology (HIT)
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HWC-MCP
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³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
Àú¾Ð È­ÇÐÁõÂøÀåÄ¡(ÆÛ´Ï½º ŸÀÔ)(Low Pressure Chemical Vapor Deposition (LP-CVD; Furnace Type))
Á¦ÀÛ»ç
(ÁÖ)À¯ÁøÅ×Å©
¸ðµ¨¸í
BJM100
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
ÇöóÁ È­ÇÐ ±â»ó ÁõÂø±â(Plasma Enhanced Chemical Vapor Deposition (PE-CVD))
Á¦ÀÛ»ç
¾ÆÅؽýºÅÛ
¸ðµ¨¸í
UF-CVD 200
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
°íÀü·ù ÀÓÇöõÅÍ(High-Current Implantor)
Á¦ÀÛ»ç
Applied Materials
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VIISion200
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³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
»ó¾Ð È­Çбâ»óÁõÂø¹ý(Atmosphere Pressure Chemical Vapor Deposition (APCVD))
Á¦ÀÛ»ç
Watkins Johnson
¸ðµ¨¸í
WJ-1000T
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
°í¿Â¿­Ã³¸®¿ë V-ÆÛ´Ï½º(High Temperature Process V-Furnace)
Á¦ÀÛ»ç
TEL
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Alpha-808SD
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³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
½À½Ä»êÈ­¿ë V-ÆÛ´Ï½º(Wet Oxidation V-Furnace)
Á¦ÀÛ»ç
TEL
¸ðµ¨¸í
Alpha-808SD
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
°Ç½Ä»êÈ­¿ë V-ÆÛ´Ï½º(Dry Oxidation V-Furnace)
Á¦ÀÛ»ç
TEL
¸ðµ¨¸í
Alpha-808DN
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
ź¼Ò³ª³ëÆ©ºê ÇÕ¼º CVD(Carbon Nanotube (CNT) Synthesis Chemical Vapor Deposition (CVD))
Á¦ÀÛ»ç
¾ÆÅؽýºÅÛ
¸ðµ¨¸í
-
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
ÇöóÁ È­ÇÐ ±â»ó ÁõÂø±â(Plasma Enhanced Chemical Vapor Deposition (PE-CVD))
Á¦ÀÛ»ç
BMR Technology Co.
¸ðµ¨¸í
HiDep-SC
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System)
Á¦ÀÛ»ç
Korea Vacuum Tech
¸ðµ¨¸í
KVE-C300160
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
½Ç¸®ÄÜ °íÁ¾È¾ºñ ½Ä°¢ÀåÄ¡(Deep Reactive Ion Etcher (DRIE))
Á¦ÀÛ»ç
SPTS
¸ðµ¨¸í
Pegasus
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
º¸È£¸·¿ë ÇöóÁ È­ÇÐ ±â»ó ÁõÂø±â(Plasma Enhanced Chemical Vapor Deposition (PE-CVD) for Passivation)
Á¦ÀÛ»ç
TES
¸ðµ¨¸í
TELIA200
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
(GLOCAL)ü¼ººÐºÐ¼®±â(Whole Body Composition Analyzer)
Á¦ÀÛ»ç
EchoMRI LLC
¸ðµ¨¸í
EchoMRI-100H Analyzer
¼³Ä¡Àå¼Ò
»ý¸í°øÇе¿ A210È£
Àåºñ¸í
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JEM-1011
¼³Ä¡Àå¼Ò
»ý¸í°øÇבּ¸¼¾ÅÍ 156È£
Àåºñ¸í
ÃʰíÇØ»óµµ smFRET STORM À̹Ì¡ Àåºñ(Super-resolution smFRET STORM imaging system)
Á¦ÀÛ»ç
ONI
¸ðµ¨¸í
Oxford Nanoimager S
¼³Ä¡Àå¼Ò
»ý¸í°øÇבּ¸¼¾ÅÍ 253È£
Àåºñ¸í
·¹ÀÌÀú ¹Ì¼¼ ÇØºÎ ½Ã½ºÅÛ(Laser Microdissection Microscope System)
Á¦ÀÛ»ç
Carl Zeiss
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PALM MicroBeam
¼³Ä¡Àå¼Ò
»ý¸í°øÇבּ¸¼¾ÅÍ 341È£
Àåºñ¸í
µå¶ø¼¼ÅÍ(Drop Setter for Protein Crystallization)
Á¦ÀÛ»ç
FORMULATRIX
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NT8
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»ý¸í°úÇаü 204È£
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Ź»óÇüÃʰí¼Ó¿ø½ÉºÐ¸®±â(Table-Top Ultracentrifuge)
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Beckman Coulter
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Optima MAX-XP
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¼¼Æ÷¸·´Ü¹éÁú¿¬±¸¼Ò 310È£ °øµ¿±â±â½Ç
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¸ð¼Çĸó ½Ã½ºÅÛ(Motion Capture System)
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Optitrack
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OptiTrack Motion Tracking System
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ÀΰøÁö´É¿¬±¸¿ø 142È£
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Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
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JEOL
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JEM-2100 (HR)
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Á¦1°øÇаü 105È£
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±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope(Cs-corrected HR-STEM))
Á¦ÀÛ»ç
JEOL
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JEM-2200FS (UHR)
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Á¦1°øÇаü 109È£
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Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
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HITACHI
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7600H
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Á¦1°øÇаü 111È£
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X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
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Bruker
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D8 DISCOVERY
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Á¦1°øÇаü 111È£
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LED ÃøÁ¤ ½Ã½ºÅÛ(Wafer-level LED Measurement System)
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WithLight
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OPI-170
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Á¦1°øÇаü 208È£
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¹ÝµµÃ¼ Ư¼º ºÐ¼®±â(Semiconductor Characterization System)
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KEITHLEY Instruments
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4200-SCS
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Á¦1°øÇаü 208È£
Àåºñ¸í
ÇöóÁ È­ÇÐ ±â»ó ÁõÂø±â(Plasma Enhanced Chemical Vapor Deposition (PE-CVD))
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Korea Vacuum Tech
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KVPED-T0583
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Á¦1°øÇаü 210È£
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X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
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Rigaku
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D/MAX-2500-PC
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Á¦1°øÇаü 304-1È£
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚ Çö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
Á¦ÀÛ»ç
PHILIPS ELECTRON OPTICS B.V.
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XL30S FEG
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Á¦1°øÇаü 306-1È£
Àåºñ¸í
¿¢½º¼± ¶ó¿ì¿¡ ȸÀýÆÐÅÏ ÃøÁ¤ÀåÄ¡(X-ray Diffractometer)
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RES-Lab Co.,Ltd.
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XRD mate IPX-LC/B
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Á¦1°øÇаü 406È£
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Ãʰí¼Ó µðÁöÅÐ Ä«¸Þ¶ó ÀåÄ¡(High-speed Digital Camera System)
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(ÁÖ)¾ÅÅ©·Ð
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MotionPro Y7S1
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Á¦1½ÇÇ赿 314È£
Àåºñ¸í
À̿ ũ·Î¸¶Åä±×·¡ÇÇ ½Ã½ºÅÛ(Ion Chromatography System)
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Thermo Scientific
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DIONEX ICS-2100
¼³Ä¡Àå¼Ò
Á¦1½ÇÇ赿 318È£
Àåºñ¸í
À¯µµ °áÇÕ ÇöóÁ Áú·®ºÐ¼®±â(Inductively Coupled Plasma Mass Spectrometer (ICP-MS))
Á¦ÀÛ»ç
PerkinElmer
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NexION-300D
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Á¦1½ÇÇ赿 318È£
Àåºñ¸í
¹æ»ç¼± µ¿À§¿ø¼Ò ¾×ü ¼¶±¤ °è¼ö±â(Liquid Scintillation Analyzer)
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PerkinElmer
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Tri-carb 2910TR
¼³Ä¡Àå¼Ò
Á¦1½ÇÇ赿 318È£
Àåºñ¸í
X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
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Rigaku
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MiniFlex 600
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Á¦1½ÇÇ赿 318È£
Àåºñ¸í
ÀúÁØÀ§ ¾×ü¼¶±¤ºÐ¼®±â(Low Activity Liquid Scintillation Analyzer)
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PerkinElmer
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Tri-Carb 5110 TR
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Á¦1½ÇÇ赿 318È£
Àåºñ¸í
ºñÁ¢ÃË½Ä 3Â÷¿ø ½ºÄ³³Ê(Structured-light 3D Scanner)
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Breuckmann
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SmartSCAN3D-HE
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Á¦2°øÇаü 206È£
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DPSS ·¹ÀÌÀú(Diode-pumped Solid-state (DPSS) Laser)
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LIGHTHOUSE PHOTONICS
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Sprout-G-12W
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Á¦2°øÇаü 504È£
Àåºñ¸í
°íÈ¿À² À̹Ì¡ ½Ã½ºÅÛ(Electron Multiplying Charge-Coupled Device (EMCCD))
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Andor
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iXon DU-897
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Á¦3°øÇаü 006È£
Àåºñ¸í
°íÁÖÆÄ À¯µµ °¡¿­ ¿ëÇØ·Î(High Frequency Induction Heater)
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EMWise Communications
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-
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Á¦3°øÇаü 105È£
Àåºñ¸í
´Ù¸ñÀû ¹Ú¸· Ç¥¸é±¸Á¶ ºÐ¼® ¿øÀÚ Çö¹Ì°æ Àåºñ(Muti-purpose Atomic Force Microscope (AFM) System)
Á¦ÀÛ»ç
Bruker
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MultiMode 8
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Á¦3°øÇаü 529È£
Àåºñ¸í
32ä³Î ³úÆÄ ÃøÁ¤ ½Ã½ºÅÛ(32-Channel Electroencephalogram (EEG) Measurement System)
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LAXTHA
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LXE3232-RF
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Á¦4°øÇаü 005È£
Àåºñ¸í
¼ºÇü»çÃâ±â(Injection Machine)
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Battenfeld Kunststoffmaschinen
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Microsystem 50
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Á¦5°øÇаü 006È£
Àåºñ¸í
¼ºÇü»çÃâ±â(Injection Machine)
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SUMITOMO HEAVY INDUSTRIES, LTD
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SE50D
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Á¦5°øÇаü 006È£
Àåºñ¸í
¿­Áß·®-½ÃÂ÷Áֻ翭·®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
Á¦ÀÛ»ç
Mettler Toledo
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Mettler Toledo AG
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Á¦5°øÇаü 206È£
Àåºñ¸í
·¹ÀÌÀú À¯µµºØ±« ºÐ±¤±â(Laser-induced Breakdown Spectroscopy (LIBS))
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Applied Spectra
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Aurora LIBS module
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Á¦5°øÇаü 423È£
Àåºñ¸í
»çÁß±ØÀÚ Áú·®ºÐ¼®±â(Quadrupole Mass Spectrometer)
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HIDEN ANALYTICAL
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HPR-20
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Áö°î¿¬±¸µ¿ 226È£
Àåºñ¸í
À̿ ũ·Î¸¶Åä±×·¡ÇÇ ½Ã½ºÅÛ(Ion Chromatography System)
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(ÁÖ)¼¼´ÏÁ¨
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Dionex Aquion IC system
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Áö°î¿¬±¸µ¿ 228È£
Àåºñ¸í
¼±Çü À̿ Ʈ·¦ Áú·®ºÐ¼®±â(Linear Ion Trap Mass Spectrometry)
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Thermo Scientific
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VELOS PRO
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Áö°î¿¬±¸µ¿ 232È£
Àåºñ¸í
´ëÇüÀý´Ü±â(Large Automatic Cut-off Machine)
Á¦ÀÛ»ç
Struers
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Axitom-5
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 146-8È£
Àåºñ¸í
Áý¼Ó À̿ºö(3Â÷¿ø-EBSD)(Focused Ion Beam (FIB; 3D-EBSD))
Á¦ÀÛ»ç
FEI
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Quanta 3D FEG
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 150-2È£
Àåºñ¸í
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
Á¦ÀÛ»ç
Carl Zeiss
¸ðµ¨¸í
Ultra-55
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 154-6È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JSM-7100F
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 154-6È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JEM-2100F
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 161È£
Àåºñ¸í
¸ÖƼ ½ºÄÉÀÏ ¹Ì¼¼±¸Á¶ ºÐ¼® ½Ã½ºÅÛ(Multi-scale Microstructure Analysis System)
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
Neo-ARM
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 161È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JXA-8530F
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 163È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JEM-7900F
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 163È£
Àåºñ¸í
¹ß±¤ºÐ±¤ºÐ¼®±â(Optical Emission Spectrometer)
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OBLF gmbh
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OBLF QSN 750
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ö°­´ëÇпø 171-3È£
Àåºñ¸í
X-¼± Çü±¤ºÐ¼®±â(X-ray Spectrometer)
Á¦ÀÛ»ç
Bruker
¸ðµ¨¸í
S4 Pioneer
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 175-7È£
Àåºñ¸í
X-¼± Çü±¤ºÐ¼®±â(X-ray Spectrometer)
Á¦ÀÛ»ç
Bruker
¸ðµ¨¸í
S8 Tiger
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 175-7È£
Àåºñ¸í
À¯µµ °áÇÕ ÇöóÁ ºÐ±¤ºÐ¼®±â(Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES))
Á¦ÀÛ»ç
Thermo Scientific
¸ðµ¨¸í
iCAP 6500 DUO
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 176È£
Àåºñ¸í
X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
Á¦ÀÛ»ç
Bruker
¸ðµ¨¸í
D8 Advance
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 180-2È£
Àåºñ¸í
X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
Á¦ÀÛ»ç
Bruker
¸ðµ¨¸í
D8 Advance - A25
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 180-2È£
Àåºñ¸í
X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
Á¦ÀÛ»ç
Bruker
¸ðµ¨¸í
D8 Advance
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 180-8È£
Àåºñ¸í
X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
Á¦ÀÛ»ç
Bruker
¸ðµ¨¸í
D8 Discover
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 184-8È£
Àåºñ¸í
ºñƲ¸² ½ÃÇè±â(Tortion Tester)
Á¦ÀÛ»ç
ACE E&C,INC.
¸ðµ¨¸í
TRA-2K
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ö°­´ëÇпø 242-4È£
Àåºñ¸í
Áø°ø-°¡¾Ð ¿ëÇØ ¹× ¿¬¼ÓÁÖÁ¶ÀåÄ¡(Vacuum-over Pressure Continuous Casting Machine)
Á¦ÀÛ»ç
¢ßÄÉÀÌ¿¡ÀÌ¿¥¾ÆÀÌ
¸ðµ¨¸í
VCC 1000 (indutherm)
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 272È£
Àåºñ¸í
TEM¿ë À̿¹иµ½Ã½ºÅÛ(Ion Milling System for Transmission Electron Microscope (TEM))
Á¦ÀÛ»ç
¢ßÁö¿¤ÄÚÆÛ·¹À̼Ç
¸ðµ¨¸í
Gatan model 691
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 284È£
Àåºñ¸í
Àç·á½ÃÇè±â(Advanced Indentation System)
Á¦ÀÛ»ç
(ÁÖ)ÇÁ·Ðƽ½º
¸ðµ¨¸í
AIS2000
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ö°­´ëÇпø 312-4È£
Àåºñ¸í
±Ý¼Ó ÆÇÀç ÀÎÀå¾ÐÃà½ÃÇè±â(Sheet Metal Deformation Simulator)
Á¦ÀÛ»ç
¢ß¾Ë¾Øºñ
¸ðµ¨¸í
RB319
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 312-4È£
Àåºñ¸í
¿­¿ªÇнùķ¹ÀÌÅÍ(Caster&Thermo-mechanical Simulator)
Á¦ÀÛ»ç
Fuji electronic Industrial
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FTX-103HC-01
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 374È£
Àåºñ¸í
±¤ ÀÚ±â Ä¿ Çö¹Ì°æ(Magneto-Optical Kerr-Microscope)
Á¦ÀÛ»ç
Evico magnetics GmbH
¸ðµ¨¸í
Axio Imager D1m
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 374È£
Àåºñ¸í
½ºÆÛÅÍ / Áø°øÁõÂø ÀåÄ¡(Sputtering / Vacuum Deposition System)
Á¦ÀÛ»ç
¾ÆÀ̾¾Æ¼
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 374È£
Àåºñ¸í
X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
Á¦ÀÛ»ç
Rigaku
¸ðµ¨¸í
Miniflex ¥±
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 380È£
Àåºñ¸í
UV-vis/NIR ºÐ±¤±¤µµ°è(UV-vis/NIR Spectrometer)
Á¦ÀÛ»ç
SHIMADZU
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UV-3600
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 472È£
Àåºñ¸í
SOFC ´ÜÀüÁö Àå±â¼º´É Æò°¡ÀåÄ¡(Solid Oxide Fuel Cell (SOFC) Test Station)
Á¦ÀÛ»ç
³ª¶ó¼¿ÅØ(ÁÖ)
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 480È£
Àåºñ¸í
°í¼ÓÁÖÁ¶ ÁÖÆí ³Ã°¢ ¹× ÀÀ°í simulator(Simulator for Solidification and Cooling of a Slab during High Speed Continuous Casting)
Á¦ÀÛ»ç
¢ßÄÉÀÌ¿¡ÀÌ¿¥¾ÆÀÌ
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 480È£
Àåºñ¸í
IET ¸ôµåÇ÷°½º ½Ã·á Á¦Á¶ ÀåÄ¡(High Frequency Induction Furnacer)
Á¦ÀÛ»ç
¿¤ÅØ
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 480È£
Àåºñ¸í
½½·¡±×¿ëÇØ ¹× ³Ã°¢ÀåÄ¡(Slag Dissolution and Cooling System)
Á¦ÀÛ»ç
¸°Å×Å©
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 480È£
Àåºñ¸í
¿­Áß·®ºÐ¼®±â(Thermogravimetric Sorption Analyzer (TGA))
Á¦ÀÛ»ç
RUBOTHERM
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 546È£
Àåºñ¸í
·¹ÀÌÀú ȸÀý ÀÔÀÚ ºÐ¼®±â(Laser Diffraction Particle Size Analyzer)
Á¦ÀÛ»ç
Malvern Instruments
¸ðµ¨¸í
MASTERSIZER 2000
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 546È£
Àåºñ¸í
¿­Áß·®ºÐ¼®±â(Thermogravimetric Sorption Analyzer (TGA))
Á¦ÀÛ»ç
RUBOTHERM
¸ðµ¨¸í
High Pressure TGA
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 546È£
Àåºñ¸í
À̵¿½Ä Áú·® ºÐ¼®±â(Mobile Bench-top Mass Spectrometer)
Á¦ÀÛ»ç
InProcess Instruments GmbH
¸ðµ¨¸í
GAM 400
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 546È£
Àåºñ¸í
¿­Áß·®-½ÃÂ÷Áֻ翭·®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
Á¦ÀÛ»ç
Mettler Toledo
¸ðµ¨¸í
TGA/DSC1
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 546È£
Àåºñ¸í
°íÁÖÆÄ À¯µµ °¡¿­ ¿ëÇØ·Î(High Frequency Induction Heater)
Á¦ÀÛ»ç
¿¤ÅØ
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 580È£
Àåºñ¸í
¿ëÇØ¿ë À¯µµ°¡¿­ ÀåÄ¡(Induction Heating System for Melting)
Á¦ÀÛ»ç
PSTEK
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
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ö°­´ëÇпø 584È£
Àåºñ¸í
¿ø½ÉÁÖÁ¶±â(Sample Preparation Equipment)
Á¦ÀÛ»ç
linn high term gmbh
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Lifumat-M-2000-7.7-VAC
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
°íÁÖÆÄ À¯µµ °¡¿­ ¿ëÇØ·Î(Vacuum Induction Melting and Casting Furnace)
Á¦ÀÛ»ç
ALD Vacuum Technologies
¸ðµ¨¸í
VIM4
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
50Åæ ÇÁ·¹½º(Direct Drive Digital Servo-Press)
Á¦ÀÛ»ç
Hoden seimitsu kako kenkyusho
¸ðµ¨¸í
MPS8300DS
¼³Ä¡Àå¼Ò
ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
½Ç½Ã°£ X-¼± °Ë»ç±â(Realtime X-ray Inspection System)
Á¦ÀÛ»ç
¢ßÀÚºñ½º
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X-Scan 7950
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
¸¶ÂûƯ¼º Æò°¡ÀåÄ¡(Friction Tester)
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(À¯)Á¾·Î°úÇлó»ç
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CR-FR-CH1
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
¿­°£¾Ð¿¬±â(Pilot 4Hi-Hot Rolling Mill)
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PTW sreel solution
¸ðµ¨¸í
Ư¼öÁ¦ÀÛ
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
¿­ Áß·® ºÐ¼®±â+½ÃÂ÷ ÁÖ»ç ¿­·®°è-Áú·® ºÐ¼®±â(TGA-DSC-MS SDT(Simultaneous DSC/TGA)-MS)
Á¦ÀÛ»ç
TA Instruments Korea
¸ðµ¨¸í
Discovery SDT 650 – Simultaneous DSC-TGA, Pfeiffer ThermoStar Quadrupole Mass Spectrometer
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ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
Àåºñ¸í
RIE ½Ã½ºÅÛ(Reactive Ion Etching (RIE) System)
Á¦ÀÛ»ç
(ÁÖ)¿ïÅØ
¸ðµ¨¸í
URS-100
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CellScale
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Thermo Fisher Scientific
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QuantStudio5
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Æ÷Ç×½ÃÁö½Ä»ê¾÷¼¾ÅÍ wet-lab
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3D ¹ÙÀÌ¿ÀÇÁ¸°ÅÍ(Extrusion-based 3D Bioprinter)
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CELLINK
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BIO X
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Æ÷Ç×½ÃÁö½Ä»ê¾÷¼¾ÅÍ wet-lab
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X-ray ÃøÁ¤½Ã½ºÅÛ(X-ray Measurement System)
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Varian A272
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BRUKER
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Autoflex Speed LRF
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°í¼º´É ¾×üũ·Î¸¶Åä±×·¡ÇÇ ¼±Çü À̿ Ʈ·¦ Áú·® ºÐ¼®±â(HPLC dual-cell linear ion trap mass spectrometer (HPLC-ESI-MS))
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Thermo Scientific
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LTQ Velos Pro
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GC/MSD ½Ã½ºÅÛ(Gas Chromatography/Mass Selective Detector (GC/MSD) System)
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Agilent Technologies
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-/5975C
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´ÙÁß°ËÃâ À¯µµ°áÇÕÇöóÁ Áú·®ºÐ¼®±â(Multi-Collector Inductively Coupled Plasma Mass Spectrometer (MC-ICP-MS))
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Nu Instruments Ltd
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Plasma 3
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Áú·®ºÐ¼®±â(Mass Spectrometer)
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JEOL
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JMS-800D
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À¯µµ °áÇÕ ÇöóÁ ºÐ±¤ºÐ¼®±â(Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES))
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Thermo Scientific
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iCAP 7400
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X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
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PANalytical B.V.
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X¢¥Pert PRO MPO
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È­ÇÐÈíÂø·®ºÐ¼®±â(Chemisorption Analyzer)
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micromeritics
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Autochem II 2920 chemisorption analyzer
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Setaram
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PCT Pro
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¿°±â¼­¿­ºÐ¼®±â(Ion Personal Genome Machine)
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Thermo Scientific
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Ion Personal Genome Machine (PGM) System
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Isoprime
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IsoPrime 100
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GC/MSD ½Ã½ºÅÛ(Gas Chromatography/Mass Selective Detector (GC/MSD) System)
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Agilent Technologies
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7890B/-
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À̿ ũ·Î¸¶Åä±×·¡ÇÇ ½Ã½ºÅÛ(Ion Chromatography System)
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Metrohm
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790 Personal IC
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À̿ ũ·Î¸¶Åä±×·¡ÇÇ ½Ã½ºÅÛ(Ion Chromatography System)
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Dionex
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ICS-2100
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NEWPORT
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Newport 74125
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Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer)
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Thermo Scientific
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Nicolet iS50
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Bruker
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Autoflex Max LRF
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TA Instruments
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SDT Q600
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Hidex Oy
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Hidex Sense
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TFF ½Ã½ºÅÛ(Tangential Flow Filtration (TFF) System)
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MERCK
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Cogent M1 TFF System
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Thermo Scientific
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Dionex ICS-5000
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À¯Ã¼È帧Á¤Áö ºÐ±¤±¤µµ°è(Stopped-flow Spectrometer)
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AppliedPhotophysics
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SX20
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Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer)
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PerkinElmer
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Spectrum Two
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±â°øµµ ºÐ¼®±â(Brunauer-Emmett-Teller (BET) & Pore Analyzer)
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micromeritics
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ASAP 2020
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È­ÇÐÈíÂøºÐ¼®±â(Temperature Programed Reduction/Desorption (TPR/TPD) Chemisorption Analyzer)
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micromeritics
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AutoChem II
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GC/MSD ½Ã½ºÅÛ(Gas Chromatography/Mass Selective Detector (GC/MSD) System)
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Agilent Techonologies
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7890B/5977B
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ÇÙ»ê ÃßÃâ±â(Auto Nucleic Acid Preparation System)
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Precision System Science
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Magtration System 12GC
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Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer)
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Thermo Scientific
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Nicolet 6700
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À̿ ũ·Î¸¶Åä±×·¡ÇÇ ½Ã½ºÅÛ(Ion Chromatography System)
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Dionex
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ICS-1100
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X-¼± ȸÀýºÐ¼®±â(X-ray Diffractometer)
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Rigaku
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Ultima IV
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»çÁß±ØÀÚ Áú·®ºÐ¼®±â(Quadrupole Mass Spectrometer)
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HIDEN ANALYTICAL
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HPR-20
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È­ÇÐÈíÂø·®ºÐ¼®±â(Chemisorption Analyzer)
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MicrotracBEL Corp.
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BELCAT ¥±
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Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer)
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Thermo Scientific
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Nicolet iS50
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ȯ°æ°øÇе¿ 431È£
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Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer)
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Thermo Scientific
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Nicolet iS20
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