±âº»Á¤º¸ |
¼³ºñ¹øÈ£ |
10200181 |
Àåºñ¸í(ÇѱÛ) |
ÅõÆ÷Åæ Çö¹Ì°æ(3D Ȧ·Î±×·¡ÇÈ ´Ù±¤ÀÚ Çö¹Ì°æ)
|
Àåºñ¸í(¿µ¹®) |
Ultima 2-Photon Microscope |
Á¦ÀÛ»ç |
bruker |
¸ðµ¨¸í |
Ultims 2P plus |
»ó¼¼Á¤º¸ |
Àåºñ»ç¾ç |
¡ÛÀ̹Ì¡ ½Ã½ºÅÛ Resonant Scanner ±â¹Ý °í¼Ó ·¹ÀÌÀú ½ºÄ³´× ÃÖ´ë 8 kHz °øÁø ½ºÄ³´× ÃÖ´ë 30 fps ½Ç½Ã°£ °í¼Ó À̹Ì¡ ÃÖ´ë 2600 ¡¿ 2600 pixel ÇØ»óµµ ÃÖ´ë 8ä³Î µ¿½Ã ȹµæ
¡Û½Ã¾ß(Field of View) Ç¥ÁØ ½Ã¾ß: FN 22.7 mm ¿À¹ö½ºÄµ ½Ã¾ß: FN 28 mm Nikon 16X/0.8 NA ´ë¹°·»Áî »ç¿ë ½Ã Ç¥ÁØ: 1.11 ¡¿ 1.11 mm ¿À¹ö½ºÄµ: 1.4 ¡¿ 1.4 mm
¡Û3D ±¤ÀÚ±Ø ½Ã½ºÅÛ NeuraLight 3D Ultra SLM Module 3Â÷¿ø ´ÙÁß ´º·± µ¿½Ã ±¤ÀÚ±Ø °¡´É ÃÖ´ë 600 Hz À§»ó Àüȯ ¼Óµµ 15.4 ¡¿ 15.4 mm ½Ã¾ß°¢
¡ÛZ-Ãà Æ÷Ä¿½Ì ETL Remote Focusing ´ë¹°·»Áî À̵¿ ¾øÀÌ Àü±âÀû Ãʰí¼Ó Æ÷Ä¿½Ì ÃÖ´ë 450 ¥ìm Z-range
¡Û°ËÃ⠽ýºÅÛ Hamamatsu GaAsP PMT 2ä³Î High-Speed Shutter Àû¿ë
¡Û±¤¿ø À̹Ì¡¿ë ·¹ÀÌÀú Coherent Axon Laser (920 nm) ±¤ÀÚ±Ø¿ë ·¹ÀÌÀú Coherent Laser (1064 nm) µ¶¸³ ÀÌÁß ±¤ÇÐ °æ·Î ±¸¼º
¡Û´ë¹°·»Áî Nikon CFI75 16X/0.80 Water Objective Working Distance: 3.0 mm
¡Û¼ÒÇÁÆ®¿þ¾î 4D(X,Y,Z,T) À̹Ì¡ ROI ¹× ÀÚÀ¯°î¼± ½ºÄ³´× Functional Mapping ½Ç½Ã°£ ±¤ÀÚ±Ø ÆÐÅÏ ¼³°è Àü±â»ý¸®ÇÐ(Electrophysiology) ¿¬µ¿
¡Û¼³Ä¡ ȯ°æ ¹æÁø ±¤ÇÐ Å×ÀÌºí ±â¹Ý °íÁ¤Çü Ç÷§Æû Motorized X-Y Stage Motorized Z-axis (ÃÖ¼Ò ºÐÇØ´É 100 nm) |
Ȱ¿ëºÐ¾ß |
½Å°æ°úÇÐ ¹× ¹ÙÀÌ¿À¸ÞµðÄà ¿¬±¸¸¦ À§ÇÑ Ã·´Ü ´Ù±¤ÀÚ À̹Ì¡ Ç÷§ÆûÀ¸·Î, »ýüÁ¶Á÷ÀÇ °íÇØ»óµµ 3Â÷¿ø À̹Ì¡, Ä®½· À̹Ì¡ ±â¹Ý ½Å°æÈ°µ¿ ºÐ¼®, ±¤À¯ÀüÇÐ(Optogenetics), ´ÙÁß ´º·± ±¤ÀÚ±Ø(All-Optical Interrogation), ½Å°æÈ¸·Î ºÐ¼®, ³úÁúȯ ¿¬±¸, Àü±â»ý¸®ÇÐ ¿¬°è ¿¬±¸ µî¿¡ Ȱ¿ë °¡´ÉÇÔ |
Àåºñ¿î¿µÀη |
¼³Ä¡Àå¼Ò |
C5
|
¼Ò¼Ó |
À¶ÇÕ´ëÇпø |
¼º¸í |
±è¼±Èñ |
ÀüÈ |
054-279-8418 |
À̸ÞÀÏ |
sunnykim@postech.ac.kr |
µ¿ÀÏ/À¯»çÀåºñÁ¤º¸ |
Àåºñ¸í |
¿¬±¸¿ë »ï¾È Çö¹Ì°æ(Reseach Trinocular Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
BX43 |
¼³Ä¡Àå¼Ò |
383È£
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Park Systems |
¸ðµ¨¸í |
XE7 |
¼³Ä¡Àå¼Ò |
C5 228È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
MCL |
¸ðµ¨¸í |
MCL-NSOM |
¼³Ä¡Àå¼Ò |
C5 228È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ (Confocal Laser Scanning Microscope ) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
LSM 900 with Airyscan 2 |
¼³Ä¡Àå¼Ò |
C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Park Systems |
¸ðµ¨¸í |
XE7 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1139È£
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
Dimension Icon with ScanAsyst |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1152È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
GeminiSEM 500 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1153È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
AURIGA |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1163È£
|
|
Àåºñ¸í |
¼öÂ÷º¸Á¤ ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs-Corrected Scanning Transmission Electron Microscope (Cs-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-ARM200F |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1176È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6480LV |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1187È£
|
|
Àåºñ¸í |
Àü°è¹æÃâ Çö¹Ì°æ(Field Emission Electron Microscope) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2100F |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1188È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-3400N |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1190È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-7600F |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1192È£
|
|
Àåºñ¸í |
Àüµ¿ µðÁöÅÐ Çö¹Ì°æ(Opto-digital Motorizing Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
DSX100 |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2179È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
OLS3000 |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2179È£
|
|
Àåºñ¸í |
ÁÖ»ç Åõ°ú ÀüÀÚÇö¹Ì°æ(Scanning Transmission Electron Microscope (STEM)) |
Á¦ÀÛ»ç |
COXEM |
¸ðµ¨¸í |
CX-200 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3188È£
|
|
Àåºñ¸í |
Æí±¤ Çö¹Ì°æ(Polarized Stereo Microscope) |
Á¦ÀÛ»ç |
Leica Microsystems |
¸ðµ¨¸í |
Z16 APO |
¼³Ä¡Àå¼Ò |
°¡¼Ó±â ÀúÀ帵µ¿ 106È£
|
|
Àåºñ¸í |
µµ¸³ Çü±¤ Çö¹Ì°æ(Fluorescence Inverted Microscope) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
Axio Observer A1 |
¼³Ä¡Àå¼Ò |
°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
|
|
Àåºñ¸í |
Çü±¤ Çö¹Ì°æ(Fluorescence Microscope) |
Á¦ÀÛ»ç |
Á¦ÀÌ¿ø |
¸ðµ¨¸í |
Axio Zoom.V16 |
¼³Ä¡Àå¼Ò |
°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(S.E.M(SCANNING ELECTRON MICROSCOPE)) |
Á¦ÀÛ»ç |
JEOL LTD |
¸ðµ¨¸í |
JSM-6390LV |
¼³Ä¡Àå¼Ò |
±â°è½ÇÇ赿 106È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-7401F |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 103È£
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Veeco |
¸ðµ¨¸í |
Dimension 3100 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 101È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2100F(with STEM Cs corrector) |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM ½Ç
|
|
Àåºñ¸í |
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope
(Cs-corrected HR-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2200FS |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM-2200FS½Ç
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
LEO Elektronrnmikroskopie GmbH |
¸ðµ¨¸í |
FE-SEM |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
ÀÓ°èÄ¡¼ö ÃøÁ¤ ÁÖ»çÀüÀÚÇö¹Ì°æ(Critical Dimension Scanning Electron Microscope (CD-SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-9380 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-1011 |
¼³Ä¡Àå¼Ò |
»ý¸í°øÇבּ¸¼¾ÅÍ 156È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
IX81 |
¼³Ä¡Àå¼Ò |
»ý¸í°øÇבּ¸¼¾ÅÍ 328È£
|
|
Àåºñ¸í |
·¹ÀÌÀú ¹Ì¼¼ ÇØºÎ ½Ã½ºÅÛ(Laser Microdissection Microscope System) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
PALM MicroBeam |
¼³Ä¡Àå¼Ò |
»ý¸í°øÇבּ¸¼¾ÅÍ 341È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2100 (HR) |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 105È£
|
|
Àåºñ¸í |
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope(Cs-corrected HR-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2200FS (UHR) |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 109È£
|
|
Àåºñ¸í |
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
7600H |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 111È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-3400N |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 111È£
|
|
Àåºñ¸í |
ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM)) |
Á¦ÀÛ»ç |
Veeco |
¸ðµ¨¸í |
Dimension 3100 |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 208È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚ Çö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
PHILIPS ELECTRON OPTICS B.V. |
¸ðµ¨¸í |
XL30S FEG |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 306-1È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
IX71 |
¼³Ä¡Àå¼Ò |
Á¦2°øÇаü 033È£
|
|
Àåºñ¸í |
Çö¹Ì°æ Stage ¹× Á¶Àý ½Ã½ºÅÛ(Microscope Stage and Controller System) |
Á¦ÀÛ»ç |
Applied Scientific Instrumentation (ASI) |
¸ðµ¨¸í |
MS-2000 |
¼³Ä¡Àå¼Ò |
Á¦3°øÇаü 006È£
|
|
Àåºñ¸í |
´Ù¸ñÀû ¹Ú¸· Ç¥¸é±¸Á¶ ºÐ¼® ¿øÀÚ Çö¹Ì°æ Àåºñ(Muti-purpose Atomic Force Microscope (AFM) System) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
MultiMode 8 |
¼³Ä¡Àå¼Ò |
Á¦3°øÇаü 529È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
CKX41 |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 204È£
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
SEIKO INSTRUMENTS INC. |
¸ðµ¨¸í |
SPI3800N Pro |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 206-1È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
Bio-logic SAS |
¸ðµ¨¸í |
M470 |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 228È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6010LV |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 232È£
|
|
Àåºñ¸í |
Á¤¸³Çö¹Ì°æ(Upright Microscope) |
Á¦ÀÛ»ç |
Leica Microsystems |
¸ðµ¨¸í |
DM4000 M |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 144-5È£
|
|
Àåºñ¸í |
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM)) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
Ultra-55 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 154-6È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-7100F |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 154-6È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2100F |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 161È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JXA-8530F |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 163È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-7900F |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 163È£
|
|
Àåºñ¸í |
TEM¿ë À̿¹иµ½Ã½ºÅÛ(Ion Milling System for Transmission Electron Microscope (TEM)) |
Á¦ÀÛ»ç |
¢ßÁö¿¤ÄÚÆÛ·¹ÀÌ¼Ç |
¸ðµ¨¸í |
Gatan model 691 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 284È£
|
|
Àåºñ¸í |
±¤ ÀÚ±â Ä¿ Çö¹Ì°æ(Magneto-Optical Kerr-Microscope) |
Á¦ÀÛ»ç |
Evico magnetics GmbH |
¸ðµ¨¸í |
Axio Imager D1m |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 374È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
Lasertec Corporation |
¸ðµ¨¸í |
VL2000DX |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
¿ëÀ¶Á¡/Á¢Ã˰¢ ½Ã½ºÅÛ(Heating Microscope) |
Á¦ÀÛ»ç |
export system solutions s.r.i |
¸ðµ¨¸í |
misura hsm |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 572È£
|
|
Àåºñ¸í |
ÀúÀü¾Ð °íºÐÇØ´É Àü°è¹æÃâÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope) |
Á¦ÀÛ»ç |
CARL ZEISS MICROSCOP |
¸ðµ¨¸í |
Gemini 360 |
¼³Ä¡Àå¼Ò |
ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
IX73 |
¼³Ä¡Àå¼Ò |
Çѱ¹·Îº¿À¶ÇÕ¿¬±¸¿ø 411È£
|
|
Àåºñ¸í |
Çü±¤ Çö¹Ì°æ(Fluorescence Microscope) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
Axiolab |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 206-1È£
|
|
Àåºñ¸í |
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
SEC |
¸ðµ¨¸í |
SNE4500M |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 322È£
|
|
Àåºñ¸í |
Çü±¤ ±Ý¼Ó Çö¹Ì°æ(Fluorescence Metallurgical Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
BX60 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 333È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
FV3000 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 333È£
|
|
Àåºñ¸í |
µµ¸³ Çü±¤ Çö¹Ì°æ(Inverted Fluorescence Microscope) |
Á¦ÀÛ»ç |
NIKON |
¸ðµ¨¸í |
Eclipse Ti2 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 403È£
|
|
Àåºñ¸í |
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
SEC |
¸ðµ¨¸í |
SNE4000M |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 410È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
LSM 5 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 414È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6510 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 414È£
|