±âº»Á¤º¸ |
¼³ºñ¹øÈ£ |
10190972 |
Àåºñ¸í(ÇѱÛ) |
(GLOCAL)°ø°£ Àü»çü Žħ À̵¿ ÀåÄ¡
|
Àåºñ¸í(¿µ¹®) |
in situ probe transfer for Spantial transcriptome analysis |
Á¦ÀÛ»ç |
10xGENOMICS |
¸ðµ¨¸í |
Visium CytAssist |
»ó¼¼Á¤º¸ |
Àåºñ»ç¾ç |
*ȣȯ »ùÇÃ: FFPE (Formalin-Fixed Paraffin-Embedded) Á¶Á÷, Fresh Frozen (FF) Á¶Á÷ *ó¸® »ùÇà ¼ö: 1ȸ ±¸µ¿´ç ÃÖ´ë 2°³ÀÇ Á¶Á÷ ½½¶óÀ̵å ó¸® *ó¸® ½Ã°£: 1½Ã°£ À̳» *ĸó ¿µ¿ª: 6.5 mm x 6.5 mm ¶Ç´Â 11 mm x 11 mm Visium Capture Area ½½¶óÀ̵å¿Í ȣȯ *Á¶Á÷ ½½¶óÀÌµå ¿ä±¸»çÇ×: 25mm x 75mm Ç¥ÁØ À¯¸® ½½¶óÀ̵å |
Ȱ¿ëºÐ¾ß |
Visium CytAssist´Â °ø°£ Àü»çü(Spatial Transcriptomics) ºÐ¼® µµ±¸·Î, FFPE(ÆÄ¶óÇÉ °íÁ¤) ¹× °íÁ¤µÈ Á¶Á÷¿¡¼ À¯ÀüÀÚ/´Ü¹éÁú ¹ßÇö µ¥ÀÌÅ͸¦ Á¤È®ÇÑ À§Ä¡ Á¤º¸¿Í ÇÔ²² ¾ò´Â µ¥ Ȱ¿ëµÊ |
Àåºñ¿î¿µÀη |
¼³Ä¡Àå¼Ò |
BOIC [3311È£]
|
¼Ò¼Ó |
±Û·ÎÄà ºÐÀÚÀǰúÇÐ ¼¾ÅÍ |
¼º¸í |
Ȳ°æÈñ |
ÀüÈ |
054-279-0693 |
À̸ÞÀÏ |
edit1010@postech.ac.kr |
µ¿ÀÏ/À¯»çÀåºñÁ¤º¸ |
Àåºñ¸í |
À¯¼¼Æ÷ ºÐ¼®±â(High-end performance Flow Cytometer) |
Á¦ÀÛ»ç |
BD Biosciences |
¸ðµ¨¸í |
LSR Foretessa 4Laser |
¼³Ä¡Àå¼Ò |
202-1È£
|
|
Àåºñ¸í |
ÁøÅÁ ¹è¾ç±â (SHAKING INCUBATOR) |
Á¦ÀÛ»ç |
ºñÀü°úÇÐ |
¸ðµ¨¸í |
VS-8480SR |
¼³Ä¡Àå¼Ò |
239È£
|
|
Àåºñ¸í |
¸¶ÀÌÅ©·ÎÇ÷¹ÀÌÆ® ¸®´õ(Microplate Reader Infinite M200 NanoQuan) |
Á¦ÀÛ»ç |
Tecan |
¸ðµ¨¸í |
NanoQuant infinite M200 Pro |
¼³Ä¡Àå¼Ò |
281È£
|
|
Àåºñ¸í |
ÀüÀÚ½ºÇɰø¸í ºÐ±¤±¤µµ°è(Electron Spin Resonance Spectrometer (ESR)) |
Á¦ÀÛ»ç |
Bruker Biospin GmbH |
¸ðµ¨¸í |
A200 |
¼³Ä¡Àå¼Ò |
3352/3354È£
|
|
Àåºñ¸í |
¿¬±¸¿ë »ï¾È Çö¹Ì°æ(Reseach Trinocular Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
BX43 |
¼³Ä¡Àå¼Ò |
383È£
|
|
Àåºñ¸í |
ÃÊ°í¼º´É ÀÚµ¿ ¼¼Æ÷ºÐ¼®±â(Ultra High-End Performance Flow Cytometry System) |
Á¦ÀÛ»ç |
Beckman Coulter |
¸ðµ¨¸í |
cyotoFLEX LX |
¼³Ä¡Àå¼Ò |
729È£
|
|
Àåºñ¸í |
Á¶Á÷Åõ¸íȽýºÅÛ(CLARITY-Tissue Clearing system) |
Á¦ÀÛ»ç |
·Î°í¹ÙÀÌ¿À½Ã½ºÅÛ |
¸ðµ¨¸í |
X-clarity |
¼³Ä¡Àå¼Ò |
BOIC 4210È£
|
|
Àåºñ¸í |
Áú·®ºÐ¼®±â°í¼º´É ¾×üũ·Î¸¶Åä±×·¡ÇÇ ¿ÀºñÆ®·¦Áú·®ºÐ¼®±â(High-performance Liquid Chromatography – Mass) |
Á¦ÀÛ»ç |
Perkin Elmer |
¸ðµ¨¸í |
Qsight220 |
¼³Ä¡Àå¼Ò |
BOIC 4307È£
|
|
Àåºñ¸í |
(GLOCAL)´ÜÀϼ¼Æ÷ °ø°£À¯Àüü ºÐ¼®ÀåÄ¡(Single-cell spatial genomics analyzer) |
Á¦ÀÛ»ç |
10xGENOMICS |
¸ðµ¨¸í |
Xenium analyzer |
¼³Ä¡Àå¼Ò |
BOIC [3311È£]
|
|
Àåºñ¸í |
´ë·® À¯¾× ±â¹Ý ´ÜÀϼ¼Æ÷ ÀÚµ¿ºÐ¼®±â(Chromium Single Cell) |
Á¦ÀÛ»ç |
10x Genomics |
¸ðµ¨¸í |
Chromium X |
¼³Ä¡Àå¼Ò |
BOIC [3411È£]
|
|
Àåºñ¸í |
ÀüÀÚµ¿ ´ë·® À¯¾× ±â¹Ý ºÐȹ ¹× ¶óº§¸µ ÀåÄ¡(ChChromium iX romium Single Cell) |
Á¦ÀÛ»ç |
10x Genomics |
¸ðµ¨¸í |
Chromium iX |
¼³Ä¡Àå¼Ò |
BOIC [3411È£]
|
|
Àåºñ¸í |
¹ÙÀÌ¿ÀºÐÀÚ À̹Ì¡ ½Ã½ºÅÛ(Biomolecular Imaging System) |
Á¦ÀÛ»ç |
GE Healthcare(Çö Cytiva) |
¸ðµ¨¸í |
Amersham Imager 600 |
¼³Ä¡Àå¼Ò |
BOIC [4307È£]
|
|
Àåºñ¸í |
(GLOCAL)´ÜÀϼ¼Æ÷ À̹Ì¡ °ø°£ ºÐ¼® ½Ã½ºÅÛ(Ultra high-multiplexed single cell spatial analysis system) |
Á¦ÀÛ»ç |
Akoya Biosciences |
¸ðµ¨¸í |
Phenocycler-Fusion 2.0 |
¼³Ä¡Àå¼Ò |
BOIC [4308È£]
|
|
Àåºñ¸í |
ÁøÅÁ ¹è¾ç±â(Shaking Incubator) |
Á¦ÀÛ»ç |
ºñÀü°úÇÐ |
¸ðµ¨¸í |
VS-8480SR |
¼³Ä¡Àå¼Ò |
BOIC [4314È£]
|
|
Àåºñ¸í |
°í¼Ó ó¸®Çü±¤ ³ª³ëÀε§Å×ÀÌ¼Ç (Nanoindentation ) |
Á¦ÀÛ»ç |
OPTIC11 LIFE |
¸ðµ¨¸í |
Pavone |
¼³Ä¡Àå¼Ò |
C5
|
|
Àåºñ¸í |
Áøµ¿ÀýÆí±â(Vibrating blade microtome) |
Á¦ÀÛ»ç |
Leica |
¸ðµ¨¸í |
VT1200S |
¼³Ä¡Àå¼Ò |
C5
|
|
Àåºñ¸í |
ÈÇй߱¤ À̹ÌÁö ÃøÁ¤ÀåÄ¡(Western Blot Imaging System) |
Á¦ÀÛ»ç |
Cytiva |
¸ðµ¨¸í |
Amersham Image Quant IQ800 |
¼³Ä¡Àå¼Ò |
C5
|
|
Àåºñ¸í |
°íÈ¿À² ½Ã·á°Ë»ö ½Ã½ºÅÛ(High throughput screening system) |
Á¦ÀÛ»ç |
Revvity |
¸ðµ¨¸í |
Fontus NGS |
¼³Ä¡Àå¼Ò |
C5
|
|
Àåºñ¸í |
´ë¿ë·® Â÷¼¼´ë¿°±â¼¿ºÐ¼® ½Ã½ºÅÛ(Next-Generation Sequencing system) |
Á¦ÀÛ»ç |
Illumina |
¸ðµ¨¸í |
NextSeq1000 |
¼³Ä¡Àå¼Ò |
C5
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Park Systems |
¸ðµ¨¸í |
XE7 |
¼³Ä¡Àå¼Ò |
C5 228È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
MCL |
¸ðµ¨¸í |
MCL-NSOM |
¼³Ä¡Àå¼Ò |
C5 228È£
|
|
Àåºñ¸í |
·¡ÇÎ&Æú¸®½Ì ½Ã½ºÅÛ(Lapping & Polishing System) |
Á¦ÀÛ»ç |
LOGITECH |
¸ðµ¨¸í |
PM6 |
¼³Ä¡Àå¼Ò |
C5 228È£
|
|
Àåºñ¸í |
MJP ¹æ½Ä 3D ÇÁ¸°ÅÍ(3D Printer with Multi Jetting Printing (MJP) Technology) |
Á¦ÀÛ»ç |
3D SYSTEMS |
¸ðµ¨¸í |
ProJet MJP 2500 |
¼³Ä¡Àå¼Ò |
C5 232È£
|
|
Àåºñ¸í |
Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Thermal Evaporating System) |
Á¦ÀÛ»ç |
´ëµ¿ÇÏÀÌÅØ |
¸ðµ¨¸í |
DD-GT103R |
¼³Ä¡Àå¼Ò |
C5 329È£
|
|
Àåºñ¸í |
PC Á¦¾î À̹ÌÁö ÀÎ½Ä µµÆ÷ ½Ã½ºÅÛ(PC Control Image Recognition Dispensing System) |
Á¦ÀÛ»ç |
MUSASHI ENGINEERING, INC. |
¸ðµ¨¸í |
IMAGE MASTER 350PC SMART/SHOTMASTER 300QX |
¼³Ä¡Àå¼Ò |
C5 329È£
|
|
Àåºñ¸í |
¿ø·á ÁõÂø ½Ã½ºÅÛ(Materials Deposition System with Piezoelectric Inkjet Catridge) |
Á¦ÀÛ»ç |
FUJIFILM |
¸ðµ¨¸í |
Dimatix DMP-2850 |
¼³Ä¡Àå¼Ò |
C5 329È£
|
|
Àåºñ¸í |
Áø°øÇÁ·Îºê½ºÅ×À̼Ç(Vacuum Chamber Probe Station) |
Á¦ÀÛ»ç |
MS TECH |
¸ðµ¨¸í |
M6VC |
¼³Ä¡Àå¼Ò |
C5 330È£
|
|
Àåºñ¸í |
¹ÝµµÃ¼ ½ºÀ§Äª ½Ã½ºÅÛ(Semiconductor Switching System) |
Á¦ÀÛ»ç |
KEITHLEY Instruments |
¸ðµ¨¸í |
707B |
¼³Ä¡Àå¼Ò |
C5 330È£
|
|
Àåºñ¸í |
¿þÀÌÆÛºÐ¼® ÇÁ·Îºê ½ºÅ×À̼Ç(Wafer Prober) |
Á¦ÀÛ»ç |
Cascade Microtech |
¸ðµ¨¸í |
Summit 11000 |
¼³Ä¡Àå¼Ò |
C5 330È£
|
|
Àåºñ¸í |
ÇÁ·Îºê ½ºÅ×À̼Ç(Probe Station) |
Á¦ÀÛ»ç |
MS TECH |
¸ðµ¨¸í |
MST8000 |
¼³Ä¡Àå¼Ò |
C5 332È£
|
|
Àåºñ¸í |
ÇöóÁ ó¸® ½Ã½ºÅÛ(Plasma Treatment Machine) |
Á¦ÀÛ»ç |
Nordson |
¸ðµ¨¸í |
AP-300 Plasma System |
¼³Ä¡Àå¼Ò |
C5 720-1È£
|
|
Àåºñ¸í |
3D ¹ÙÀÌ¿À ÇÁ¸°ÅÍ(3D Bioprinter) |
Á¦ÀÛ»ç |
T&R Biofab |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
C5 720-1È£
|
|
Àåºñ¸í |
´ÙÀÌ½Ì Àý»è±â(Automatic Dicing Saw) |
Á¦ÀÛ»ç |
DISCO |
¸ðµ¨¸í |
DAD3240 |
¼³Ä¡Àå¼Ò |
C5 720-1È£
|
|
Àåºñ¸í |
½ºÆÛÅ͸µ ½Ã½ºÅÛ(Sputtering System) |
Á¦ÀÛ»ç |
JUWON TECH |
¸ðµ¨¸í |
JWMSS-200XL |
¼³Ä¡Àå¼Ò |
C5 721È£
|
|
Àåºñ¸í |
¿öÅÍÁ¬ Àý»è±â(Abrasive Water Jet Cutter Machine) |
Á¦ÀÛ»ç |
OMAX |
¸ðµ¨¸í |
MAXIEM 1530 |
¼³Ä¡Àå¼Ò |
C5 MAKER SPACE 3(ÁöÇÏ)
|
|
Àåºñ¸í |
Áß Àû¿Ü¼± ·¹ÀÌÀú(Mid-infrared laser) |
Á¦ÀÛ»ç |
Daylight Solutions |
¸ðµ¨¸í |
MIRCcat-QT-2100 |
¼³Ä¡Àå¼Ò |
C5 [232È£]½ÇÇè½Ç
|
|
Àåºñ¸í |
3D ÇÁ¸°ÅÍ(Standalone 3D printer system) |
Á¦ÀÛ»ç |
3D Systems |
¸ðµ¨¸í |
Figure 4 Standalone 3D Printer |
¼³Ä¡Àå¼Ò |
C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ (Confocal Laser Scanning Microscope ) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
LSM 900 with Airyscan 2 |
¼³Ä¡Àå¼Ò |
C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
|
|
Àåºñ¸í |
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System) |
Á¦ÀÛ»ç |
TEMESCAL/BOC COATING TECH |
¸ðµ¨¸í |
BDJ 1800 |
¼³Ä¡Àå¼Ò |
LG¿¬±¸µ¿ 110È£
|
|
Àåºñ¸í |
ºÐ¼®¿ë ÇÁ·Îºù ½ºÅ×À̼Ç(Analytical Probing Station) |
Á¦ÀÛ»ç |
The Micromanipulator Company |
¸ðµ¨¸í |
No. 6000 |
¼³Ä¡Àå¼Ò |
LG¿¬±¸µ¿ 110È£
|
|
Àåºñ¸í |
¸¶±×³×Æ®·Ð ½ºÆÛÅ͸µ Àåºñ(Magnetron Sputtering System) |
Á¦ÀÛ»ç |
SNTEK |
¸ðµ¨¸í |
SPR-5006 |
¼³Ä¡Àå¼Ò |
LG¿¬±¸µ¿ 110È£
|
|
Àåºñ¸í |
ºÐ¼®¿ë ÇÁ·Îºù ½ºÅ×À̼Ç(Analytical Probing Station) |
Á¦ÀÛ»ç |
The Micromanipulator Company |
¸ðµ¨¸í |
No. 7100 |
¼³Ä¡Àå¼Ò |
LG¿¬±¸µ¿ 202È£
|
|
Àåºñ¸í |
ÇÁ·Îºê ½ºÅ×À̼Ç(Probe Station) |
Á¦ÀÛ»ç |
UNITEK CORPORATION |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
LG¿¬±¸µ¿ 212È£
|
|
Àåºñ¸í |
µ¿Àû±¤»ê¶õºÐ±¤±â(Dynamic Light Scattering Spectroscopy) |
Á¦ÀÛ»ç |
Á¦À̺ñ»çÀ̾ðƼÇÈ |
¸ðµ¨¸í |
Zetasizer Pro |
¼³Ä¡Àå¼Ò |
RIST 3161È£
|
|
Àåºñ¸í |
°í°¨µµ PDL Ȧ ÃøÁ¤ ½Ã½ºÅÛ (High Sensitivity Parallel Dipole Line Hall System ) |
Á¦ÀÛ»ç |
Semilab |
¸ðµ¨¸í |
PDL 1000 |
¼³Ä¡Àå¼Ò |
RIST 3µ¿ 3116/3118È£
|
|
Àåºñ¸í |
¹Ð¸µ ½Ã½ºÅÛ(Milling Machine) |
Á¦ÀÛ»ç |
HWACHEON |
¸ðµ¨¸í |
KANDAN-2 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1009È£
|
|
Àåºñ¸í |
Çï·ý °¡½º ȸ¼ö¿ë ÄÄÇÁ·¹¼(Helium Compressor and Filtering System) |
Á¦ÀÛ»ç |
Bumhan |
¸ðµ¨¸í |
BH-AL7B |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1018È£
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Park Systems |
¸ðµ¨¸í |
XE7 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1139È£
|
|
Àåºñ¸í |
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System) |
Á¦ÀÛ»ç |
Telemark |
¸ðµ¨¸í |
246-28 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1145È£
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
Dimension Icon with ScanAsyst |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1152È£
|
|
Àåºñ¸í |
X-¼± ±¤ÀüÀÚ ºÐ±¤±â(X-ray Photoelectron Spectrometer (XPS) Microprobe) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
ESCALAB 250 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1153È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
GeminiSEM 500 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1153È£
|
|
Àåºñ¸í |
À̿ ¹Ð¸µ ½Ã½ºÅÛ(Cross Section Planar Ion Milling System) |
Á¦ÀÛ»ç |
GATAN |
¸ðµ¨¸í |
Ilion+II Model 697 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1162È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
AURIGA |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1163È£
|
|
Àåºñ¸í |
ÁÖ»çÇü ¿ÀÁ¦ ÀüÀÚÇö¹Ì°æ(Scanning Auger Electron Spectroscopy (AES) Nanoprobe) |
Á¦ÀÛ»ç |
ULVAC-PHI |
¸ðµ¨¸í |
PHI 700 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1163È£
|
|
Àåºñ¸í |
¼öÂ÷º¸Á¤ ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs-Corrected Scanning Transmission Electron Microscope (Cs-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-ARM200F |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1176È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6480LV |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1187È£
|
|
Àåºñ¸í |
Rockwell °æµµ±â(Rockwell Hardness Testing Machine) |
Á¦ÀÛ»ç |
Akashi |
¸ðµ¨¸í |
Wizhard |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1188È£
|
|
Àåºñ¸í |
½ÃÂ÷¿ºÐ¼®/½ÃÂ÷Áֻ翷®ºÐ¼®±â(Differential Thermal Analysis (DTA)/Differential Scanning Calorimeter (DSC)) |
Á¦ÀÛ»ç |
SETARAM Instrumentation |
¸ðµ¨¸í |
Labsys DTA/DSC |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1188È£
|
|
Àåºñ¸í |
Vickers °æµµ±â(Vickers Hardness Testing Machine) |
Á¦ÀÛ»ç |
Mitutoyo |
¸ðµ¨¸í |
HV-114 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1188È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-3400N |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1190È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-7600F |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1192È£
|
|
Àåºñ¸í |
ÀüÀÚ¼± ¹Ì¼ÒºÎ ºÐ¼®±â(Electron Probe Microanalyzer (EPMA)) |
Á¦ÀÛ»ç |
SHIMADZU |
¸ðµ¨¸í |
EPMA-1600 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1194È£
|
|
Àåºñ¸í |
°¡½ººÎ½Ä½ÃÇè±â(Gas Corrosion Test Instrument) |
Á¦ÀÛ»ç |
SUGA |
¸ðµ¨¸í |
GT-100 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1272È£
|
|
Àåºñ¸í |
°íºÐÇØ´É À¯µµ °áÇÕ ÇöóÁ Áú·®ºÐ¼®±â(High Resolution Inductively Coupled Plasma Mass Spectrometer (HR-ICP-MS)) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
ELEMENT XR |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1304È£
|
|
Àåºñ¸í |
Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
VERTEX 70 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1306È£
|
|
Àåºñ¸í |
·¹ÀÌÀú À¯µµ ÇöóÁ ºÐ±¤ºÐ¼®±â(Tandem Laser-ablation Laser-induced Breakdown Spectrometer (LA-LIBS)) |
Á¦ÀÛ»ç |
Applied Spectra |
¸ðµ¨¸í |
J200 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1306È£
|
|
Àåºñ¸í |
»ïÁß »ç±ØÀÚ À¯µµ °áÇÕ ÇöóÁ Áú·®ºÐ¼®±â(Triple Quadrupole Inductively Coupled Plasma Mass Spectrometer (TQ-ICP-MS)) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
iCAP TQ |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1306È£
|
|
Àåºñ¸í |
À¯µµ °áÇÕ ÇöóÁ ºÐ±¤ºÐ¼®±â(Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES)) |
Á¦ÀÛ»ç |
AMETEK |
¸ðµ¨¸í |
Spectro Arcos |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1309È£
|
|
Àåºñ¸í |
À¯µµ °áÇÕ ÇöóÁ ºÐ±¤ºÐ¼®±â(Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES)) |
Á¦ÀÛ»ç |
PerkinElmer |
¸ðµ¨¸í |
Optima 8300 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1311È£
|
|
Àåºñ¸í |
À¯µµ °áÇÕ ÇöóÁ ºÐ±¤ºÐ¼®±â(Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES)) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
iCAP 7000 Series |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1311È£
|
|
Àåºñ¸í |
À¯µµ °áÇÕ ÇöóÁ ºÐ±¤ºÐ¼®±â(Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES)) |
Á¦ÀÛ»ç |
AMETEK |
¸ðµ¨¸í |
Spectro Arcos |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1311È£
|
|
Àåºñ¸í |
°í¼º´É ¾×ü Å©·Î¸¶Åä±×·¡ÇÇ(Ultra High Performance Liquid Chromatograph (UHPLC)) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
DIONEX UltiMate 3000 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1316È£
|
|
Àåºñ¸í |
°í¼º´É ¾×ü Å©·Î¸¶Åä±×·¡ÇÇ(Ultra High Performance Liquid Chromatograph (UHPLC)) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
DIONEX UltiMate 3000 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1316È£
|
|
Àåºñ¸í |
Áøµ¿Çü ÄŹÐ(Vibrating Cup Mill) |
Á¦ÀÛ»ç |
FRITSCH |
¸ðµ¨¸í |
Pulverisette 9 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1338È£
|
|
Àåºñ¸í |
Ź»óÇü Àý´Ü±â(Tabletop Cut-off Machine) |
Á¦ÀÛ»ç |
Struers |
¸ðµ¨¸í |
Discotom-100 |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2177È£
|
|
Àåºñ¸í |
Àüµ¿ µðÁöÅÐ Çö¹Ì°æ(Opto-digital Motorizing Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
DSX100 |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2179È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
OLS3000 |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2179È£
|
|
Àåºñ¸í |
ÇǷνÃÇè±â(Fatigue Testing Machine) |
Á¦ÀÛ»ç |
MTS |
¸ðµ¨¸í |
MTS Landmark Servohydraulic Test System |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2180È£
|
|
Àåºñ¸í |
¸¶¿îÆÃ Àåºñ(CitoPress Mounting Equipment) |
Á¦ÀÛ»ç |
Struers |
¸ðµ¨¸í |
Citopress-30 |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2185È£
|
|
Àåºñ¸í |
ÇǷνÃÇè±â(Fatigue Testing Machine) |
Á¦ÀÛ»ç |
MTS |
¸ðµ¨¸í |
MTS Landmark Servohydraulic Test System |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2187È£
|
|
Àåºñ¸í |
ÇǷνÃÇè±â(Fatigue Testing Machine) |
Á¦ÀÛ»ç |
MTS |
¸ðµ¨¸í |
MTS Landmark Servohydraulic Test System |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2195È£
|
|
Àåºñ¸í |
°¡¿/³Ã°¢ è¹ö(Heating/Cooling Chamber) |
Á¦ÀÛ»ç |
JEIO TECH |
¸ðµ¨¸í |
K-Series ID CHAMBER |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3009È£
|
|
Àåºñ¸í |
CASS ½ÃÇè±â(CASS Test Instrument) |
Á¦ÀÛ»ç |
SUGA |
¸ðµ¨¸í |
CAP-90V-5 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3010È£
|
|
Àåºñ¸í |
QUVÃËÁø ³»Èļº ½ÃÇè±â(QUV Accelerated Weathering Tester) |
Á¦ÀÛ»ç |
Q-LAB |
¸ðµ¨¸í |
QUV/spray |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3018È£
|
|
Àåºñ¸í |
Áø°ø è¹ö Á¤¹Ð ºÐ¼® Àåºñ(Vacuum Chamber I-V Probing System) |
Á¦ÀÛ»ç |
MS TECH |
¸ðµ¨¸í |
MST5000 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3102È£
|
|
Àåºñ¸í |
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System) |
Á¦ÀÛ»ç |
Selcos |
¸ðµ¨¸í |
Cetus-E |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3104È£
|
|
Àåºñ¸í |
Á¤¹ÐÀÚµ¿Àý´Ü±â(Linear Precision Saw) |
Á¦ÀÛ»ç |
BUEHLER |
¸ðµ¨¸í |
ISOMET4000 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3132È£
|
|
Àåºñ¸í |
Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Thermal Evaporating System) |
Á¦ÀÛ»ç |
TERALEADER |
¸ðµ¨¸í |
TLP1001 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3139È£
|
|
Àåºñ¸í |
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System) |
Á¦ÀÛ»ç |
iNFOVION |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3147È£
|
|
Àåºñ¸í |
½Ç½Ã°£ PCR ½Ã½ºÅÛ(Real-time Polymerase Chain Reaction (PCR) System) |
Á¦ÀÛ»ç |
Roche |
¸ðµ¨¸í |
LightCycler96 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3153È£
|
|
Àåºñ¸í |
Çü±¤/Àα¤ ÃøÁ¤ ½Ã½ºÅÛ(Fluoroscence/Luminescence Measuring System) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
Fluoroskan Ascent FL |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3161È£
|
|
Àåºñ¸í |
PC Á¦¾î À̹ÌÁö ÀÎ½Ä µµÆ÷ ½Ã½ºÅÛ(PC Control Image Recognition Dispensing System) |
Á¦ÀÛ»ç |
MUSASHI ENGINEERING, INC. |
¸ðµ¨¸í |
IMAGE MASTER 350PC SMART/SHOTMASTER 300DS-S |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3170È£
|
|
Àåºñ¸í |
¹ü¿ë ÇÁ·Îºê ½Ã½ºÅÛ(Universal Measurement Probe System) |
Á¦ÀÛ»ç |
TERALEADER |
¸ðµ¨¸í |
UMP100 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3170È£
|
|
Àåºñ¸í |
3D º¯ÇüÃøÁ¤½Ã½ºÅÛ(3D Deformation Analysis System) |
Á¦ÀÛ»ç |
GOM international AG |
¸ðµ¨¸í |
ARAMIS 12M |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3188È£
|
|
Àåºñ¸í |
ÁÖ»ç Åõ°ú ÀüÀÚÇö¹Ì°æ(Scanning Transmission Electron Microscope (STEM)) |
Á¦ÀÛ»ç |
COXEM |
¸ðµ¨¸í |
CX-200 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3188È£
|
|
Àåºñ¸í |
¸¸´É ½ÃÇè±â(Micro Universal Testing Machine (UTM)) |
Á¦ÀÛ»ç |
R&B |
¸ðµ¨¸í |
RB 302 ML |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3188È£
|
|
Àåºñ¸í |
½ºÆÛÅ͸µ ½Ã½ºÅÛ(Sputtering System) |
Á¦ÀÛ»ç |
SNTEK |
¸ðµ¨¸í |
RSP-5000 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3219È£
|
|
Àåºñ¸í |
RIE ½Ã½ºÅÛ(Reactive Ion Etching (RIE) System) |
Á¦ÀÛ»ç |
SNTEK |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3219È£
|
|
Àåºñ¸í |
¹Ú¸·ÃøÁ¤±â(Thin Film Measurement System) |
Á¦ÀÛ»ç |
KSV INSTRUMENTS |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3229È£
|
|
Àåºñ¸í |
½ºÆÛÅ͸µ ½Ã½ºÅÛ(Sputtering System) |
Á¦ÀÛ»ç |
SNTEK |
¸ðµ¨¸í |
RSP-5000 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3263È£
|
|
Àåºñ¸í |
ÀüÁö ¼º´É ½ÃÇè±â(Multi-cycling Battery Test System) |
Á¦ÀÛ»ç |
Korea Thermo-Tech |
¸ðµ¨¸í |
SERIES 4000 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3278È£
|
|
Àåºñ¸í |
¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC)) |
Á¦ÀÛ»ç |
TA Instruments |
¸ðµ¨¸í |
SDT Q600 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3278È£
|
|
Àåºñ¸í |
±¤»ê¶õ °ËÃâ±â(Light Scattering Detector) |
Á¦ÀÛ»ç |
Precision Detectors |
¸ðµ¨¸í |
PD2020 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3306È£
|
|
Àåºñ¸í |
½ÃÂ÷ ÁÖ»ç ¿·®ÃøÁ¤±â(Differential Scanning Calorimeter (DSC)) |
Á¦ÀÛ»ç |
PerkinElmer |
¸ðµ¨¸í |
DSC 4000 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3312È£
|
|
Àåºñ¸í |
QE ÃøÁ¤±â(External and Internal Quantum Efficiency (EQE and IQE) Measurement System) |
Á¦ÀÛ»ç |
NEWPORT |
¸ðµ¨¸í |
Oriel IQE-200 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3340È£
|
|
Àåºñ¸í |
´Ü°áÁ¤ ¿¢½º·¹ÀÌ È¸ÀýÀåÄ¡(Single Crystal X-ray Diffractometer) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
APEXII Quazar |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3352/3354È£
|
|
Àåºñ¸í |
Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Vacuum Thermal Evaporating System) |
Á¦ÀÛ»ç |
WOOSUNG HI-VAC |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3363È£
|
|
Àåºñ¸í |
°í¼º´É À¯¼¼Æ÷ºÐ¼®±â(High Performance Flow Cytometer) |
Á¦ÀÛ»ç |
Becton Dickinson And Company |
¸ðµ¨¸í |
FACS Canto II |
¼³Ä¡Àå¼Ò |
°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
|
|
Àåºñ¸í |
¿µ»óºÐ¼® ½Ã½ºÅÛ(Luminescent Image Analyzer) |
Á¦ÀÛ»ç |
FUJIFILM |
¸ðµ¨¸í |
LAS-4000 |
¼³Ä¡Àå¼Ò |
°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
|
|
Àåºñ¸í |
µµ¸³ Çü±¤ Çö¹Ì°æ(Fluorescence Inverted Microscope) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
Axio Observer A1 |
¼³Ä¡Àå¼Ò |
°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
|
|
Àåºñ¸í |
½Ç½Ã°£ PCR ½Ã½ºÅÛ(Real-time Polymerase Chain Reaction (PCR) System) |
Á¦ÀÛ»ç |
Roche |
¸ðµ¨¸í |
LightCycler480 |
¼³Ä¡Àå¼Ò |
°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
|
|
Àåºñ¸í |
»ýü³» Çü±¤ºÐ±¤ ºÐ¼®±â(Automatic Multispectral In vivo Imaging) |
Á¦ÀÛ»ç |
CRI, INC |
¸ðµ¨¸í |
Maestro II |
¼³Ä¡Àå¼Ò |
°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
|
|
Àåºñ¸í |
°í¼Ó ´Ü¹éÁú ¾×ü Å©·Î¸¶Åä±×·¡ÇÇ (FPLC)(Fast Protein Liquid Chromatography (FPLC)) |
Á¦ÀÛ»ç |
GE Healthcare |
¸ðµ¨¸í |
AKTA purifier |
¼³Ä¡Àå¼Ò |
°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
|
|
Àåºñ¸í |
5Ãà º¹ÇÕ °¡°ø±â(5-axis Computerized Numerical Control (CNC) Turning Center) |
Á¦ÀÛ»ç |
DMG |
¸ðµ¨¸í |
CTX Beta 1250 TC |
¼³Ä¡Àå¼Ò |
±â°è°øÀÛµ¿ 100È£
|
|
Àåºñ¸í |
¹ü¿ë ¹Ð¸µ ¸Ó½Å´×¼¾ÅÍ(Universal Milling Machining Center) |
Á¦ÀÛ»ç |
±âÈï±â°è |
¸ðµ¨¸í |
KMB-U5 |
¼³Ä¡Àå¼Ò |
±â°è°øÀÛµ¿ 100È£
|
|
Àåºñ¸í |
¼öÁ÷Çü ¸Ó½Ã´×¼¾ÅÍ(Vertical Machining Center) |
Á¦ÀÛ»ç |
µÎ»ê°øÀÛ±â°è |
¸ðµ¨¸í |
DNM 750¥± |
¼³Ä¡Àå¼Ò |
±â°è°øÀÛµ¿ 100È£
|
|
Àåºñ¸í |
CNC ¼öÆòÇü ¸Ó½Å´×¼¾ÅÍ(Computerized Numerical Control (CNC) Machining Center) |
Á¦ÀÛ»ç |
´ë¿ìÁß°ø¾÷ |
¸ðµ¨¸í |
ACE-H50 |
¼³Ä¡Àå¼Ò |
±â°è°øÀÛµ¿ 101È£
|
|
Àåºñ¸í |
CNC ¿ÍÀ̾î ÄÆÆÃ ¸Ó½Å´×¼¾ÅÍ(Computerized Numerical Control (CNC) Wire Cut Machining Center) |
Á¦ÀÛ»ç |
SODICK |
¸ðµ¨¸í |
AL600G |
¼³Ä¡Àå¼Ò |
±â°è°øÀÛµ¿ 101È£
|
|
Àåºñ¸í |
±Ý¼Ó ºÐ¸» 3Â÷¿ø Á¶Çü Àåºñ(Metal Additive Manufacturing Machine) |
Á¦ÀÛ»ç |
Concept Laser GmbH |
¸ðµ¨¸í |
M2 cusing SL400W |
¼³Ä¡Àå¼Ò |
±â°è°øÀÛµ¿ 202È£
|
|
Àåºñ¸í |
À̺ÒÈÁ¦³í ½Ä°¢±â(Xenon difluoride Etching system) |
Á¦ÀÛ»ç |
¢ß½ÎÀÌ¿£ÅØ |
¸ðµ¨¸í |
Xef2 etching system |
¼³Ä¡Àå¼Ò |
±â°è½ÇÇ赿 104È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(S.E.M(SCANNING ELECTRON MICROSCOPE)) |
Á¦ÀÛ»ç |
JEOL LTD |
¸ðµ¨¸í |
JSM-6390LV |
¼³Ä¡Àå¼Ò |
±â°è½ÇÇ赿 106È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-7401F |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 103È£
|
|
Àåºñ¸í |
3D ¿øÀÚÇö¹Ì°æ(3D Atom Probe) |
Á¦ÀÛ»ç |
CAMECA Instruments |
¸ðµ¨¸í |
LA-WATAP |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 105-2È£
|
|
Àåºñ¸í |
±¹¼Ò ·¹ÀÌÁ® Àü°èÇü ¿øÀÚ´ÜÃþÇö¹Ì°æ(Local Electrode Atom Probe) |
Á¦ÀÛ»ç |
CAMECA Instruments |
¸ðµ¨¸í |
LEAP 4000X HR |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 105-3È£
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Veeco |
¸ðµ¨¸í |
Dimension 3100 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 101È£
|
|
Àåºñ¸í |
ÃʰíÁø°øÀú¿Â ÁÖ»çÅͳθµÇö¹Ì°æ(Ultra High Vacuum Low Temperature Scanning Tunneling Microscopy (STM)) |
Á¦ÀÛ»ç |
Unisoku |
¸ðµ¨¸í |
USM 1200 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 101È£
|
|
Àåºñ¸í |
°í¼ÓȸÀü °ÇÁ¶±â(Spin Dryer (High Spin)) |
Á¦ÀÛ»ç |
KSM |
¸ðµ¨¸í |
KSD-6001 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 216È£
|
|
Àåºñ¸í |
Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Thermal Evaporating System) |
Á¦ÀÛ»ç |
DDONG High Technologies |
¸ðµ¨¸í |
Thermal Evaporator System |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 311È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2100F(with STEM Cs corrector) |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM ½Ç
|
|
Àåºñ¸í |
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope
(Cs-corrected HR-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2200FS |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM-2200FS½Ç
|
|
Àåºñ¸í |
Àý´Ü¿¬¸¶±â(Polishing Machine) |
Á¦ÀÛ»ç |
Allied |
¸ðµ¨¸í |
Multiprep |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø ½ÃÆíÁغñ½Ç 312È£
|
|
Àåºñ¸í |
À̿¿¬¸¶±â(Ion Milling System) |
Á¦ÀÛ»ç |
GL CORPORATION |
¸ðµ¨¸í |
PIPS1 691 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø ½ÃÆíÁغñ½Ç 312È£
|
|
Àåºñ¸í |
Àú¿¡³ÊÁö À̿ ¿¬¸¶±â(Gentle Mill (Low Energy Ion Milling System)) |
Á¦ÀÛ»ç |
TechnoOrg Linda |
¸ðµ¨¸í |
IV5 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø ½ÃÆíÁغñ½Ç 312È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
LEO Elektronrnmikroskopie GmbH |
¸ðµ¨¸í |
FE-SEM |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System) |
Á¦ÀÛ»ç |
Korea Vacuum Tech |
¸ðµ¨¸í |
KVE-C300160 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
Á֯ļöÃøÁ¤±â(Universal Probe Holder) |
Á¦ÀÛ»ç |
MBRAUN |
¸ðµ¨¸í |
MB6000 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
°íºÐÀÚ À¯±â ¹ÝµµÃ¼ ¹°Áú µµÆ÷ ÀåÄ¡(Spin Coater with Glove Box) |
Á¦ÀÛ»ç |
¼¼¸í¿¡¹ö¿¡³ÊÁö(ÁÖ) |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System) |
Á¦ÀÛ»ç |
Korea Vacuum Tech |
¸ðµ¨¸í |
KVE-4000 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
ÀÓ°èÄ¡¼ö ÃøÁ¤ ÁÖ»çÀüÀÚÇö¹Ì°æ(Critical Dimension Scanning Electron Microscope (CD-SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-9380 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
½ºÆÛÅ͸µ ½Ã½ºÅÛ(Sputtering System) |
Á¦ÀÛ»ç |
SNTEK |
¸ðµ¨¸í |
MSS5000 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
½ÃÆ® ÀúÇ× ÃøÁ¤ ½Ã½ºÅÛ(4 Point Probe) |
Á¦ÀÛ»ç |
(ÁÖ)¿¡À̾ÆÀÌÆ¼ |
¸ðµ¨¸í |
CMT-SR2000N |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
°¨±¤Á¦ ȸÀü µµÆ÷±â(Photoresist (PR) Spin Coater) |
Á¦ÀÛ»ç |
SAWATEC Solutions AG |
¸ðµ¨¸í |
LSM 250 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
ȸÀü °ÇÁ¶±â(Spin Dryer) |
Á¦ÀÛ»ç |
PTLKorea |
¸ðµ¨¸í |
8300S |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
À¯µµ°áÇÕ ÇöóÁ ½Ä°¢ ÀåÄ¡(Inductively Coupled Plasma (ICP) Etcher) |
Á¦ÀÛ»ç |
(ÁÖ)µð¿¥¿¡½º |
¸ðµ¨¸í |
ICP Etcher |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
½ºÆÛÅ͸µ ½Ã½ºÅÛ(Sputtering System) |
Á¦ÀÛ»ç |
AMAT |
¸ðµ¨¸í |
E5500 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
ÀüÀÚºö ÁõÂø±â(E-beam Evaporating System) |
Á¦ÀÛ»ç |
Korea Vacuum Tech |
¸ðµ¨¸í |
KVE-C300160 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
º¸È£¸·¿ë ÇöóÁ ÈÇÐ ±â»ó ÁõÂø±â(Plasma Enhanced Chemical Vapor Deposition (PE-CVD) for Passivation) |
Á¦ÀÛ»ç |
TES |
¸ðµ¨¸í |
TELIA200 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
´ÙÀÌ½Ì ½î¿ì(Dicing Saw) |
Á¦ÀÛ»ç |
DISCO |
¸ðµ¨¸í |
DFD 6340 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
°í¼Ó ´Ü¹éÁú ¾×ü Å©·Î¸¶Åä±×·¡ÇÇ (FPLC)(Fast Protein Liquid Chromatography (FPLC)) |
Á¦ÀÛ»ç |
GE Healthcare |
¸ðµ¨¸í |
AKTA FPLC |
¼³Ä¡Àå¼Ò |
»ý¸í°øÇבּ¸¼¾ÅÍ 229È£
|
|
Àåºñ¸í |
ÃʰíÇØ»óµµ smFRET STORM À̹Ì¡ Àåºñ(Super-resolution smFRET STORM imaging system) |
Á¦ÀÛ»ç |
ONI |
¸ðµ¨¸í |
Oxford Nanoimager S |
¼³Ä¡Àå¼Ò |
»ý¸í°øÇבּ¸¼¾ÅÍ 253È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
IX81 |
¼³Ä¡Àå¼Ò |
»ý¸í°øÇבּ¸¼¾ÅÍ 328È£
|
|
Àåºñ¸í |
µå¶ø¼¼ÅÍ(Drop Setter for Protein Crystallization) |
Á¦ÀÛ»ç |
FORMULATRIX |
¸ðµ¨¸í |
NT8 |
¼³Ä¡Àå¼Ò |
»ý¸í°úÇаü 204È£
|
|
Àåºñ¸í |
[±Û·ÎÄÃ] 3D·¹Áø ÇÁ¸°ÅÍ +¼¼Ã´±â ¼¼Æ®([Glocal] 3D Resin Printer + Washing Machine Set) |
Á¦ÀÛ»ç |
¿¡ÀÌÆå½º¾²¸®µð(APEX3D) |
¸ðµ¨¸í |
Form 4L Complete Package |
¼³Ä¡Àå¼Ò |
ÀΰøÁö´É¿¬±¸¿ø 142È£
|
|
Àåºñ¸í |
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope(Cs-corrected HR-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2200FS (UHR) |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 109È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-3400N |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 111È£
|
|
Àåºñ¸í |
½ÃÂ÷ ÁÖ»ç ¿·®ÃøÁ¤±â(Differential Scanning Calorimeter (DSC)) |
Á¦ÀÛ»ç |
SETARAM Instrumentation |
¸ðµ¨¸í |
Labsys Evo |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 112È£
|
|
Àåºñ¸í |
ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM)) |
Á¦ÀÛ»ç |
Veeco |
¸ðµ¨¸í |
Dimension 3100 |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 208È£
|
|
Àåºñ¸í |
°Ç½Ä½Ä°¢ÀåÄ¡(Inductively Coupled Plasma (ICP) Etcher) |
Á¦ÀÛ»ç |
Korea Vacuum Tech |
¸ðµ¨¸í |
KVICP-T406530 |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 210È£
|
|
Àåºñ¸í |
Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Thermal Evaporating System) |
Á¦ÀÛ»ç |
GD-Tech |
¸ðµ¨¸í |
KVT-2008L |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 210È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚ Çö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
PHILIPS ELECTRON OPTICS B.V. |
¸ðµ¨¸í |
XL30S FEG |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 306-1È£
|
|
Àåºñ¸í |
À¯µµ °áÇÕ ÇöóÁ Áú·®ºÐ¼®±â(Inductively Coupled Plasma Mass Spectrometer (ICP-MS)) |
Á¦ÀÛ»ç |
PerkinElmer |
¸ðµ¨¸í |
NexION-300D |
¼³Ä¡Àå¼Ò |
Á¦1½ÇÇ赿 318È£
|
|
Àåºñ¸í |
¹æ»ç¼± µ¿À§¿ø¼Ò ¾×ü ¼¶±¤ °è¼ö±â(Liquid Scintillation Analyzer) |
Á¦ÀÛ»ç |
PerkinElmer |
¸ðµ¨¸í |
Tri-carb 2910TR |
¼³Ä¡Àå¼Ò |
Á¦1½ÇÇ赿 318È£
|
|
Àåºñ¸í |
ÀúÁØÀ§ ¾×ü¼¶±¤ºÐ¼®±â(Low Activity Liquid Scintillation Analyzer) |
Á¦ÀÛ»ç |
PerkinElmer |
¸ðµ¨¸í |
Tri-Carb 5110 TR |
¼³Ä¡Àå¼Ò |
Á¦1½ÇÇ赿 318È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
IX71 |
¼³Ä¡Àå¼Ò |
Á¦2°øÇаü 033È£
|
|
Àåºñ¸í |
3D ÇÁ¸°ÅÍ(3D Printer) |
Á¦ÀÛ»ç |
Stratasys |
¸ðµ¨¸í |
Objet Eden260V |
¼³Ä¡Àå¼Ò |
Á¦2°øÇаü 504È£
|
|
Àåºñ¸í |
°íÈ¿À² À̹Ì¡ ½Ã½ºÅÛ(Electron Multiplying Charge-Coupled Device (EMCCD)) |
Á¦ÀÛ»ç |
Andor |
¸ðµ¨¸í |
iXon DU-897 |
¼³Ä¡Àå¼Ò |
Á¦3°øÇаü 006È£
|
|
Àåºñ¸í |
¹ü¿ë ¹Ð¸µ ¸Ó½Å´×¼¾ÅÍ(Universal Milling Machining Center) |
Á¦ÀÛ»ç |
±âÈï±â°è |
¸ðµ¨¸í |
KMB-U3 |
¼³Ä¡Àå¼Ò |
Á¦3°øÇаü 007È£
|
|
Àåºñ¸í |
°íÁÖÆÄ À¯µµ °¡¿ ¿ëÇØ·Î(High Frequency Induction Heater) |
Á¦ÀÛ»ç |
EMWise Communications |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
Á¦3°øÇаü 105È£
|
|
Àåºñ¸í |
±Ø¹Ì±¤ °ËÃâ Ä«¸Þ¶ó(Intensified Charged Coupled Device (ICCD)) |
Á¦ÀÛ»ç |
Princeton Instruments |
¸ðµ¨¸í |
PI-MAX4-1024i |
¼³Ä¡Àå¼Ò |
Á¦3°øÇаü 105È£
|
|
Àåºñ¸í |
´ÙÀÌ¿Àµå ·¹ÀÌÀú Á¶Àý±â(Digital Controller for Diode Lasers) |
Á¦ÀÛ»ç |
Toptica Photonics |
¸ðµ¨¸í |
DLC pro |
¼³Ä¡Àå¼Ò |
Á¦3°øÇаü 402È£
|
|
Àåºñ¸í |
´Ù¸ñÀû ¹Ú¸· Ç¥¸é±¸Á¶ ºÐ¼® ¿øÀÚ Çö¹Ì°æ Àåºñ(Muti-purpose Atomic Force Microscope (AFM) System) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
MultiMode 8 |
¼³Ä¡Àå¼Ò |
Á¦3°øÇаü 529È£
|
|
Àåºñ¸í |
¼ºÇü»çÃâ±â(Injection Machine) |
Á¦ÀÛ»ç |
Battenfeld Kunststoffmaschinen |
¸ðµ¨¸í |
Microsystem 50 |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 006È£
|
|
Àåºñ¸í |
¼ºÇü»çÃâ±â(Injection Machine) |
Á¦ÀÛ»ç |
SUMITOMO HEAVY INDUSTRIES, LTD |
¸ðµ¨¸í |
SE50D |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 006È£
|
|
Àåºñ¸í |
³ª³ë½Ã½º SPM Á¶Àý ½Ã½ºÅÛ(Nanonis Scanning Probe Microscopy (SPM) Control System) |
Á¦ÀÛ»ç |
SPECS |
¸ðµ¨¸í |
SPECS Nanonis Controller |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 008È£
|
|
Àåºñ¸í |
3D ÇÁ¸°ÅÍ(3D Printer) |
Á¦ÀÛ»ç |
(ÁÖ)ÇÁ·ÎÅäÅØ |
¸ðµ¨¸í |
Dimension SST 1200es |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 104È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
CKX41 |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 204È£
|
|
Àåºñ¸í |
Àç·á½ÃÇè±â(Nano Testing System) |
Á¦ÀÛ»ç |
MTS |
¸ðµ¨¸í |
Nano UTM Testing System |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 206-1È£
|
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
SEIKO INSTRUMENTS INC. |
¸ðµ¨¸í |
SPI3800N Pro |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 206-1È£
|
|
Àåºñ¸í |
¼ÒÇü ÄÄÆÄ¿îµù Àåºñ(Mini Compounder) |
Á¦ÀÛ»ç |
(ÁÖ)½êŏŨ |
¸ðµ¨¸í |
Twin Screw Mixer |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 206È£
|
|
Àåºñ¸í |
¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC)) |
Á¦ÀÛ»ç |
Mettler Toledo |
¸ðµ¨¸í |
Mettler Toledo AG |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 206È£
|
|
Àåºñ¸í |
»ó¿Â¿È®»êµµÃøÁ¤Àåºñ(Flash Diffusivity Testing Apparatus) |
Á¦ÀÛ»ç |
ERICH NETZSCH GmbH & Co. Holdi |
¸ðµ¨¸í |
LFA 467 |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 304È£
|
|
Àåºñ¸í |
·¹ÀÌÀú À¯µµºØ±« ºÐ±¤±â(Laser-induced Breakdown Spectroscopy (LIBS)) |
Á¦ÀÛ»ç |
Applied Spectra |
¸ðµ¨¸í |
Aurora LIBS module |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 423È£
|
|
Àåºñ¸í |
µ¿Àû±¤»ê¶õ ºÐ±¤±â(Dynamic Light Scattering Spectroscopy) |
Á¦ÀÛ»ç |
Malvern Instruments |
¸ðµ¨¸í |
Nano ZS90 |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 423È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
Bio-logic SAS |
¸ðµ¨¸í |
M470 |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 228È£
|
|
Àåºñ¸í |
Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA)) |
Á¦ÀÛ»ç |
SurForce LLC |
¸ðµ¨¸í |
SFA 2000 |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 230È£
|
|
Àåºñ¸í |
Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA)) |
Á¦ÀÛ»ç |
SurForce LLC |
¸ðµ¨¸í |
SFA 2000 |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 230È£
|
|
Àåºñ¸í |
¼±Çü À̿ Ʈ·¦ Áú·®ºÐ¼®±â(Linear Ion Trap Mass Spectrometry) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
VELOS PRO |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 232È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6010LV |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 232È£
|
|
Àåºñ¸í |
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System) |
Á¦ÀÛ»ç |
Dynamic Systems |
¸ðµ¨¸í |
GLEEBLE 3500 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 142-4È£
|
|
Àåºñ¸í |
´ëÇüÀý´Ü±â(Large Automatic Cut-off Machine) |
Á¦ÀÛ»ç |
Struers |
¸ðµ¨¸í |
Axitom-5 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 146-8È£
|
|
Àåºñ¸í |
¸¶¿îÆÃ Àåºñ(CitoPress Mounting Equipment) |
Á¦ÀÛ»ç |
Struers |
¸ðµ¨¸í |
Citopress-20 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 146-8È£
|
|
Àåºñ¸í |
¿¬¸¶±â(Grinding/Polishing Machine) |
Á¦ÀÛ»ç |
Struers |
¸ðµ¨¸í |
Abrapol-20 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 146-8È£
|
|
Àåºñ¸í |
¸ÖƼ ½ºÄÉÀÏ ¹Ì¼¼±¸Á¶ ºÐ¼® ½Ã½ºÅÛ(Multi-scale Microstructure Analysis System) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
Neo-ARM |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 161È£
|
|
Àåºñ¸í |
À¯µµ °áÇÕ ÇöóÁ ºÐ±¤ºÐ¼®±â(Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES)) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
iCAP 6500 DUO |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 176È£
|
|
Àåºñ¸í |
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System) |
Á¦ÀÛ»ç |
Dynamic Systems |
¸ðµ¨¸í |
GLEEBLE 3500 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 242-4È£
|
|
Àåºñ¸í |
Ç¥¸é󸮽ýºÅÛ(Target Surfacing System) |
Á¦ÀÛ»ç |
Leica Microsystems |
¸ðµ¨¸í |
EM TXP |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 250È£
|
|
Àåºñ¸í |
Áø°øÁÖÁ¶±â(Vacuum Casting Machine) |
Á¦ÀÛ»ç |
¢ßÄÉÀÌ¿¡ÀÌ¿¥¾ÆÀÌ |
¸ðµ¨¸í |
MC100V |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 272È£
|
|
Àåºñ¸í |
Áø°ø-°¡¾Ð ¿ëÇØ ¹× ¿¬¼ÓÁÖÁ¶ÀåÄ¡(Vacuum-over Pressure Continuous Casting Machine) |
Á¦ÀÛ»ç |
¢ßÄÉÀÌ¿¡ÀÌ¿¥¾ÆÀÌ |
¸ðµ¨¸í |
VCC 1000 (indutherm) |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 272È£
|
|
Àåºñ¸í |
°í¿ÂÀÎÀå½ÃÇè±â(High Temp Universel Testing Instrument) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
M5582 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 284È£
|
|
Àåºñ¸í |
³ª³ë Àε§ÅÍ(Nano Indenter) |
Á¦ÀÛ»ç |
Agilent Technologies |
¸ðµ¨¸í |
Nano Indenter G200 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 284È£
|
|
Àåºñ¸í |
TEM¿ë À̿¹иµ½Ã½ºÅÛ(Ion Milling System for Transmission Electron Microscope (TEM)) |
Á¦ÀÛ»ç |
¢ßÁö¿¤ÄÚÆÛ·¹ÀÌ¼Ç |
¸ðµ¨¸í |
Gatan model 691 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 284È£
|
|
Àåºñ¸í |
Àç·á½ÃÇè±â(Advanced Indentation System) |
Á¦ÀÛ»ç |
(ÁÖ)ÇÁ·Ðƽ½º |
¸ðµ¨¸í |
AIS2000 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 312-4È£
|
|
Àåºñ¸í |
±Ý¼Ó ÆÇÀç ÀÎÀå¾ÐÃà½ÃÇè±â(Sheet Metal Deformation Simulator) |
Á¦ÀÛ»ç |
¢ß¾Ë¾Øºñ |
¸ðµ¨¸í |
RB319 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 312-4È£
|
|
Àåºñ¸í |
¹ü¿ë ½ÃÇè±â(Universal Sheet Metal Testing Machine) |
Á¦ÀÛ»ç |
ERICHSEN |
¸ðµ¨¸í |
145-60 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 331-3È£
|
|
Àåºñ¸í |
°í¼ÓÀÎÀåÃæ°Ý½ÃÇè±â(High Strain Tensile Impact Tester) |
Á¦ÀÛ»ç |
´ëµ¿Á¤¹Ð |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 331-3È£
|
|
Àåºñ¸í |
±ÝÇüÅ×½ºÅͱâ(U Draw Test Mold for Servo Press) |
Á¦ÀÛ»ç |
R&B |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 331-3È£
|
|
Àåºñ¸í |
¾ÆÅ©¿ëÇØ·Î(Arc Melting Furnace) |
Á¦ÀÛ»ç |
¾ÆÀ̾¾Æ¼ |
¸ðµ¨¸í |
KHAM-500 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 374È£
|
|
Àåºñ¸í |
½ºÆÛÅÍ / Áø°øÁõÂø ÀåÄ¡(Sputtering / Vacuum Deposition System) |
Á¦ÀÛ»ç |
¾ÆÀ̾¾Æ¼ |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 374È£
|
|
Àåºñ¸í |
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
INSTRON 8801 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 416-8È£
|
|
Àåºñ¸í |
ÇǷνÃÇè±â(Fatigue Testing Machine) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
INSTRON 8801 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 416-8È£
|
|
Àåºñ¸í |
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
INSTRON 8801 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 416È£
|
|
Àåºñ¸í |
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
INSTRON 8501 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 431-3È£
|
|
Àåºñ¸í |
Àç·á½ÃÇè±â(Material Testing Machine) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
INSTRON 8862 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 431-3È£
|
|
Àåºñ¸í |
¹ü¿ë Àç·á ½ÃÇè±â(Universal Testing System) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
INSTRON 3382 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 431-3È£
|
|
Àåºñ¸í |
¼ö¼Ò·® ºÐ¼® ½Ã½ºÅÛ(Total Dissolved Solids (TDS) System for Hydrogen Analysis) |
Á¦ÀÛ»ç |
R-Dec |
¸ðµ¨¸í |
HTDS-003 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 435-7È£
|
|
Àåºñ¸í |
µ¿Àû±¤»ê¶õ ºÐ±¤±â(Dynamic Light Scattering Spectroscopy) |
Á¦ÀÛ»ç |
Malvern Instruments |
¸ðµ¨¸í |
Nano ZS |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 476È£
|
|
Àåºñ¸í |
3D Àç·á ºÐ¼®(3D Materials Analysis) |
Á¦ÀÛ»ç |
UES, INC |
¸ðµ¨¸í |
Robo-Met. 3D Version 2 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 480È£
|
|
Àåºñ¸í |
°í¼ÓÁÖÁ¶ ÁÖÆí ³Ã°¢ ¹× ÀÀ°í simulator(Simulator for Solidification and Cooling of a Slab during High Speed Continuous Casting) |
Á¦ÀÛ»ç |
¢ßÄÉÀÌ¿¡ÀÌ¿¥¾ÆÀÌ |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 480È£
|
|
Àåºñ¸í |
°í¿Â½ÃÂ÷Áֻ翷®°è(High Temperature Differential Scanning Calorimeter) |
Á¦ÀÛ»ç |
¢ß½ÅÄÚ¿¥¾ØÆ¼ |
¸ðµ¨¸í |
Labsys Evo DSC |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 480È£
|
|
Àåºñ¸í |
IET ¸ôµåÇ÷°½º ½Ã·á Á¦Á¶ ÀåÄ¡(High Frequency Induction Furnacer) |
Á¦ÀÛ»ç |
¿¤ÅØ |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 480È£
|
|
Àåºñ¸í |
½½·¡±×¿ëÇØ ¹× ³Ã°¢ÀåÄ¡(Slag Dissolution and Cooling System) |
Á¦ÀÛ»ç |
¸°Å×Å© |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 480È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
Lasertec Corporation |
¸ðµ¨¸í |
VL2000DX |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
¾ÐÃà ¹× ÀÎÀå½ÃÇè±â(Tensile Compress Test Machine) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
INSTRON 5848 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC)) |
Á¦ÀÛ»ç |
Mettler Toledo |
¸ðµ¨¸í |
TGA/DSC1 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
µµ°¡´Ï ºÎÇÏ ½Ã½ºÅÛ(1600 ¡ÆC Furnace Crucible Leading System) |
Á¦ÀÛ»ç |
Lenton |
¸ðµ¨¸í |
LTF-16/75/610 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
±Þ¼Ó°¡¿ÀåÄ¡(Infrared Gold Image Furnace) |
Á¦ÀÛ»ç |
ÅäÅ»¼Ö·ç¼Ç°úÇÐ |
¸ðµ¨¸í |
VHT-E44 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
¿ëÀ¶Á¡/Á¢Ã˰¢ ½Ã½ºÅÛ(Heating Microscope) |
Á¦ÀÛ»ç |
export system solutions s.r.i |
¸ðµ¨¸í |
misura hsm |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 572È£
|
|
Àåºñ¸í |
À̹ÌÁö½Ã½ºÅÛ(Imaging System) |
Á¦ÀÛ»ç |
Dantec Dynamics A/S |
¸ðµ¨¸í |
Advanced Imaging System |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 572È£
|
|
Àåºñ¸í |
°íÁÖÆÄ À¯µµ °¡¿ ¿ëÇØ·Î(High Frequency Induction Heater) |
Á¦ÀÛ»ç |
¿¤ÅØ |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 580È£
|
|
Àåºñ¸í |
¿ëÇØ¿ë À¯µµ°¡¿ ÀåÄ¡(Induction Heating System for Melting) |
Á¦ÀÛ»ç |
PSTEK |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 584È£
|
|
Àåºñ¸í |
Àç·á½ÃÇè±â(Universal Materials Testing Machine) |
Á¦ÀÛ»ç |
zwick gmbh & co. kg |
¸ðµ¨¸í |
ZWICK 100KN |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
ÇǷνÃÇè±â(Fatigue Testing Machine) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
MicroTester5848 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
¾ÐÃà ¹× ÀÎÀå½ÃÇè±â(Tensile Compress Test Machine) |
Á¦ÀÛ»ç |
INSTRON |
¸ðµ¨¸í |
INSTRON 4482 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
ÀÌ¼Ó ¾Ð¿¬Àåºñ(Differential Speed Rolling Machine) |
Á¦ÀÛ»ç |
¢ß¸ðÀνýº |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
°íÁÖÆÄ À¯µµ °¡¿ ¿ëÇØ·Î(Vacuum Induction Melting and Casting Furnace) |
Á¦ÀÛ»ç |
ALD Vacuum Technologies |
¸ðµ¨¸í |
VIM4 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
Áø°øºÐ±¤°è(Fourier Transform Infrared) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
VERTEX 80v with HYPERION 2000 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
¹úÁö/FLC ½ÃÇè±â(Bulge/Forming Limit Curves (FLC) Tester) |
Á¦ÀÛ»ç |
ERICHSEN |
¸ðµ¨¸í |
Model 161 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
¼ÒÇü ¾Ð¿¬½ÇÇè±â(Small Scale Calliber Rolling Machine) |
Á¦ÀÛ»ç |
ÇØÁø»ê¾÷±â¼ú |
¸ðµ¨¸í |
caliber rolling machine |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
ÀÌÃàÀÎÀå ½ÃÇè±â(Biaxial Tensile Testing machine) |
Á¦ÀÛ»ç |
Kokusai Co. Ltd |
¸ðµ¨¸í |
KBAT-100 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
½Ç½Ã°£ X-¼± °Ë»ç±â(Realtime X-ray Inspection System) |
Á¦ÀÛ»ç |
¢ßÀÚºñ½º |
¸ðµ¨¸í |
X-Scan 7950 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
º¥µù ±â°è(Bending Machine) |
Á¦ÀÛ»ç |
¢ß·ºÅͽ¼ |
¸ðµ¨¸í |
UTM-B10T |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
¿°£¾Ð¿¬±â(Pilot 4Hi-Hot Rolling Mill) |
Á¦ÀÛ»ç |
PTW sreel solution |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø ´ëÇü½ÇÇ赿
|
|
Àåºñ¸í |
°¡¼ÓÀ²¿·®°è(ARC (Accelerating Rate Calorimeter)) |
Á¦ÀÛ»ç |
Thermal Hazard Technology (THT) |
¸ðµ¨¸í |
ES-ARC_ ARCSYS-001, ARCSYS-SBK |
¼³Ä¡Àå¼Ò |
ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
|
|
Àåºñ¸í |
½ºÆÛÅ͸µ ½Ã½ºÅÛ(Sputtering System) |
Á¦ÀÛ»ç |
¾ÆÆå½º(ÁÖ) |
¸ðµ¨¸í |
EOS-310(Á¦ÀÛǰ) |
¼³Ä¡Àå¼Ò |
Æ÷Ç×°¡¼Ó±â¿¬±¸¼Ò ÀúÀ帵µ¿ 118È£
|
|
Àåºñ¸í |
RIE ½Ã½ºÅÛ(Reactive Ion Etching (RIE) System) |
Á¦ÀÛ»ç |
(ÁÖ)¿ïÅØ |
¸ðµ¨¸í |
URS-100 |
¼³Ä¡Àå¼Ò |
Æ÷Ç×°¡¼Ó±â¿¬±¸¼Ò ÀúÀ帵µ¿ 118È£
|
|
Àåºñ¸í |
3Â÷¿ø¼¼Æ÷ÇÁ¸°ÅÍ(3D Bioprinter) |
Á¦ÀÛ»ç |
T&R Biofab |
¸ðµ¨¸í |
DX-Printer |
¼³Ä¡Àå¼Ò |
Æ÷Ç×½ÃÁö½Ä»ê¾÷¼¾ÅÍ cGMP
|
|
Àåºñ¸í |
3Â÷¿ø¼¼Æ÷ÇÁ¸°ÅÍ(3D Bioprinter) |
Á¦ÀÛ»ç |
T&R Biofab |
¸ðµ¨¸í |
DX-Printer |
¼³Ä¡Àå¼Ò |
Æ÷Ç×½ÃÁö½Ä»ê¾÷¼¾ÅÍ cGMP
|
|
Àåºñ¸í |
3D ¹ÙÀÌ¿ÀÇÁ¸°ÅÍ(Extrusion-based 3D Bioprinter) |
Á¦ÀÛ»ç |
CELLINK |
¸ðµ¨¸í |
BIO X |
¼³Ä¡Àå¼Ò |
Æ÷Ç×½ÃÁö½Ä»ê¾÷¼¾ÅÍ wet-lab
|
|
Àåºñ¸í |
¼ÒÇü ¾ÆÀ½¼Ódzµ¿(Wind Tunnel) |
Á¦ÀÛ»ç |
Àε¥ÄÚ |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
dzµ¿µ¿ 105È£
|
|
Àåºñ¸í |
´ëÇüdzµ¿(Wind Tunnel) |
Á¦ÀÛ»ç |
¼¿øÇ³·Â |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
dzµ¿µ¿ 107È£
|
|
Àåºñ¸í |
ȸ·ù¼öÁ¶(Circulating Water Channel) |
Á¦ÀÛ»ç |
¼ÀϺ»À¯Ã¼±â¼ú¿¬±¸¼Ò |
¸ðµ¨¸í |
V2-30B |
¼³Ä¡Àå¼Ò |
dzµ¿µ¿ 107È£
|
|
Àåºñ¸í |
½ºÆÃ ¹ë·±½º(Sting Balance) |
Á¦ÀÛ»ç |
AEROLAB |
¸ðµ¨¸í |
1/2 A |
¼³Ä¡Àå¼Ò |
dzµ¿µ¿ 107È£
|
|
Àåºñ¸í |
Slit jet ³Ã°¢Çì´õ ¸ðÇü ¹× ºÎ°¡ÀåÄ¡(Slit Jet Cooling Header Model) |
Á¦ÀÛ»ç |
Å¿µ»ê¾÷ |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
dzµ¿µ¿ 107È£
|
|
Àåºñ¸í |
µµ¸³ Çö¹Ì°æ(Inverted Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
IX73 |
¼³Ä¡Àå¼Ò |
Çѱ¹·Îº¿À¶ÇÕ¿¬±¸¿ø 411È£
|
|
Àåºñ¸í |
°í¼º´É ¾×üũ·Î¸¶Åä±×·¡ÇÇ ¼±Çü À̿ Ʈ·¦ Áú·® ºÐ¼®±â(HPLC dual-cell linear ion trap mass spectrometer (HPLC-ESI-MS)) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
LTQ Velos Pro |
¼³Ä¡Àå¼Ò |
ÈÇаü 112È£
|
|
Àåºñ¸í |
´ÙÁß°ËÃâ À¯µµ°áÇÕÇöóÁ Áú·®ºÐ¼®±â(Multi-Collector Inductively Coupled Plasma Mass Spectrometer (MC-ICP-MS)) |
Á¦ÀÛ»ç |
Nu Instruments Ltd |
¸ðµ¨¸í |
Plasma 3 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 105È£
|
|
Àåºñ¸í |
À¯µµ °áÇÕ ÇöóÁ ºÐ±¤ºÐ¼®±â(Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES)) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
iCAP 7400 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 106È£
|
|
Àåºñ¸í |
Çü±¤ºÐ¼®±â(Luminometer) |
Á¦ÀÛ»ç |
Thermo Labsystems |
¸ðµ¨¸í |
Luminoskan Ascent |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 206-1È£
|
|
Àåºñ¸í |
¿°±â¼¿ºÐ¼®±â(Ion Personal Genome Machine) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
Ion Personal Genome Machine (PGM) System |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 206-1È£
|
|
Àåºñ¸í |
Áú¼Ò ¹× ´Ü¹éÁú ºÐ¼®ÀåÄ¡(Automatic Nitrogen and Protein Analyzer) |
Á¦ÀÛ»ç |
Foss |
¸ðµ¨¸í |
Kjeltec 2300 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 230È£
|
|
Àåºñ¸í |
°í¼º´É ¾×ü Å©·Î¸¶Åä±×·¡ÇÇ(High Performance Liquid Chromatograph (HPLC)) |
Á¦ÀÛ»ç |
Agilent Technologies |
¸ðµ¨¸í |
1260 Infinity |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 302È£
|
|
Àåºñ¸í |
±¤ ¿¡³ÊÁö Àüȯ·ü ÃøÁ¤±â(Incident Photon-to-electron Conversion Efficiency (IPCE) System) |
Á¦ÀÛ»ç |
NEWPORT |
¸ðµ¨¸í |
Newport 74125 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 302È£
|
|
Àåºñ¸í |
±âÆÇ ±â¹Ý ¹°Áú Á¦ÀÛ¿ë ¾Æ³ë´ÙÀÌÁî(Anodizer for AAO) |
Á¦ÀÛ»ç |
TERALEADER |
¸ðµ¨¸í |
TAD-001-2CH |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 302È£
|
|
Àåºñ¸í |
Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
Nicolet iS50 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 302È£
|
|
Àåºñ¸í |
¹«±âź¼ÒºÐ¼®±â(Total Inorganic Carbon Analyzer) |
Á¦ÀÛ»ç |
UIC INC. |
¸ðµ¨¸í |
CM5017 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 312È£
|
|
Àåºñ¸í |
Áß°£¹°Áú ÈÇÐÁ¾ ºÐ¼®±â(Reactive Intermediate Species Analyzer) |
Á¦ÀÛ»ç |
Global Fia |
¸ðµ¨¸í |
PC-25232/Flame-T/NEOFOX-KIT-PATCH |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 312È£
|
|
Àåºñ¸í |
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
SEC |
¸ðµ¨¸í |
SNE4500M |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 322È£
|
|
Àåºñ¸í |
¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC)) |
Á¦ÀÛ»ç |
TA Instruments |
¸ðµ¨¸í |
SDT Q600 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 322È£
|
|
Àåºñ¸í |
°í¼Ó ´Ü¹éÁú ¾×ü Å©·Î¸¶Åä±×·¡ÇÇ (FPLC)(Fast Protein Liquid Chromatography (FPLC)) |
Á¦ÀÛ»ç |
GE Healthcare |
¸ðµ¨¸í |
AKTA FPLC |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 331È£
|
|
Àåºñ¸í |
°í¼Ó ´Ü¹éÁú ¾×ü Å©·Î¸¶Åä±×·¡ÇÇ (FPLC)(Fast Protein Liquid Chromatography (FPLC)) |
Á¦ÀÛ»ç |
GE Healthcare |
¸ðµ¨¸í |
AKTApilot |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 331È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
FV3000 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 333È£
|
|
Àåºñ¸í |
¾Æ¹Ì³ë»ê Á¶¼ººÐ¼®±â(Auto Amino Acid Analyzer) |
Á¦ÀÛ»ç |
¾ÆÁÖ°úÇÐ |
¸ðµ¨¸í |
Automatic amino acid analyzer S433 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 334È£
|
|
Àåºñ¸í |
µµ¸³ Çü±¤ Çö¹Ì°æ(Inverted Fluorescence Microscope) |
Á¦ÀÛ»ç |
NIKON |
¸ðµ¨¸í |
Eclipse Ti2 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 403È£
|
|
Àåºñ¸í |
Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer) |
Á¦ÀÛ»ç |
PerkinElmer |
¸ðµ¨¸í |
Spectrum Two |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 403È£
|
|
Àåºñ¸í |
Ç¥¸é ¹°¼º ÃøÁ¤±â(Force Tensiometer) |
Á¦ÀÛ»ç |
Kruss |
¸ðµ¨¸í |
K100 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 403È£
|
|
Àåºñ¸í |
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
SEC |
¸ðµ¨¸í |
SNE4000M |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 410È£
|
|
Àåºñ¸í |
°í¼º´É ¾×ü Å©·Î¸¶Åä±×·¡ÇÇ(High Performance Liquid Chromatograph (HPLC)) |
Á¦ÀÛ»ç |
Waters |
¸ðµ¨¸í |
e2695 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 412È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
LSM 5 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 414È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6510 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 414È£
|
|
Àåºñ¸í |
Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
Nicolet 6700 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 417È£
|
|
Àåºñ¸í |
Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
Nicolet iS50 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 431È£
|
|
Àåºñ¸í |
Àû¿Ü¼± ºÐ±¤±â(Fourier-transform Infrared (FT-IR) Spectrometer) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
Nicolet iS20 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 431È£
|
|
Àåºñ¸í |
»ê¼ººñ ÀÚµ¿Ã¤Ãë±â(Automatic Acid Rain Sampler) |
Á¦ÀÛ»ç |
Eigenbrodt GmbH & Co. KG |
¸ðµ¨¸í |
NSA 181 / KE |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ ¿Á»ó
|