¼³ºñ¹øÈ£ |
10112062 |
Àåºñ¸í(ÇѱÛ) |
|
Àåºñ¸í(¿µ¹®) |
|
Á¦ÀÛ»ç |
SurForce LLC |
¸ðµ¨¸í |
SFA 2000 |
Àåºñ»ç¾ç |
The SFA 2000 combined with the FECO (Fringes of Equal Chromatic Order) multiple-beam interferometry technique measures forces (static- equilibrium or dynamic- non-equilibrium) between two surfaces in vapors or liquids with a sensitivity of a few nN and a distance resolution of 1 (0.1 nm). |
Ȱ¿ëºÐ¾ß |
Ç¥¸éÈû ÃøÁ¤±â (Surface Forces Apparatus, SFA)´Â ´Ù¾çÇÑ ¸ÅÁú ¼Ó¿¡¼ µÎ Ç¥¸é »çÀÌÀÇ Àý´ë °Å¸®¿Í Ç¥¸é°£ÀÇ °£¼··ÂÀ» Á÷Á¢ ÃøÁ¤ÇÏ¿© °è¸é¿¡¼ ÀϾ´Â ¹°¸®ÀûÀÎ Çö»óÀ» ºÐÀÚÀû ¼öÁØ¿¡¼ °üÂûÇÒ ¼ö ÀÖ´Â ÀåºñÀÌ´Ù. |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 230È£ |
¼Ò¼Ó |
ÈÇаøÇаú |
¼º¸í |
Â÷ÇüÁØ |
ÀüÈ |
054-279-2280 |
À̸ÞÀÏ |
hjcha@postech.ac.kr |
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Park Systems |
¸ðµ¨¸í |
XE7 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Park Systems |
¸ðµ¨¸í |
XE7 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
Dimension Icon with ScanAsyst |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
Ç¥¸é´ÜÂ÷ÃøÁ¤±â(Surface Profiler) |
Á¦ÀÛ»ç |
Veeco |
¸ðµ¨¸í |
Dektak 150 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
Veeco |
¸ðµ¨¸í |
Dimension 3100 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
3D Ç¥¸éÃøÁ¤ ½Ã½ºÅÛ(3D Optical Surface Metrology System) |
Á¦ÀÛ»ç |
Leica Microsystems |
¸ðµ¨¸í |
DCM 3D |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
Á¢ÃË½Ä Ç¥¸é ´ÜÂ÷ÃøÁ¤±â(Contact Surface Profiler) |
Á¦ÀÛ»ç |
KLA Tencor |
¸ðµ¨¸í |
D-600 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
Ç¥¸é´ÜÂ÷ÃøÁ¤±â(Alpha Step Surface Profiler) |
Á¦ÀÛ»ç |
KLA TENCOR CORP. |
¸ðµ¨¸í |
Alpha-step 500 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
´Ù¸ñÀû ¹Ú¸· Ç¥¸é±¸Á¶ ºÐ¼® ¿øÀÚ Çö¹Ì°æ Àåºñ(Muti-purpose Atomic Force Microscope (AFM) System) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
MultiMode 8 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
³ª³ë Ç¥¸é ÇÁ·ÎÆÄÀÏ·¯(Nano Surface Profiler) |
Á¦ÀÛ»ç |
³ª³ë½Ã½ºÅÛ¢ß |
¸ðµ¨¸í |
NanoScan-E1000(P) |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM)) |
Á¦ÀÛ»ç |
SEIKO INSTRUMENTS INC. |
¸ðµ¨¸í |
SPI3800N Pro |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
»ó¿Â¿È®»êµµÃøÁ¤Àåºñ(Flash Diffusivity Testing Apparatus) |
Á¦ÀÛ»ç |
ERICH NETZSCH GmbH & Co. Holdi |
¸ðµ¨¸í |
LFA 467 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA)) |
Á¦ÀÛ»ç |
SurForce LLC |
¸ðµ¨¸í |
SFA 2000 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
ºñÇ¥¸éÀû ºÐ¼®±â(Automated Surface Area&Pore Size Analyzer) |
Á¦ÀÛ»ç |
Chunwoo America, Inc |
¸ðµ¨¸í |
NOVA 1000e |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
³ª³ë¼¼°ø Ư¼º ¹× BET Ç¥¸éÀû ÃøÁ¤Àåºñ(Nanoporosity & Surface Area Analyzer) |
Á¦ÀÛ»ç |
(ÁÖ)¹Ì·¡¿¡½º¾ÆÀÌ |
¸ðµ¨¸í |
nanoPOROSITY (BET) |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
Ç¥¸é ¹°¼º ÃøÁ¤±â(Force Tensiometer) |
Á¦ÀÛ»ç |
Kruss |
¸ðµ¨¸í |
K100 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
ºñÇ¥¸éÀû ºÐ¼®±â(Surface Area Analyzer) |
Á¦ÀÛ»ç |
micromeritics |
¸ðµ¨¸í |
ASAP 2010 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¿ÀÇ¿©ºÎ |
X |
ÀÚÀ²»ç¿ë¿©ºÎ |
X |
»ç¿ë·á |
- |
Ãëµæ±Ý¾× |
\ 140,096,064 |
ÃëµæÀÏ |
2013-11-08 |
÷ºÎÆÄÀÏ |
|
URL |
https://surforcellc.com/sfa-2000-surface-forces-apparatus/ |
| SFA, Ç¥¸éÈûÃøÁ¤±â | |