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Equipment Information
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Equip. Info.
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Reservation
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10112843
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Micro Universal Testing Machine (UTM)
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R&B
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RB 302 ML
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Force Capacity: Up to 5kN
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UTM
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RIST3µ¿ 3188È£
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¸¶ÀÌÅ©·ÎÇ÷¹ÀÌÆ® ¸®´õ(Microplate Reader Infinite M200 NanoQuan)
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Tecan
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NanoQuant infinite M200 Pro
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281È£
Àåºñ¸í
¿¬±¸¿ë »ï¾È Çö¹Ì°æ(Reseach Trinocular Microscope)
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OLYMPUS
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BX43
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383È£
Àåºñ¸í
ȸÀü½Ä ¸¶ÀÌÅ©·ÎÅè(ROTARY MICROTOME)
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LEICA
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Leica CM 1850
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BOIC [3207È£]
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´Ù±â´É ¸¶ÀÌÅ©·ÎÇ÷¹ÀÌÆ® ¸®´õ(Microplate Reader)
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Molecular Device
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Microplate Reader/SpectraMax iD3 +SpectraDrop
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C5
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Áøµ¿ÀýÆí±â(Vibrating blade microtome)
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Leica
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VT1200S
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C5
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Park Systems
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XE7
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C5 228È£
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µµ¸³ Çö¹Ì°æ(Inverted Microscope)
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MCL
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MCL-NSOM
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C5 228È£
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ÇöóÁ ó¸® ½Ã½ºÅÛ(Plasma Treatment Machine)
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Nordson
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AP-300 Plasma System
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C5 720-1È£
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¿öÅÍÁ¬ Àý»è±â(Abrasive Water Jet Cutter Machine)
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OMAX
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MAXIEM 1530
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C5 MAKER SPACE 3(ÁöÇÏ)
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±¤½ÃÆ® Çü±¤Çö¹Ì°æ(Æò¸é·¹ÀÌÀú Çö¹Ì°æ) (Light sheet fluorescence microscopy )
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Carl Zeiss
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Light Sheet 7
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C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ (Confocal Laser Scanning Microscope )
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Carl Zeiss
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LSM 900 with Airyscan 2
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C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
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¹Ð¸µ ½Ã½ºÅÛ(Milling Machine)
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HWACHEON
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KANDAN-2
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RIST1µ¿ 1009È£
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Park Systems
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XE7
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RIST1µ¿ 1139È£
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Bruker
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Dimension Icon with ScanAsyst
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RIST1µ¿ 1152È£
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X-¼± ±¤ÀüÀÚ ºÐ±¤±â(X-ray Photoelectron Spectrometer (XPS) Microprobe)
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Thermo Scientific
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ESCALAB 250
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RIST1µ¿ 1153È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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Carl Zeiss
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GeminiSEM 500
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RIST1µ¿ 1153È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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Carl Zeiss
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AURIGA
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RIST1µ¿ 1163È£
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¼öÂ÷º¸Á¤ ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs-Corrected Scanning Transmission Electron Microscope (Cs-STEM))
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JEOL
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JEM-ARM200F
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RIST1µ¿ 1176È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-6480LV
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RIST1µ¿ 1187È£
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Àü°è¹æÃâ Çö¹Ì°æ(Field Emission Electron Microscope)
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JEOL
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JEM-2100F
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RIST1µ¿ 1188È£
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Rockwell °æµµ±â(Rockwell Hardness Testing Machine)
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Akashi
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Wizhard
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RIST1µ¿ 1188È£
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Vickers °æµµ±â(Vickers Hardness Testing Machine)
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Mitutoyo
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HV-114
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RIST1µ¿ 1188È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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HITACHI
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S-3400N
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RIST1µ¿ 1190È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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JEOL
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JSM-7600F
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RIST1µ¿ 1192È£
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ÀüÀÚ¼± ¹Ì¼ÒºÎ ºÐ¼®±â(Electron Probe Microanalyzer (EPMA))
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SHIMADZU
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EPMA-1600
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RIST1µ¿ 1194È£
Àåºñ¸í
¸¶ÀÌÅ©·ÎÆÄ ½Ã·á ºÐÇØ ½Ã½ºÅÛ(Advanced Microwave Digestion System)
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Milestone
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ETHOS 1
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RIST1µ¿ 1334È£
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Ź»óÇü Àý´Ü±â(Tabletop Cut-off Machine)
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Struers
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Discotom-100
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RIST2µ¿ 2177È£
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Àüµ¿ µðÁöÅÐ Çö¹Ì°æ(Opto-digital Motorizing Microscope)
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OLYMPUS
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DSX100
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RIST2µ¿ 2179È£
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°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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OLYMPUS
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OLS3000
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RIST2µ¿ 2179È£
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ÇǷνÃÇè±â(Fatigue Testing Machine)
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MTS
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MTS Landmark Servohydraulic Test System
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RIST2µ¿ 2180È£
Àåºñ¸í
ÇǷνÃÇè±â(Fatigue Testing Machine)
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MTS
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MTS Landmark Servohydraulic Test System
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RIST2µ¿ 2187È£
Àåºñ¸í
ÇǷνÃÇè±â(Fatigue Testing Machine)
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MTS
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MTS Landmark Servohydraulic Test System
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RIST2µ¿ 2195È£
Àåºñ¸í
¸¶ÀÌÅ©·ÎÇ÷¹ÀÌÆ® ¸®´õ(Multimode Microplate Reader)
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TECAN
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SPARK 10M
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RIST3µ¿ 3153È£
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¹ü¿ë ÇÁ·Îºê ½Ã½ºÅÛ(Universal Measurement Probe System)
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TERALEADER
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UMP100
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RIST3µ¿ 3170È£
Àåºñ¸í
ÁÖ»ç Åõ°ú ÀüÀÚÇö¹Ì°æ(Scanning Transmission Electron Microscope (STEM))
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COXEM
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CX-200
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RIST3µ¿ 3188È£
Àåºñ¸í
Àú¿Â ÃÊ¹ÚÆí¹Ì¼¼Àý´Ü±â(Cryoultramicrotome)
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Leica Microsystems
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MZ6
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RIST3µ¿ 3226È£
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Æí±¤ Çö¹Ì°æ(Polarized Stereo Microscope)
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Leica Microsystems
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Z16 APO
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°¡¼Ó±â ÀúÀ帵µ¿ 106È£
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µµ¸³ Çü±¤ Çö¹Ì°æ(Fluorescence Inverted Microscope)
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Carl Zeiss
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Axio Observer A1
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°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
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³Ãµ¿Á¶Á÷ ÀýÆí±â(Cryocut Microtome)
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Leica Biosystems
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CM1850UV
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°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
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Çü±¤ Çö¹Ì°æ(Fluorescence Microscope)
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Á¦ÀÌ¿ø
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Axio Zoom.V16
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°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
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°í¼Ó ±¤ÇØ»óµµ ¹× À½ÆÄÇØ»óµµ ±¤ÃÊÀ½ÆÄ Çö¹Ì°æ(High speed Photoacoustic Microscopy )
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¿ÉƼÄÚ
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Opticho M¡¡
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°¡Å縯´ëÀÇ»ý¸í°øÇבּ¸¼Ò
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¹ü¿ë ¹Ð¸µ ¸Ó½Å´×¼¾ÅÍ(Universal Milling Machining Center)
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±âÈï±â°è
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KMB-U5
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±â°è°øÀÛµ¿ 100È£
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±Ý¼Ó ºÐ¸» 3Â÷¿ø Á¶Çü Àåºñ(Metal Additive Manufacturing Machine)
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Concept Laser GmbH
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M2 cusing SL400W
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±â°è°øÀÛµ¿ 202È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(S.E.M(SCANNING ELECTRON MICROSCOPE))
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JEOL LTD
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JSM-6390LV
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±â°è½ÇÇ赿 106È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-7401F
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³ª³ëÀ¶ÇÕ±â¼ú¿ø 103È£
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Veeco
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Dimension 3100
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³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 101È£
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ÃʰíÁø°øÀú¿Â ÁÖ»çÅͳθµÇö¹Ì°æ(Ultra High Vacuum Low Temperature Scanning Tunneling Microscopy (STM))
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Unisoku
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USM 1200
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³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 101È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JEM-2100F(with STEM Cs corrector)
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³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM ½Ç
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±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope (Cs-corrected HR-STEM))
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JEOL
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JEM-2200FS
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³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM-2200FS½Ç
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Àý´Ü¿¬¸¶±â(Polishing Machine)
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Allied
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Multiprep
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³ª³ëÀ¶ÇÕ±â¼ú¿ø ½ÃÆíÁغñ½Ç 312È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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LEO Elektronrnmikroskopie GmbH
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FE-SEM
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³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
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Á֯ļöÃøÁ¤±â(Universal Probe Holder)
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MBRAUN
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MB6000
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³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
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ÀÓ°èÄ¡¼ö ÃøÁ¤ ÁÖ»çÀüÀÚÇö¹Ì°æ(Critical Dimension Scanning Electron Microscope (CD-SEM))
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HITACHI
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S-9380
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³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
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Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
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JEOL
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JEM-1011
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»ý¸í°øÇבּ¸¼¾ÅÍ 156È£
Àåºñ¸í
µµ¸³ Çö¹Ì°æ(Inverted Microscope)
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OLYMPUS
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IX81
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»ý¸í°øÇבּ¸¼¾ÅÍ 328È£
Àåºñ¸í
·¹ÀÌÀú ¹Ì¼¼ ÇØºÎ ½Ã½ºÅÛ(Laser Microdissection Microscope System)
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Carl Zeiss
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PALM MicroBeam
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»ý¸í°øÇבּ¸¼¾ÅÍ 341È£
Àåºñ¸í
Ź»óÇü ¸¶ÀÌÅ©·Î¾î·¹ÀÌ ½Ã½ºÅÛ(Benchtop Microarray System)
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GENETIX
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QArray mini
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»ý¸í°øÇבּ¸¼¾ÅÍ 458È£
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[±Û·ÎÄÃ] 3D·¹Áø ÇÁ¸°ÅÍ +¼¼Ã´±â ¼¼Æ®([Glocal] 3D Resin Printer + Washing Machine Set)
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¿¡ÀÌÆå½º¾²¸®µð(APEX3D)
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Form 4L Complete Package
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ÀΰøÁö´É¿¬±¸¿ø 142È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
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JEM-2100 (HR)
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Á¦1°øÇаü 105È£
Àåºñ¸í
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope(Cs-corrected HR-STEM))
Á¦ÀÛ»ç
JEOL
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JEM-2200FS (UHR)
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Á¦1°øÇаü 109È£
Àåºñ¸í
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
Á¦ÀÛ»ç
HITACHI
¸ðµ¨¸í
7600H
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 111È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
HITACHI
¸ðµ¨¸í
S-3400N
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 111È£
Àåºñ¸í
ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM))
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Veeco
¸ðµ¨¸í
Dimension 3100
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Á¦1°øÇаü 208È£
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚ Çö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
Á¦ÀÛ»ç
PHILIPS ELECTRON OPTICS B.V.
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XL30S FEG
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Á¦1°øÇаü 306-1È£
Àåºñ¸í
µµ¸³ Çö¹Ì°æ(Inverted Microscope)
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OLYMPUS
¸ðµ¨¸í
IX71
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Á¦2°øÇаü 033È£
Àåºñ¸í
Çö¹Ì°æ Stage ¹× Á¶Àý ½Ã½ºÅÛ(Microscope Stage and Controller System)
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Applied Scientific Instrumentation (ASI)
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MS-2000
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Á¦3°øÇаü 006È£
Àåºñ¸í
¹ü¿ë ¹Ð¸µ ¸Ó½Å´×¼¾ÅÍ(Universal Milling Machining Center)
Á¦ÀÛ»ç
±âÈï±â°è
¸ðµ¨¸í
KMB-U3
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Á¦3°øÇаü 007È£
Àåºñ¸í
´Ù¸ñÀû ¹Ú¸· Ç¥¸é±¸Á¶ ºÐ¼® ¿øÀÚ Çö¹Ì°æ Àåºñ(Muti-purpose Atomic Force Microscope (AFM) System)
Á¦ÀÛ»ç
Bruker
¸ðµ¨¸í
MultiMode 8
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Á¦3°øÇаü 529È£
Àåºñ¸í
¼ºÇü»çÃâ±â(Injection Machine)
Á¦ÀÛ»ç
Battenfeld Kunststoffmaschinen
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Microsystem 50
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Á¦5°øÇаü 006È£
Àåºñ¸í
¼ºÇü»çÃâ±â(Injection Machine)
Á¦ÀÛ»ç
SUMITOMO HEAVY INDUSTRIES, LTD
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SE50D
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Á¦5°øÇаü 006È£
Àåºñ¸í
³ª³ë½Ã½º SPM Á¶Àý ½Ã½ºÅÛ(Nanonis Scanning Probe Microscopy (SPM) Control System)
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SPECS
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SPECS Nanonis Controller
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Á¦5°øÇаü 008È£
Àåºñ¸í
µµ¸³ Çö¹Ì°æ(Inverted Microscope)
Á¦ÀÛ»ç
OLYMPUS
¸ðµ¨¸í
CKX41
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Á¦5°øÇаü 204È£
Àåºñ¸í
Àç·á½ÃÇè±â(Nano Testing System)
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MTS
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Nano UTM Testing System
¼³Ä¡Àå¼Ò
Á¦5°øÇаü 206-1È£
Àåºñ¸í
¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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SEIKO INSTRUMENTS INC.
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SPI3800N Pro
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Á¦5°øÇаü 206-1È£
Àåºñ¸í
»ó¿Â¿­È®»êµµÃøÁ¤Àåºñ(Flash Diffusivity Testing Apparatus)
Á¦ÀÛ»ç
ERICH NETZSCH GmbH & Co. Holdi
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LFA 467
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Á¦5°øÇаü 304È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
Bio-logic SAS
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M470
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Áö°î¿¬±¸µ¿ 228È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
JEOL
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JSM-6010LV
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Áö°î¿¬±¸µ¿ 232È£
Àåºñ¸í
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System)
Á¦ÀÛ»ç
Dynamic Systems
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GLEEBLE 3500
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ö°­´ëÇпø 142-4È£
Àåºñ¸í
Á¤¸³Çö¹Ì°æ(Upright Microscope)
Á¦ÀÛ»ç
Leica Microsystems
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DM4000 M
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 144-5È£
Àåºñ¸í
´ëÇüÀý´Ü±â(Large Automatic Cut-off Machine)
Á¦ÀÛ»ç
Struers
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Axitom-5
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 146-8È£
Àåºñ¸í
¿¬¸¶±â(Grinding/Polishing Machine)
Á¦ÀÛ»ç
Struers
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Abrapol-20
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 146-8È£
Àåºñ¸í
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
Á¦ÀÛ»ç
Carl Zeiss
¸ðµ¨¸í
Ultra-55
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ö°­´ëÇпø 154-6È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JSM-7100F
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 154-6È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
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JEM-2100F
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ö°­´ëÇпø 161È£
Àåºñ¸í
¸ÖƼ ½ºÄÉÀÏ ¹Ì¼¼±¸Á¶ ºÐ¼® ½Ã½ºÅÛ(Multi-scale Microstructure Analysis System)
Á¦ÀÛ»ç
JEOL
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Neo-ARM
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 161È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
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JXA-8530F
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 163È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
Á¦ÀÛ»ç
JEOL
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JEM-7900F
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 163È£
Àåºñ¸í
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System)
Á¦ÀÛ»ç
Dynamic Systems
¸ðµ¨¸í
GLEEBLE 3500
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 242-4È£
Àåºñ¸í
Áø°øÁÖÁ¶±â(Vacuum Casting Machine)
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¢ßÄÉÀÌ¿¡ÀÌ¿¥¾ÆÀÌ
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MC100V
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ö°­´ëÇпø 272È£
Àåºñ¸í
Áø°ø-°¡¾Ð ¿ëÇØ ¹× ¿¬¼ÓÁÖÁ¶ÀåÄ¡(Vacuum-over Pressure Continuous Casting Machine)
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¢ßÄÉÀÌ¿¡ÀÌ¿¥¾ÆÀÌ
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VCC 1000 (indutherm)
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ö°­´ëÇпø 272È£
Àåºñ¸í
°í¿ÂÀÎÀå½ÃÇè±â(High Temp Universel Testing Instrument)
Á¦ÀÛ»ç
INSTRON
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M5582
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ö°­´ëÇпø 284È£
Àåºñ¸í
TEM¿ë À̿¹иµ½Ã½ºÅÛ(Ion Milling System for Transmission Electron Microscope (TEM))
Á¦ÀÛ»ç
¢ßÁö¿¤ÄÚÆÛ·¹À̼Ç
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Gatan model 691
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 284È£
Àåºñ¸í
¹ü¿ë ½ÃÇè±â(Universal Sheet Metal Testing Machine)
Á¦ÀÛ»ç
ERICHSEN
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145-60
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ö°­´ëÇпø 331-3È£
Àåºñ¸í
±¤ ÀÚ±â Ä¿ Çö¹Ì°æ(Magneto-Optical Kerr-Microscope)
Á¦ÀÛ»ç
Evico magnetics GmbH
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Axio Imager D1m
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 374È£
Àåºñ¸í
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System)
Á¦ÀÛ»ç
INSTRON
¸ðµ¨¸í
INSTRON 8801
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 416-8È£
Àåºñ¸í
ÇǷνÃÇè±â(Fatigue Testing Machine)
Á¦ÀÛ»ç
INSTRON
¸ðµ¨¸í
INSTRON 8801
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 416-8È£
Àåºñ¸í
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System)
Á¦ÀÛ»ç
INSTRON
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INSTRON 8801
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 416È£
Àåºñ¸í
µ¿Àû ±â°èÀû¹°¼º ½ÃÇè±â(Dynamic Material Testing System)
Á¦ÀÛ»ç
INSTRON
¸ðµ¨¸í
INSTRON 8501
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 431-3È£
Àåºñ¸í
Àç·á½ÃÇè±â(Material Testing Machine)
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INSTRON
¸ðµ¨¸í
INSTRON 8862
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ö°­´ëÇпø 431-3È£
Àåºñ¸í
¹ü¿ë Àç·á ½ÃÇè±â(Universal Testing System)
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INSTRON
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INSTRON 3382
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ö°­´ëÇпø 431-3È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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Lasertec Corporation
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VL2000DX
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ö°­´ëÇпø 546È£
Àåºñ¸í
¾ÐÃà ¹× ÀÎÀå½ÃÇè±â(Tensile Compress Test Machine)
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INSTRON
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INSTRON 5848
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ö°­´ëÇпø 546È£
Àåºñ¸í
¿ëÀ¶Á¡/Á¢Ã˰¢ ½Ã½ºÅÛ(Heating Microscope)
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export system solutions s.r.i
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misura hsm
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ö°­´ëÇпø 572È£
Àåºñ¸í
Àç·á½ÃÇè±â(Universal Materials Testing Machine)
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zwick gmbh & co. kg
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ZWICK 100KN
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
ÇǷνÃÇè±â(Fatigue Testing Machine)
Á¦ÀÛ»ç
INSTRON
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MicroTester5848
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
¾ÐÃà ¹× ÀÎÀå½ÃÇè±â(Tensile Compress Test Machine)
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INSTRON
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INSTRON 4482
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
ÀÌ¼Ó ¾Ð¿¬Àåºñ(Differential Speed Rolling Machine)
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¢ß¸ðÀνýº
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Ư¼öÁ¦ÀÛ
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
¼ÒÇü ¾Ð¿¬½ÇÇè±â(Small Scale Calliber Rolling Machine)
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ÇØÁø»ê¾÷±â¼ú
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caliber rolling machine
¼³Ä¡Àå¼Ò
ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
ÀÌÃàÀÎÀå ½ÃÇè±â(Biaxial Tensile Testing machine)
Á¦ÀÛ»ç
Kokusai Co. Ltd
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KBAT-100
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
º¥µù ±â°è(Bending Machine)
Á¦ÀÛ»ç
¢ß·ºÅͽ¼
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UTM-B10T
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ö°­´ëÇпø ´ëÇü½ÇÇ赿
Àåºñ¸í
µî¿Â¹Ì¼¼¿­·®°è(IMC (Isothermal Microcalorimetry))
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TA Instruments Korea Unit of waters korea, Ltd
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TAM IV XL
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ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
Àåºñ¸í
³Ãµ¿ÀýÆí±â(Cryostat Microtome)
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Leica
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CM3050S
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Æ÷Ç×½ÃÁö½Ä»ê¾÷¼¾ÅÍ wet-lab
Àåºñ¸í
¸¶ÀÌÅ©·Î¹°¼º½ÃÇè±â(Micro-scale mechanical test system)
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CellScale
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MicrotesterG2
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Æ÷Ç×½ÃÁö½Ä»ê¾÷¼¾ÅÍ wet-lab
Àåºñ¸í
µµ¸³ Çö¹Ì°æ(Inverted Microscope)
Á¦ÀÛ»ç
OLYMPUS
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IX73
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Çѱ¹·Îº¿À¶ÇÕ¿¬±¸¿ø 411È£
Àåºñ¸í
Çü±¤ Çö¹Ì°æ(Fluorescence Microscope)
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Carl Zeiss
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Axiolab
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ȯ°æ°øÇе¿ 206-1È£
Àåºñ¸í
¿°±â¼­¿­ºÐ¼®±â(Ion Personal Genome Machine)
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Thermo Scientific
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Ion Personal Genome Machine (PGM) System
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ȯ°æ°øÇе¿ 206-1È£
Àåºñ¸í
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM))
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SEC
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SNE4500M
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ȯ°æ°øÇе¿ 322È£
Àåºñ¸í
¸¶ÀÌÅ©·ÎÇ÷¹ÀÌÆ® ¸®´õ(Multi-detection Microplate Reader)
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Hidex Oy
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Hidex Sense
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ȯ°æ°øÇе¿ 327È£
Àåºñ¸í
Çü±¤ ±Ý¼Ó Çö¹Ì°æ(Fluorescence Metallurgical Microscope)
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OLYMPUS
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BX60
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ȯ°æ°øÇе¿ 333È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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OLYMPUS
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FV3000
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ȯ°æ°øÇе¿ 333È£
Àåºñ¸í
µµ¸³ Çü±¤ Çö¹Ì°æ(Inverted Fluorescence Microscope)
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NIKON
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Eclipse Ti2
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ȯ°æ°øÇе¿ 403È£
Àåºñ¸í
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
SEC
¸ðµ¨¸í
SNE4000M
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 410È£
Àåºñ¸í
¸¶ÀÌÅ©·ÎÀú¿ï(Microbalance)
Á¦ÀÛ»ç
RUBOTHERM
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DynTHERM LP ST
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ȯ°æ°øÇе¿ 412È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
Á¦ÀÛ»ç
Carl Zeiss
¸ðµ¨¸í
LSM 5
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 414È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JSM-6510
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 414È£
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