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½ÃÂ÷¿ºÐ¼®/½ÃÂ÷Áֻ翷®ºÐ¼®±â(Differential Thermal Analysis (DTA)/Differential Scanning Calorimeter (DSC))
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Equipment Information
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Differential Thermal Analysis (DTA)/Differential Scanning Calorimeter (DSC)
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SETARAM Instrumentation
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Labsys DTA/DSC
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SETARAM Instrumentation Labsys DTA/DSC
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DTA/DSC ºÐ¼®
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(GLOCAL)°ø°£ Àü»çü Žħ À̵¿ ÀåÄ¡(in situ probe transfer for Spantial transcriptome analysis )
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10xGENOMICS
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Visium CytAssist
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BOIC [3311È£]
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(GLOCAL)´ÜÀϼ¼Æ÷ À̹Ì¡ °ø°£ ºÐ¼® ½Ã½ºÅÛ(Ultra high-multiplexed single cell spatial analysis system)
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Akoya Biosciences
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Phenocycler-Fusion 2.0
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BOIC [4308È£]
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Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Thermal Evaporating System)
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DD-GT103R
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C5 329È£
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°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ (Confocal Laser Scanning Microscope )
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Carl Zeiss
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LSM 900 with Airyscan 2
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C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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Carl Zeiss
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GeminiSEM 500
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RIST1µ¿ 1153È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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Carl Zeiss
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AURIGA
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RIST1µ¿ 1163È£
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ÁÖ»çÇü ¿ÀÁ¦ ÀüÀÚÇö¹Ì°æ(Scanning Auger Electron Spectroscopy (AES) Nanoprobe)
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ULVAC-PHI
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PHI 700
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RIST1µ¿ 1163È£
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¼öÂ÷º¸Á¤ ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs-Corrected Scanning Transmission Electron Microscope (Cs-STEM))
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JEOL
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JEM-ARM200F
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RIST1µ¿ 1176È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-6480LV
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RIST1µ¿ 1187È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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HITACHI
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S-3400N
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RIST1µ¿ 1190È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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JEOL
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JSM-7600F
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RIST1µ¿ 1192È£
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¿·®ÃøÁ¤±â(Automatic Isoperibol Calorimeter)
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Parr Instrument Company
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6400 Calorimeter
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RIST1µ¿ 1316È£
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¿Å»Âø ÃøÁ¤ ½Ã½ºÅÛ(Thermal Desorption System)
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Markes International
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UNITY2
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RIST1µ¿ 1317È£
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°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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OLYMPUS
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OLS3000
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RIST2µ¿ 2179È£
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¿ ÈÇÐ ±â»ó ÁõÂø ÀåÄ¡(Thermal Chemical Vapor Deposition (CVD) System)
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SNTEK
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TCS5000
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RIST3µ¿ 3104È£
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Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Thermal Evaporating System)
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TERALEADER
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TLP1001
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RIST3µ¿ 3139È£
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3D º¯ÇüÃøÁ¤½Ã½ºÅÛ(3D Deformation Analysis System)
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GOM international AG
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ARAMIS 12M
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RIST3µ¿ 3188È£
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ÁÖ»ç Åõ°ú ÀüÀÚÇö¹Ì°æ(Scanning Transmission Electron Microscope (STEM))
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COXEM
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CX-200
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RIST3µ¿ 3188È£
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¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
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TA Instruments
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SDT Q600
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RIST3µ¿ 3278È£
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½ÃÂ÷ ÁÖ»ç ¿·®ÃøÁ¤±â(Differential Scanning Calorimeter (DSC))
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PerkinElmer
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DSC 4000
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RIST3µ¿ 3312È£
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Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Vacuum Thermal Evaporating System)
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WOOSUNG HI-VAC
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RIST3µ¿ 3363È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(S.E.M(SCANNING ELECTRON MICROSCOPE))
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JEOL LTD
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JSM-6390LV
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-7401F
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ÃʰíÁø°øÀú¿Â ÁÖ»çÅͳθµÇö¹Ì°æ(Ultra High Vacuum Low Temperature Scanning Tunneling Microscopy (STM))
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Unisoku
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USM 1200
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Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Thermal Evaporating System)
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DDONG High Technologies
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Thermal Evaporator System
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JEM-2100F(with STEM Cs corrector)
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±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope (Cs-corrected HR-STEM))
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JEOL
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JEM-2200FS
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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LEO Elektronrnmikroskopie GmbH
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FE-SEM
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À¯±â¹° ÁõÂø±â(Organic Molecular Beam Deposition (OMBD) & Thermal Evaporator)
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alpha-plus
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OMBD & Thermal
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ÀÓ°èÄ¡¼ö ÃøÁ¤ ÁÖ»çÀüÀÚÇö¹Ì°æ(Critical Dimension Scanning Electron Microscope (CD-SEM))
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HITACHI
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S-9380
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±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope(Cs-corrected HR-STEM))
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JEOL
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JEM-2200FS (UHR)
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Á¦1°øÇаü 109È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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HITACHI
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S-3400N
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Á¦1°øÇаü 111È£
Àåºñ¸í
½ÃÂ÷ ÁÖ»ç ¿·®ÃøÁ¤±â(Differential Scanning Calorimeter (DSC))
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SETARAM Instrumentation
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Labsys Evo
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Á¦1°øÇаü 112È£
Àåºñ¸í
ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM))
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Veeco
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Dimension 3100
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Á¦1°øÇаü 208È£
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Áø°ø ¿ÁõÂø ½Ã½ºÅÛ(Thermal Evaporating System)
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GD-Tech
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KVT-2008L
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Á¦1°øÇаü 210È£
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚ Çö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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PHILIPS ELECTRON OPTICS B.V.
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XL30S FEG
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Á¦1°øÇаü 306-1È£
Àåºñ¸í
³ª³ë½Ã½º SPM Á¶Àý ½Ã½ºÅÛ(Nanonis Scanning Probe Microscopy (SPM) Control System)
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SPECS
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SPECS Nanonis Controller
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Á¦5°øÇаü 008È£
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¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
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Mettler Toledo
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Mettler Toledo AG
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Á¦5°øÇаü 206È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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Bio-logic SAS
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M470
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Áö°î¿¬±¸µ¿ 228È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-6010LV
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Áö°î¿¬±¸µ¿ 232È£
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¸ÖƼ ½ºÄÉÀÏ ¹Ì¼¼±¸Á¶ ºÐ¼® ½Ã½ºÅÛ(Multi-scale Microstructure Analysis System)
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JEOL
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Neo-ARM
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ö°´ëÇпø 161È£
Àåºñ¸í
¿Áß·®/¿·® µ¿½Ã ºÐ¼®±â(Thermal Analyzer System)
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netzsch geraetebau gmbh
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STA 449C
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ö°´ëÇпø 178-9È£
Àåºñ¸í
¼ö¼Ò·® ºÐ¼® ½Ã½ºÅÛ(Total Dissolved Solids (TDS) System for Hydrogen Analysis)
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R-Dec
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HTDS-003
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ö°´ëÇпø 435-7È£
Àåºñ¸í
3D Àç·á ºÐ¼®(3D Materials Analysis)
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UES, INC
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Robo-Met. 3D Version 2
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ö°´ëÇпø 480È£
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°í¿Â½ÃÂ÷Áֻ翷®°è(High Temperature Differential Scanning Calorimeter)
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¢ß½ÅÄÚ¿¥¾ØÆ¼
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Labsys Evo DSC
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ö°´ëÇпø 480È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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Lasertec Corporation
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VL2000DX
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ö°´ëÇпø 546È£
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¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
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Mettler Toledo
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TGA/DSC1
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ö°´ëÇпø 546È£
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ÀÌ¼Ó ¾Ð¿¬Àåºñ(Differential Speed Rolling Machine)
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µî¿Â¹Ì¼¼¿·®°è(IMC (Isothermal Microcalorimetry))
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TA Instruments Korea Unit of waters korea, Ltd
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TAM IV XL
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ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
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°¡¼ÓÀ²¿·®°è(ARC (Accelerating Rate Calorimeter))
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Thermal Hazard Technology (THT)
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ES-ARC_ ARCSYS-001, ARCSYS-SBK
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ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
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Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM))
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SEC
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SNE4500M
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¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
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TA Instruments
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SDT Q600
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°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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OLYMPUS
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FV3000
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Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM))
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SEC
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SNE4000M
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ȯ°æ°øÇе¿ 410È£
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°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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Carl Zeiss
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LSM 5
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-6510
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About Retina
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Republic of Korea (37673)
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