XS
SM
MD
LG
Equipment Information
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ (Confocal Laser Scanning Microscope )
ÀåºñÁ¤º¸
Equip. Info.
¿¹¾à ¹× ÀÇ·Ú
Reservation
¡á Àåºñ°øÁö : Àåºñ ÀÌ¿ë ¾È³»¹®
±âº»Á¤º¸
¼³ºñ¹øÈ£
10169630
Àåºñ¸í(ÇѱÛ)
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ
Àåºñ¸í(¿µ¹®)
Confocal Laser Scanning Microscope
Á¦ÀÛ»ç
Carl Zeiss
¸ðµ¨¸í
LSM 900 with Airyscan 2
»ó¼¼Á¤º¸
Àåºñ»ç¾ç
• Laser : Diode laser 405nm
 Diode laser 488nm
 Diode laser 561nm
 Diode laser 640nm
• Scanning Zoom: 0.5x to 40x
• Scanning Field: 12.7 mm x 12.7 mm
• Scanning Resolution: 32 ¡¿ 1 to 6,144 ¡¿ 6,144 pixels
Ȱ¿ëºÐ¾ß
Àåºñ¿î¿µÀηÂ
¼³Ä¡Àå¼Ò
C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
¼Ò¼Ó
À¶ÇÕ´ëÇпø
¼º¸í
¹èÈñ¼÷
ÀüÈ­
054-279-8425
À̸ÞÀÏ
qogmltnr9729@postech.ac.kr
µ¿ÀÏ/À¯»çÀåºñÁ¤º¸
Àåºñ¸í
·¹ÀÌÀú ½Ã½ºÅÛ(Tunable Laser System)
Á¦ÀÛ»ç
Amplitude
¸ðµ¨¸í
Surelite OPO
¼³Ä¡Àå¼Ò
C5 228È£
Àåºñ¸í
ÆÞ½º ·¹ÀÌÀú ÁõÂø ½Ã½ºÅÛ(Pulsed Laser Deposition (PLD) System)
Á¦ÀÛ»ç
ÇѺû·¹ÀÌÀú
¸ðµ¨¸í
GPPA-A377
¼³Ä¡Àå¼Ò
C5 329È£
Àåºñ¸í
·¹ÀÌÀú ¿ëÁ¢ ½Ã½ºÅÛ(Laser Mould Welder)
Á¦ÀÛ»ç
È¿¼º·¹ÀÌÀú
¸ðµ¨¸í
-
¼³Ä¡Àå¼Ò
C5 MAKER SPACE 3(ÁöÇÏ)
Àåºñ¸í
Áß Àû¿Ü¼± ·¹ÀÌÀú(Mid-infrared laser)
Á¦ÀÛ»ç
Daylight Solutions
¸ðµ¨¸í
MIRCcat-QT-2100
¼³Ä¡Àå¼Ò
C5 [232È£]½ÇÇè½Ç
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
Á¦ÀÛ»ç
Carl Zeiss
¸ðµ¨¸í
GeminiSEM 500
¼³Ä¡Àå¼Ò
RIST1µ¿ 1153È£
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
Á¦ÀÛ»ç
Carl Zeiss
¸ðµ¨¸í
AURIGA
¼³Ä¡Àå¼Ò
RIST1µ¿ 1163È£
Àåºñ¸í
ÁÖ»çÇü ¿ÀÁ¦ ÀüÀÚÇö¹Ì°æ(Scanning Auger Electron Spectroscopy (AES) Nanoprobe)
Á¦ÀÛ»ç
ULVAC-PHI
¸ðµ¨¸í
PHI 700
¼³Ä¡Àå¼Ò
RIST1µ¿ 1163È£
Àåºñ¸í
¼öÂ÷º¸Á¤ ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs-Corrected Scanning Transmission Electron Microscope (Cs-STEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JEM-ARM200F
¼³Ä¡Àå¼Ò
RIST1µ¿ 1176È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JSM-6480LV
¼³Ä¡Àå¼Ò
RIST1µ¿ 1187È£
Àåºñ¸í
½ÃÂ÷¿­ºÐ¼®/½ÃÂ÷Áֻ翭·®ºÐ¼®±â(Differential Thermal Analysis (DTA)/Differential Scanning Calorimeter (DSC))
Á¦ÀÛ»ç
SETARAM Instrumentation
¸ðµ¨¸í
Labsys DTA/DSC
¼³Ä¡Àå¼Ò
RIST1µ¿ 1188È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
HITACHI
¸ðµ¨¸í
S-3400N
¼³Ä¡Àå¼Ò
RIST1µ¿ 1190È£
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JSM-7600F
¼³Ä¡Àå¼Ò
RIST1µ¿ 1192È£
Àåºñ¸í
·¹ÀÌÀú À¯µµ ÇöóÁ ºÐ±¤ºÐ¼®±â(Tandem Laser-ablation Laser-induced Breakdown Spectrometer (LA-LIBS))
Á¦ÀÛ»ç
Applied Spectra
¸ðµ¨¸í
J200
¼³Ä¡Àå¼Ò
RIST1µ¿ 1306È£
Àåºñ¸í
·¹ÀÌÀú ȸÀý ÀÔÀÚ ºÐ¼®±â(Laser Diffraction Particle Size Analyzer)
Á¦ÀÛ»ç
Malvern Instruments
¸ðµ¨¸í
MASTERSIZER 2000
¼³Ä¡Àå¼Ò
RIST1µ¿ 1320È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
Á¦ÀÛ»ç
OLYMPUS
¸ðµ¨¸í
OLS3000
¼³Ä¡Àå¼Ò
RIST2µ¿ 2179È£
Àåºñ¸í
ÁÖ»ç Åõ°ú ÀüÀÚÇö¹Ì°æ(Scanning Transmission Electron Microscope (STEM))
Á¦ÀÛ»ç
COXEM
¸ðµ¨¸í
CX-200
¼³Ä¡Àå¼Ò
RIST3µ¿ 3188È£
Àåºñ¸í
¿¢½Ã¸Ó ·¹ÀÌÀú ½Ã½ºÅÛ(Excimer Laser System)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
COMPex 201 F
¼³Ä¡Àå¼Ò
RIST3µ¿ 3263È£
Àåºñ¸í
ÆÞ½º ·¹ÀÌÀú ÁõÂø ½Ã½ºÅÛ(Pulsed Laser Deposition (PLD) System)
Á¦ÀÛ»ç
HIGGSLAB
¸ðµ¨¸í
PLD SYSTEM
¼³Ä¡Àå¼Ò
RIST3µ¿ 3263È£
Àåºñ¸í
¿­Áß·®-½ÃÂ÷Áֻ翭·®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
Á¦ÀÛ»ç
TA Instruments
¸ðµ¨¸í
SDT Q600
¼³Ä¡Àå¼Ò
RIST3µ¿ 3278È£
Àåºñ¸í
ÆÞ½º ·¹ÀÌÀú ÁõÂø ½Ã½ºÅÛ(Pulsed Laser Deposition (PLD) System)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
COMPex Pro 102 F
¼³Ä¡Àå¼Ò
RIST3µ¿ 3282È£
Àåºñ¸í
»ö¼Ò ·¹ÀÌÀú(Dye Laser)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
899
¼³Ä¡Àå¼Ò
RIST3µ¿ 3289È£
Àåºñ¸í
½ÃÂ÷ ÁÖ»ç ¿­·®ÃøÁ¤±â(Differential Scanning Calorimeter (DSC))
Á¦ÀÛ»ç
PerkinElmer
¸ðµ¨¸í
DSC 4000
¼³Ä¡Àå¼Ò
RIST3µ¿ 3312È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(S.E.M(SCANNING ELECTRON MICROSCOPE))
Á¦ÀÛ»ç
JEOL LTD
¸ðµ¨¸í
JSM-6390LV
¼³Ä¡Àå¼Ò
±â°è½ÇÇ赿 106È£
Àåºñ¸í
´ÙÀÌ¿Àµå ·¹ÀÌÁ® ½Ã½ºÅÛ(Diode Laser System)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
Chameleon Vision 2
¼³Ä¡Àå¼Ò
±â°è½ÇÇ赿 206È£
Àåºñ¸í
ÆèÅäÃÊ ÆÞ½º ·¹ÀÌÀú ½Ã½ºÅÛ(Femtosecond Pulse Laser System)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
Chameleon
¼³Ä¡Àå¼Ò
±â°è½ÇÇ赿 206È£
Àåºñ¸í
·¹ÀÌÀú ±¸µ¿ ±¤¿ø(Laser-driven Light Source (LSDS))
Á¦ÀÛ»ç
ENERGETIQ TECHNOLOGY
¸ðµ¨¸í
EQ-1500
¼³Ä¡Àå¼Ò
±â°è½ÇÇ赿 206È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JSM-7401F
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø 103È£
Àåºñ¸í
ÃʰíÁø°øÀú¿Â ÁÖ»çÅͳθµÇö¹Ì°æ(Ultra High Vacuum Low Temperature Scanning Tunneling Microscopy (STM))
Á¦ÀÛ»ç
Unisoku
¸ðµ¨¸í
USM 1200
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 101È£
Àåºñ¸í
¸¶½ºÅ©¸®½º ·¹ÀÌÀú ¸®¼Ò±×·¡ÇÇ(Maskless Laser Lithography, MLA150)
Á¦ÀÛ»ç
ÁÖ½Äȸ»ç³ª¿ì
¸ðµ¨¸í
MLA150
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø 2Ãþ 216È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JEM-2100F(with STEM Cs corrector)
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM ½Ç
Àåºñ¸í
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope (Cs-corrected HR-STEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JEM-2200FS
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM-2200FS½Ç
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
Á¦ÀÛ»ç
LEO Elektronrnmikroskopie GmbH
¸ðµ¨¸í
FE-SEM
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
·¹ÀÌÀú ¸®¼Ò±×·¡ÇÇ ½Ã½ºÅÛ(Laser Lithography system)
Á¦ÀÛ»ç
Heidelberg Instruments
¸ðµ¨¸í
DWL-200
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
ÀÓ°èÄ¡¼ö ÃøÁ¤ ÁÖ»çÀüÀÚÇö¹Ì°æ(Critical Dimension Scanning Electron Microscope (CD-SEM))
Á¦ÀÛ»ç
HITACHI
¸ðµ¨¸í
S-9380
¼³Ä¡Àå¼Ò
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
Àåºñ¸í
·¹ÀÌÀú ¹Ì¼¼ ÇØºÎ ½Ã½ºÅÛ(Laser Microdissection Microscope System)
Á¦ÀÛ»ç
Carl Zeiss
¸ðµ¨¸í
PALM MicroBeam
¼³Ä¡Àå¼Ò
»ý¸í°øÇבּ¸¼¾ÅÍ 341È£
Àåºñ¸í
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope(Cs-corrected HR-STEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JEM-2200FS (UHR)
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 109È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
HITACHI
¸ðµ¨¸í
S-3400N
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 111È£
Àåºñ¸í
½ÃÂ÷ ÁÖ»ç ¿­·®ÃøÁ¤±â(Differential Scanning Calorimeter (DSC))
Á¦ÀÛ»ç
SETARAM Instrumentation
¸ðµ¨¸í
Labsys Evo
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 112È£
Àåºñ¸í
·¹ÀÌÀú ½Ã½ºÅÛ(Laser System)
Á¦ÀÛ»ç
KIMMON KOHA
¸ðµ¨¸í
IK3301R-G
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 206È£
Àåºñ¸í
¿¢½Ã¸Ó ·¹ÀÌÀú ½Ã½ºÅÛ(Excimer Laser System)
Á¦ÀÛ»ç
LAMBDA PHYSIK AG
¸ðµ¨¸í
Compex 205
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 208È£
Àåºñ¸í
ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM))
Á¦ÀÛ»ç
Veeco
¸ðµ¨¸í
Dimension 3100
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 208È£
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚ Çö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
Á¦ÀÛ»ç
PHILIPS ELECTRON OPTICS B.V.
¸ðµ¨¸í
XL30S FEG
¼³Ä¡Àå¼Ò
Á¦1°øÇаü 306-1È£
Àåºñ¸í
DPSS ·¹ÀÌÀú(Diode-pumped Solid-state (DPSS) Laser)
Á¦ÀÛ»ç
LIGHTHOUSE PHOTONICS
¸ðµ¨¸í
Sprout-G-12W
¼³Ä¡Àå¼Ò
Á¦2°øÇаü 504È£
Àåºñ¸í
¹ÝµµÃ¼ ·¹ÀÌÀú(Tunable Semiconductor Laser)
Á¦ÀÛ»ç
Santec
¸ðµ¨¸í
TSL-550
¼³Ä¡Àå¼Ò
Á¦3°øÇаü 308È£
Àåºñ¸í
¿¢½Ã¸Ó ·¹ÀÌÀú ½Ã½ºÅÛ(Excimer Laser System)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
COMPex Pro
¼³Ä¡Àå¼Ò
Á¦3°øÇаü 206È£
Àåºñ¸í
´ÙÀÌ¿Àµå ·¹ÀÌÀú Á¶Àý±â(Digital Controller for Diode Lasers)
Á¦ÀÛ»ç
Toptica Photonics
¸ðµ¨¸í
DLC pro
¼³Ä¡Àå¼Ò
Á¦3°øÇаü 402È£
Àåºñ¸í
ÆèÅäÃÊ ÆÞ½º ·¹ÀÌÀú ½Ã½ºÅÛ(Femtosecond Pulse Laser System)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
Chameleon
¼³Ä¡Àå¼Ò
Á¦3°øÇаü 502AÈ£
Àåºñ¸í
¿¢½Ã¸Ó ·¹ÀÌÀú ½Ã½ºÅÛ(Excimer Laser System)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
COMPex Pro 199F
¼³Ä¡Àå¼Ò
Á¦3°øÇаü 508È£
Àåºñ¸í
³ª³ë½Ã½º SPM Á¶Àý ½Ã½ºÅÛ(Nanonis Scanning Probe Microscopy (SPM) Control System)
Á¦ÀÛ»ç
SPECS
¸ðµ¨¸í
SPECS Nanonis Controller
¼³Ä¡Àå¼Ò
Á¦5°øÇаü 008È£
Àåºñ¸í
¿­Áß·®-½ÃÂ÷Áֻ翭·®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
Á¦ÀÛ»ç
Mettler Toledo
¸ðµ¨¸í
Mettler Toledo AG
¼³Ä¡Àå¼Ò
Á¦5°øÇаü 206È£
Àåºñ¸í
ÆèÅäÃÊ ·¹ÀÌÀú ½Ã½ºÅÛ(Femtosecond Laser System)
Á¦ÀÛ»ç
COHERENT
¸ðµ¨¸í
Libra
¼³Ä¡Àå¼Ò
Á¦5°øÇаü 406È£
Àåºñ¸í
ÆÄÀå °¡º¯Çü ³ª³ëÃÊ ·¹ÀÌÀú(Tunable Wavelength Nanosecond Lasers)
Á¦ÀÛ»ç
EKSPLA
¸ðµ¨¸í
NT352
¼³Ä¡Àå¼Ò
Á¦5°øÇаü 406È£
Àåºñ¸í
·¹ÀÌÀú À¯µµºØ±« ºÐ±¤±â(Laser-induced Breakdown Spectroscopy (LIBS))
Á¦ÀÛ»ç
Applied Spectra
¸ðµ¨¸í
Aurora LIBS module
¼³Ä¡Àå¼Ò
Á¦5°øÇаü 423È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
Bio-logic SAS
¸ðµ¨¸í
M470
¼³Ä¡Àå¼Ò
Áö°î¿¬±¸µ¿ 228È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JSM-6010LV
¼³Ä¡Àå¼Ò
Áö°î¿¬±¸µ¿ 232È£
Àåºñ¸í
°í¿Â½ÃÂ÷Áֻ翭·®°è(High Temperature Differential Scanning Calorimeter)
Á¦ÀÛ»ç
¢ß½ÅÄÚ¿¥¾ØÆ¼
¸ðµ¨¸í
Labsys Evo DSC
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 480È£
Àåºñ¸í
·¹ÀÌÀú ȸÀý ÀÔÀÚ ºÐ¼®±â(Laser Diffraction Particle Size Analyzer)
Á¦ÀÛ»ç
Malvern Instruments
¸ðµ¨¸í
MASTERSIZER 2000
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 546È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
Á¦ÀÛ»ç
Lasertec Corporation
¸ðµ¨¸í
VL2000DX
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 546È£
Àåºñ¸í
¿­Áß·®-½ÃÂ÷Áֻ翭·®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
Á¦ÀÛ»ç
Mettler Toledo
¸ðµ¨¸í
TGA/DSC1
¼³Ä¡Àå¼Ò
ö°­´ëÇпø 546È£
Àåºñ¸í
¸ÅÆ®¸¯½º º¸Á¶ ·¹ÀÌÀú Å»Âø ÀÌ¿ÂÈ­ Áú·®ºÐ¼®±â(Matrix Assisted Laser Desorption/Ionization Time-of-Flight (MALDI-TOF) Mass Spectrometer)
Á¦ÀÛ»ç
BRUKER
¸ðµ¨¸í
Autoflex Speed LRF
¼³Ä¡Àå¼Ò
È­Çаü 112È£
Àåºñ¸í
¸ÅÆ®¸¯½º º¸Á¶ ·¹ÀÌÀú Å»Âø ÀÌ¿ÂÈ­ Áú·®ºÐ¼®±â(Matrix Assisted Laser Desorption/Ionization Time-of-Flight (MALDI-TOF) Mass Spectrometer)
Á¦ÀÛ»ç
Bruker
¸ðµ¨¸í
Autoflex Max LRF
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 320È£
Àåºñ¸í
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
SEC
¸ðµ¨¸í
SNE4500M
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 322È£
Àåºñ¸í
¿­Áß·®-½ÃÂ÷Áֻ翭·®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC))
Á¦ÀÛ»ç
TA Instruments
¸ðµ¨¸í
SDT Q600
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 322È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
Á¦ÀÛ»ç
OLYMPUS
¸ðµ¨¸í
FV3000
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 333È£
Àåºñ¸í
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
SEC
¸ðµ¨¸í
SNE4000M
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 410È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
Á¦ÀÛ»ç
Carl Zeiss
¸ðµ¨¸í
LSM 5
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 414È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
Á¦ÀÛ»ç
JEOL
¸ðµ¨¸í
JSM-6510
¼³Ä¡Àå¼Ò
ȯ°æ°øÇе¿ 414È£
»ç¿ëÁ¤º¸
Àåºñ¿ÀÇ¿©ºÎ
¡Û
ÀÚÀ²»ç¿ë¿©ºÎ
¡Û
»ç¿ë·á
±³³»(40,000¿ø/hr), ±³¿Ü(80,000¿ø/hr)
ÀÚ»êÁ¤º¸
Ãëµæ±Ý¾×
\ 339,928,578
ÃëµæÀÏ
2022-05-24
ÂüÁ¶»çÇ×
÷ºÎÆÄÀÏ
URL
Ű¿öµå
XS
SM
MD
LG
77 Cheongam-ro, Nam-gu, Pohang, Gyeongbuk, Republic of Korea (37673)
+82-54-279-3653
Copyright ¨Ï All rights Reserved.
[Àӽà °³¹ß¿µ¿ª º¸±â] 216.73.217.130