±âº»Á¤º¸ |
¼³ºñ¹øÈ£ |
10107300 |
Àåºñ¸í(ÇѱÛ) |
¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â
|
Àåºñ¸í(¿µ¹®) |
Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC) |
Á¦ÀÛ»ç |
TA Instruments |
¸ðµ¨¸í |
SDT Q600 |
»ó¼¼Á¤º¸ |
Àåºñ»ç¾ç |
Simultaneous Thermal Analyzers measure both heat flow & weight changes in a material as a function of temperature (or time) under a controlled atmosphere.
A simultaneous DSC-TGA can be used in a phases of research, quality control, and manufacturing operations. TA Instruments offers the Q600 for DSC-TGA measurements up to 1500¡ÆC.
Sensitive, rugged and reliable are words that describe the TA Instruments SDT Q600, a second generation simultaneous TGA / DSC that provides research quality results on a broad range of samples over a wide temperature range. Its strong performance, ease-of-use, and our unmatched support make the Q600 an excellent investment for any laboratory. |
Ȱ¿ëºÐ¾ß |
¿Áß·®ºÐ¼® |
Àåºñ¿î¿µÀη |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 322È£
|
¼Ò¼Ó |
ÈÇаøÇаú |
¼º¸í |
Â÷ÇüÁØ |
ÀüÈ |
054-279-2280 |
À̸ÞÀÏ |
hjcha@postech.ac.kr |
µ¿ÀÏ/À¯»çÀåºñÁ¤º¸ |
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ (Confocal Laser Scanning Microscope ) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
LSM 900 with Airyscan 2 |
¼³Ä¡Àå¼Ò |
C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
GeminiSEM 500 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1153È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
AURIGA |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1163È£
|
|
Àåºñ¸í |
ÁÖ»çÇü ¿ÀÁ¦ ÀüÀÚÇö¹Ì°æ(Scanning Auger Electron Spectroscopy (AES) Nanoprobe) |
Á¦ÀÛ»ç |
ULVAC-PHI |
¸ðµ¨¸í |
PHI 700 |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1163È£
|
|
Àåºñ¸í |
¼öÂ÷º¸Á¤ ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs-Corrected Scanning Transmission Electron Microscope (Cs-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-ARM200F |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1176È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6480LV |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1187È£
|
|
Àåºñ¸í |
½ÃÂ÷¿ºÐ¼®/½ÃÂ÷Áֻ翷®ºÐ¼®±â(Differential Thermal Analysis (DTA)/Differential Scanning Calorimeter (DSC)) |
Á¦ÀÛ»ç |
SETARAM Instrumentation |
¸ðµ¨¸í |
Labsys DTA/DSC |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1188È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-3400N |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1190È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-7600F |
¼³Ä¡Àå¼Ò |
RIST1µ¿ 1192È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
OLS3000 |
¼³Ä¡Àå¼Ò |
RIST2µ¿ 2179È£
|
|
Àåºñ¸í |
ÁÖ»ç Åõ°ú ÀüÀÚÇö¹Ì°æ(Scanning Transmission Electron Microscope (STEM)) |
Á¦ÀÛ»ç |
COXEM |
¸ðµ¨¸í |
CX-200 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3188È£
|
|
Àåºñ¸í |
¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC)) |
Á¦ÀÛ»ç |
TA Instruments |
¸ðµ¨¸í |
SDT Q600 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3278È£
|
|
Àåºñ¸í |
½ÃÂ÷ ÁÖ»ç ¿·®ÃøÁ¤±â(Differential Scanning Calorimeter (DSC)) |
Á¦ÀÛ»ç |
PerkinElmer |
¸ðµ¨¸í |
DSC 4000 |
¼³Ä¡Àå¼Ò |
RIST3µ¿ 3312È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(S.E.M(SCANNING ELECTRON MICROSCOPE)) |
Á¦ÀÛ»ç |
JEOL LTD |
¸ðµ¨¸í |
JSM-6390LV |
¼³Ä¡Àå¼Ò |
±â°è½ÇÇ赿 106È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-7401F |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 103È£
|
|
Àåºñ¸í |
ÃʰíÁø°øÀú¿Â ÁÖ»çÅͳθµÇö¹Ì°æ(Ultra High Vacuum Low Temperature Scanning Tunneling Microscopy (STM)) |
Á¦ÀÛ»ç |
Unisoku |
¸ðµ¨¸í |
USM 1200 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø 1Ãþ 101È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2100F(with STEM Cs corrector) |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM ½Ç
|
|
Àåºñ¸í |
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope
(Cs-corrected HR-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2200FS |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø TEM-2200FS½Ç
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
LEO Elektronrnmikroskopie GmbH |
¸ðµ¨¸í |
FE-SEM |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
ÀÓ°èÄ¡¼ö ÃøÁ¤ ÁÖ»çÀüÀÚÇö¹Ì°æ(Critical Dimension Scanning Electron Microscope (CD-SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-9380 |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë
|
|
Àåºñ¸í |
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope(Cs-corrected HR-STEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JEM-2200FS (UHR) |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 109È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
HITACHI |
¸ðµ¨¸í |
S-3400N |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 111È£
|
|
Àåºñ¸í |
½ÃÂ÷ ÁÖ»ç ¿·®ÃøÁ¤±â(Differential Scanning Calorimeter (DSC)) |
Á¦ÀÛ»ç |
SETARAM Instrumentation |
¸ðµ¨¸í |
Labsys Evo |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 112È£
|
|
Àåºñ¸í |
ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM)) |
Á¦ÀÛ»ç |
Veeco |
¸ðµ¨¸í |
Dimension 3100 |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 208È£
|
|
Àåºñ¸í |
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚ Çö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM)) |
Á¦ÀÛ»ç |
PHILIPS ELECTRON OPTICS B.V. |
¸ðµ¨¸í |
XL30S FEG |
¼³Ä¡Àå¼Ò |
Á¦1°øÇаü 306-1È£
|
|
Àåºñ¸í |
³ª³ë½Ã½º SPM Á¶Àý ½Ã½ºÅÛ(Nanonis Scanning Probe Microscopy (SPM) Control System) |
Á¦ÀÛ»ç |
SPECS |
¸ðµ¨¸í |
SPECS Nanonis Controller |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 008È£
|
|
Àåºñ¸í |
¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC)) |
Á¦ÀÛ»ç |
Mettler Toledo |
¸ðµ¨¸í |
Mettler Toledo AG |
¼³Ä¡Àå¼Ò |
Á¦5°øÇаü 206È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
Bio-logic SAS |
¸ðµ¨¸í |
M470 |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 228È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6010LV |
¼³Ä¡Àå¼Ò |
Áö°î¿¬±¸µ¿ 232È£
|
|
Àåºñ¸í |
°í¿Â½ÃÂ÷Áֻ翷®°è(High Temperature Differential Scanning Calorimeter) |
Á¦ÀÛ»ç |
¢ß½ÅÄÚ¿¥¾ØÆ¼ |
¸ðµ¨¸í |
Labsys Evo DSC |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 480È£
|
|
Àåºñ¸í |
¿Áß·®ºÐ¼®±â(Thermogravimetric Sorption Analyzer (TGA)) |
Á¦ÀÛ»ç |
RUBOTHERM |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
Lasertec Corporation |
¸ðµ¨¸í |
VL2000DX |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
¿Áß·®ºÐ¼®±â(Thermogravimetric Analyzer) |
Á¦ÀÛ»ç |
RUBOTHERM |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
¿Áß·®ºÐ¼®±â(Thermogravimetric Sorption Analyzer (TGA)) |
Á¦ÀÛ»ç |
RUBOTHERM |
¸ðµ¨¸í |
High Pressure TGA |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
¿Áß·®-½ÃÂ÷Áֻ翷®ºÐ¼®±â(Thermogravimetric Analysis-Differential Scanning Calorimetry (TGA-DSC)) |
Á¦ÀÛ»ç |
Mettler Toledo |
¸ðµ¨¸í |
TGA/DSC1 |
¼³Ä¡Àå¼Ò |
ö°´ëÇпø 546È£
|
|
Àåºñ¸í |
µî¿Â¹Ì¼¼¿·®°è(IMC (Isothermal Microcalorimetry)) |
Á¦ÀÛ»ç |
TA Instruments Korea Unit of waters korea, Ltd |
¸ðµ¨¸í |
TAM IV XL |
¼³Ä¡Àå¼Ò |
ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
|
|
Àåºñ¸í |
ÀúÀü¾Ð °íºÐÇØ´É Àü°è¹æÃâÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope) |
Á¦ÀÛ»ç |
CARL ZEISS MICROSCOP |
¸ðµ¨¸í |
Gemini 360 |
¼³Ä¡Àå¼Ò |
ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
|
|
Àåºñ¸í |
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
SEC |
¸ðµ¨¸í |
SNE4500M |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 322È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
OLYMPUS |
¸ðµ¨¸í |
FV3000 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 333È£
|
|
Àåºñ¸í |
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
SEC |
¸ðµ¨¸í |
SNE4000M |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 410È£
|
|
Àåºñ¸í |
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope) |
Á¦ÀÛ»ç |
Carl Zeiss |
¸ðµ¨¸í |
LSM 5 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 414È£
|
|
Àåºñ¸í |
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM)) |
Á¦ÀÛ»ç |
JEOL |
¸ðµ¨¸í |
JSM-6510 |
¼³Ä¡Àå¼Ò |
ȯ°æ°øÇе¿ 414È£
|