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10005257 |
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KLA TENCOR CORP. |
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Alpha-step 500 |
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The Alpha-Step 500 Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and stop height in a variety of applications. It features the ability to measure micro-roughness with up to 1A (0.004 min.) resolution over short distances as well as waviness over a full, 10-mm (0.4-in.) scan. The Alpha-Step 500 can profile a variety of materials, including: Magnetic disks, Semiconductor wafers, Precision-machined and polished surfaces, Ceramics for micro-electronics, Glass for flat panel displays & Optical surfaces. |
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054-279-2152 |
À̸ÞÀÏ |
jllee@postech.ac.kr |
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Ç¥¸é´ÜÂ÷ÃøÁ¤±â(Surface Profiler) |
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Veeco |
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Dektak 150 |
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3D Ç¥¸éÃøÁ¤ ½Ã½ºÅÛ(3D Optical Surface Metrology System) |
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Leica Microsystems |
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DCM 3D |
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|
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Á¢ÃË½Ä Ç¥¸é ´ÜÂ÷ÃøÁ¤±â(Contact Surface Profiler) |
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KLA Tencor |
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D-600 |
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|
Àåºñ¸í |
¹Ú¸·ÃøÁ¤±â(3D Profiler) |
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I&A TECHNOLOGY INC. |
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3D Profiler |
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¾ç¸é Á¤·Ä ³ë±¤±â(Double Side Alignment Stepper) |
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ASML |
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PAS550 200B |
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³ª³ë Ç¥¸é ÇÁ·ÎÆÄÀÏ·¯(Nano Surface Profiler) |
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³ª³ë½Ã½ºÅÛ¢ß |
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NanoScan-E1000(P) |
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|
Àåºñ¸í |
Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA)) |
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SurForce LLC |
¸ðµ¨¸í |
SFA 2000 |
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|
Àåºñ¸í |
Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA)) |
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SurForce LLC |
¸ðµ¨¸í |
SFA 2000 |
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|
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ºñÇ¥¸éÀû ºÐ¼®±â(Automated Surface Area&Pore Size Analyzer) |
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Chunwoo America, Inc |
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NOVA 1000e |
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|
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³ª³ë¼¼°ø Ư¼º ¹× BET Ç¥¸éÀû ÃøÁ¤Àåºñ(Nanoporosity & Surface Area Analyzer) |
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(ÁÖ)¹Ì·¡¿¡½º¾ÆÀÌ |
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nanoPOROSITY (BET) |
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|
Àåºñ¸í |
ºñÇ¥¸éÀû ºÐ¼®±â(Surface Area Analyzer) |
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micromeritics |
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ASAP 2010 |
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ȸ´ç 50,000¿ø |
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\ 48,595,196 |
ÃëµæÀÏ |
1998-12-14 |
÷ºÎÆÄÀÏ |
|
URL |
https://www.kla-tencor.com/ko |
| µÎ²² ÃøÁ¤, ¾ËÆÄ ½ºÅÜ | |