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924614940 |
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Veeco |
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Dektak 150 |
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- Best Measurement Repeatability - Greatest Sample Flexibility - Lowest Noise Floor - Highest Value - Optimum Modularity |
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Surface Profiling |
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Æ÷Ç×»ê¾÷°úÇבּ¸¿ø(RIST) |
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054-279-6951 |
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analysis6951@rist.re.kr |
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3D Ç¥¸éÃøÁ¤ ½Ã½ºÅÛ(3D Optical Surface Metrology System) |
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Leica Microsystems |
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DCM 3D |
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Á¢ÃË½Ä Ç¥¸é ´ÜÂ÷ÃøÁ¤±â(Contact Surface Profiler) |
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KLA Tencor |
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D-600 |
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¹Ú¸·ÃøÁ¤±â(3D Profiler) |
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I&A TECHNOLOGY INC. |
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3D Profiler |
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Ç¥¸é´ÜÂ÷ÃøÁ¤±â(Alpha Step Surface Profiler) |
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KLA TENCOR CORP. |
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Alpha-step 500 |
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NanoScan-E1000(P) |
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Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA)) |
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SurForce LLC |
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SFA 2000 |
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Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA)) |
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SurForce LLC |
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SFA 2000 |
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ºñÇ¥¸éÀû ºÐ¼®±â(Automated Surface Area&Pore Size Analyzer) |
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Chunwoo America, Inc |
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NOVA 1000e |
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³ª³ë¼¼°ø Ư¼º ¹× BET Ç¥¸éÀû ÃøÁ¤Àåºñ(Nanoporosity & Surface Area Analyzer) |
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(ÁÖ)¹Ì·¡¿¡½º¾ÆÀÌ |
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nanoPOROSITY (BET) |
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ºñÇ¥¸éÀû ºÐ¼®±â(Surface Area Analyzer) |
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micromeritics |
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ASAP 2010 |
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2014-02-14 |
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URL |
https://www.upc.edu/sct/ca/documents_equipament/d_81_id-399.pdf |
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