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Equipment Information
ÅõÆ÷Åæ Çö¹Ì°æ(3D Ȧ·Î±×·¡ÇÈ ´Ù±¤ÀÚ Çö¹Ì°æ)(Ultima 2-Photon Microscope)
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Equip. Info.
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Reservation
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10200181
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ÅõÆ÷Åæ Çö¹Ì°æ(3D Ȧ·Î±×·¡ÇÈ ´Ù±¤ÀÚ Çö¹Ì°æ)
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Ultima 2-Photon Microscope
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bruker
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Ultims 2P plus
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Resonant Scanner ±â¹Ý °í¼Ó ·¹ÀÌÀú ½ºÄ³´×
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Ç¥ÁØ ½Ã¾ß: FN 22.7 mm
¿À¹ö½ºÄµ ½Ã¾ß: FN 28 mm
Nikon 16X/0.8 NA ´ë¹°·»Áî »ç¿ë ½Ã
Ç¥ÁØ: 1.11 ¡¿ 1.11 mm
¿À¹ö½ºÄµ: 1.4 ¡¿ 1.4 mm

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NeuraLight 3D Ultra SLM Module
3Â÷¿ø ´ÙÁß ´º·± µ¿½Ã ±¤ÀÚ±Ø °¡´É
ÃÖ´ë 600 Hz À§»ó Àüȯ ¼Óµµ
15.4 ¡¿ 15.4 mm ½Ã¾ß°¢

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ETL Remote Focusing
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Hamamatsu GaAsP PMT 2ä³Î
High-Speed Shutter Àû¿ë

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Coherent Axon Laser (920 nm)
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Coherent Laser (1064 nm)
µ¶¸³ ÀÌÁß ±¤ÇÐ °æ·Î ±¸¼º

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Nikon CFI75 16X/0.80 Water Objective
Working Distance: 3.0 mm

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4D(X,Y,Z,T) À̹Ì¡
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Functional Mapping
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Motorized X-Y Stage
Motorized Z-axis (ÃÖ¼Ò ºÐÇØ´É 100 nm)
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¿¬±¸¿ë »ï¾È Çö¹Ì°æ(Reseach Trinocular Microscope)
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OLYMPUS
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BX43
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383È£
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Park Systems
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XE7
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C5 228È£
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µµ¸³ Çö¹Ì°æ(Inverted Microscope)
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MCL
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MCL-NSOM
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C5 228È£
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°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ (Confocal Laser Scanning Microscope )
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Carl Zeiss
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LSM 900 with Airyscan 2
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C5, 722È£(¹ÙÀÌ¿ÀÇコÄɾÅÍ)
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Park Systems
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XE7
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RIST1µ¿ 1139È£
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Bruker
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Dimension Icon with ScanAsyst
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RIST1µ¿ 1152È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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Carl Zeiss
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GeminiSEM 500
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RIST1µ¿ 1153È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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Carl Zeiss
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AURIGA
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RIST1µ¿ 1163È£
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¼öÂ÷º¸Á¤ ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs-Corrected Scanning Transmission Electron Microscope (Cs-STEM))
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JEOL
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JEM-ARM200F
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RIST1µ¿ 1176È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-6480LV
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RIST1µ¿ 1187È£
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Àü°è¹æÃâ Çö¹Ì°æ(Field Emission Electron Microscope)
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JEOL
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JEM-2100F
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RIST1µ¿ 1188È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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HITACHI
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S-3400N
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RIST1µ¿ 1190È£
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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JEOL
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JSM-7600F
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RIST1µ¿ 1192È£
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Àüµ¿ µðÁöÅÐ Çö¹Ì°æ(Opto-digital Motorizing Microscope)
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OLYMPUS
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DSX100
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RIST2µ¿ 2179È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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OLYMPUS
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OLS3000
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RIST2µ¿ 2179È£
Àåºñ¸í
ÁÖ»ç Åõ°ú ÀüÀÚÇö¹Ì°æ(Scanning Transmission Electron Microscope (STEM))
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COXEM
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CX-200
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RIST3µ¿ 3188È£
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Æí±¤ Çö¹Ì°æ(Polarized Stereo Microscope)
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Leica Microsystems
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Z16 APO
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°¡¼Ó±â ÀúÀ帵µ¿ 106È£
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µµ¸³ Çü±¤ Çö¹Ì°æ(Fluorescence Inverted Microscope)
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Carl Zeiss
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Axio Observer A1
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Çü±¤ Çö¹Ì°æ(Fluorescence Microscope)
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Á¦ÀÌ¿ø
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Axio Zoom.V16
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°¡Å縯´ë ÀÇ»ý¸í°øÇבּ¸¼Ò
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ÁÖ»çÀüÀÚÇö¹Ì°æ(S.E.M(SCANNING ELECTRON MICROSCOPE))
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JEOL LTD
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JSM-6390LV
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±â°è½ÇÇ赿 106È£
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-7401F
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Veeco
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Dimension 3100
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ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JEM-2100F(with STEM Cs corrector)
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JEOL
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JEM-2200FS
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Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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LEO Elektronrnmikroskopie GmbH
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FE-SEM
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ÀÓ°èÄ¡¼ö ÃøÁ¤ ÁÖ»çÀüÀÚÇö¹Ì°æ(Critical Dimension Scanning Electron Microscope (CD-SEM))
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HITACHI
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S-9380
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Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
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JEOL
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JEM-1011
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»ý¸í°øÇבּ¸¼¾ÅÍ 156È£
Àåºñ¸í
µµ¸³ Çö¹Ì°æ(Inverted Microscope)
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OLYMPUS
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IX81
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»ý¸í°øÇבּ¸¼¾ÅÍ 328È£
Àåºñ¸í
·¹ÀÌÀú ¹Ì¼¼ ÇØºÎ ½Ã½ºÅÛ(Laser Microdissection Microscope System)
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Carl Zeiss
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PALM MicroBeam
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»ý¸í°øÇבּ¸¼¾ÅÍ 341È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
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JEOL
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JEM-2100 (HR)
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Á¦1°øÇаü 105È£
Àåºñ¸í
±¸¸é¼öÂ÷º¸Á¤ ÃʰíºÐÇØ´É ÁÖ»çÅõ°úÀüÀÚÇö¹Ì°æ(Cs Corrected High-Resolution Scanning Transmission Electron Microscope(Cs-corrected HR-STEM))
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JEOL
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JEM-2200FS (UHR)
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Á¦1°øÇаü 109È£
Àåºñ¸í
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
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HITACHI
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7600H
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Á¦1°øÇаü 111È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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HITACHI
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S-3400N
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Á¦1°øÇаü 111È£
Àåºñ¸í
ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM))
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Veeco
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Dimension 3100
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Á¦1°øÇаü 208È£
Àåºñ¸í
Àü°è¹æ»çÇü ÁÖ»çÀüÀÚ Çö¹Ì°æ(Field Emission Scanning Electron Microscope (FE-SEM))
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PHILIPS ELECTRON OPTICS B.V.
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XL30S FEG
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Á¦1°øÇаü 306-1È£
Àåºñ¸í
µµ¸³ Çö¹Ì°æ(Inverted Microscope)
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OLYMPUS
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IX71
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Á¦2°øÇаü 033È£
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Çö¹Ì°æ Stage ¹× Á¶Àý ½Ã½ºÅÛ(Microscope Stage and Controller System)
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Applied Scientific Instrumentation (ASI)
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MS-2000
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Á¦3°øÇаü 006È£
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´Ù¸ñÀû ¹Ú¸· Ç¥¸é±¸Á¶ ºÐ¼® ¿øÀÚ Çö¹Ì°æ Àåºñ(Muti-purpose Atomic Force Microscope (AFM) System)
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Bruker
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MultiMode 8
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Á¦3°øÇаü 529È£
Àåºñ¸í
µµ¸³ Çö¹Ì°æ(Inverted Microscope)
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OLYMPUS
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CKX41
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Á¦5°øÇаü 204È£
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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SEIKO INSTRUMENTS INC.
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SPI3800N Pro
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Á¦5°øÇаü 206-1È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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Bio-logic SAS
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M470
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Áö°î¿¬±¸µ¿ 228È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-6010LV
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Áö°î¿¬±¸µ¿ 232È£
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Á¤¸³Çö¹Ì°æ(Upright Microscope)
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Leica Microsystems
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DM4000 M
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ö°­´ëÇпø 144-5È£
Àåºñ¸í
Åõ°úÀüÀÚÇö¹Ì°æ(Transmission Electron Microscope (TEM))
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Carl Zeiss
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Ultra-55
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ö°­´ëÇпø 154-6È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
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JEOL
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JSM-7100F
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ö°­´ëÇпø 154-6È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
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JEOL
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JEM-2100F
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ö°­´ëÇпø 161È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
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JEOL
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JXA-8530F
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ö°­´ëÇпø 163È£
Àåºñ¸í
Àü°è¹æ»çÇü Åõ°úÀüÀÚ Çö¹Ì°æ(Field Emission Transmission Electron Microscope (FE-TEM))
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JEOL
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JEM-7900F
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ö°­´ëÇпø 163È£
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TEM¿ë À̿¹иµ½Ã½ºÅÛ(Ion Milling System for Transmission Electron Microscope (TEM))
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¢ßÁö¿¤ÄÚÆÛ·¹À̼Ç
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Gatan model 691
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ö°­´ëÇпø 284È£
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±¤ ÀÚ±â Ä¿ Çö¹Ì°æ(Magneto-Optical Kerr-Microscope)
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Evico magnetics GmbH
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Axio Imager D1m
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ö°­´ëÇпø 374È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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Lasertec Corporation
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VL2000DX
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ö°­´ëÇпø 546È£
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¿ëÀ¶Á¡/Á¢Ã˰¢ ½Ã½ºÅÛ(Heating Microscope)
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export system solutions s.r.i
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misura hsm
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ö°­´ëÇпø 572È£
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ÀúÀü¾Ð °íºÐÇØ´É Àü°è¹æÃâÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Field Emission Scanning Electron Microscope)
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CARL ZEISS MICROSCOP
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Gemini 360
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ģȯ°æ¼ÒÀç´ëÇпø 184, 186È£
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µµ¸³ Çö¹Ì°æ(Inverted Microscope)
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OLYMPUS
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IX73
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Çѱ¹·Îº¿À¶ÇÕ¿¬±¸¿ø 411È£
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Çü±¤ Çö¹Ì°æ(Fluorescence Microscope)
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Carl Zeiss
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Axiolab
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ȯ°æ°øÇе¿ 206-1È£
Àåºñ¸í
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM))
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SEC
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SNE4500M
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ȯ°æ°øÇе¿ 322È£
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Çü±¤ ±Ý¼Ó Çö¹Ì°æ(Fluorescence Metallurgical Microscope)
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OLYMPUS
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BX60
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ȯ°æ°øÇе¿ 333È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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OLYMPUS
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FV3000
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ȯ°æ°øÇе¿ 333È£
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µµ¸³ Çü±¤ Çö¹Ì°æ(Inverted Fluorescence Microscope)
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NIKON
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Eclipse Ti2
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ȯ°æ°øÇе¿ 403È£
Àåºñ¸í
Ź»óÇü ÁÖ»çÀüÀÚÇö¹Ì°æ(Mini Scanning Electron Microscope (SEM))
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SEC
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SNE4000M
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ȯ°æ°øÇе¿ 410È£
Àåºñ¸í
°øÃÊÁ¡ ·¹ÀÌÀú ÁÖ»ç Çö¹Ì°æ(Confocal Laser Scanning Microscope)
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Carl Zeiss
¸ðµ¨¸í
LSM 5
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ȯ°æ°øÇе¿ 414È£
Àåºñ¸í
ÁÖ»çÀüÀÚÇö¹Ì°æ(Scanning Electron Microscope (SEM))
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JEOL
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JSM-6510
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ȯ°æ°øÇе¿ 414È£
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Two-photon microscopy, Multiphoton microscopy, In vivo imaging, brain imaging, calcium imaging, photostimulation, Neural Imaging, SLM, ÀǰøÇм¾ÅÍ, ±Û·ÎÄÃ
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