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MD
LG
Equipment Information
Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA))
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Equip. Info.
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Surface Force Apparatus (SFA)
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SurForce LLC
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SFA 2000
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The SFA 2000 combined with the FECO (Fringes of Equal Chromatic Order) multiple-beam interferometry technique measures forces (static- equilibrium or dynamic- non-equilibrium) between two surfaces in vapors or liquids with a sensitivity of a few nN and a distance resolution of 1 (0.1 nm).
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Park Systems
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XE7
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C5 228È£
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Park Systems
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XE7
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RIST1µ¿ 1139È£
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Bruker
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Dimension Icon with ScanAsyst
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RIST1µ¿ 1152È£
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Ç¥¸é´ÜÂ÷ÃøÁ¤±â(Surface Profiler)
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Veeco
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Dektak 150
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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Veeco
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Dimension 3100
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3D Ç¥¸éÃøÁ¤ ½Ã½ºÅÛ(3D Optical Surface Metrology System)
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Leica Microsystems
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DCM 3D
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Á¢ÃË½Ä Ç¥¸é ´ÜÂ÷ÃøÁ¤±â(Contact Surface Profiler)
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KLA Tencor
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D-600
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Ç¥¸é´ÜÂ÷ÃøÁ¤±â(Alpha Step Surface Profiler)
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KLA TENCOR CORP.
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Alpha-step 500
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Bruker
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MultiMode 8
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NanoScan-E1000(P)
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¿øÀÚ°£·Â Çö¹Ì°æ(Atomic Force Microscope (AFM))
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SEIKO INSTRUMENTS INC.
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SPI3800N Pro
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ERICH NETZSCH GmbH & Co. Holdi
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LFA 467
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Ç¥¸éÈûÃøÁ¤±â(Surface Force Apparatus (SFA))
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SurForce LLC
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SFA 2000
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ºñÇ¥¸éÀû ºÐ¼®±â(Automated Surface Area&Pore Size Analyzer)
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Chunwoo America, Inc
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NOVA 1000e
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nanoPOROSITY (BET)
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ȯ°æ°øÇе¿ 110È£
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Ç¥¸é ¹°¼º ÃøÁ¤±â(Force Tensiometer)
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Kruss
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K100
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ȯ°æ°øÇе¿ 403È£
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ºñÇ¥¸éÀû ºÐ¼®±â(Surface Area Analyzer)
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micromeritics
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ASAP 2010
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2013-02-20
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URL
https://surforcellc.com/sfa-2000-surface-forces-apparatus/
Ű¿öµå
SFA, Ç¥¸éÈûÃøÁ¤±â
XS
SM
MD
LG
77 Cheongam-ro, Nam-gu, Pohang, Gyeongbuk, Republic of Korea (37673)
+82-54-279-3653
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[Àӽà °³¹ß¿µ¿ª º¸±â] 216.73.217.130