¼³ºñ¹øÈ£ |
10065976 |
Àåºñ¸í(ÇѱÛ) |
|
Àåºñ¸í(¿µ¹®) |
|
Á¦ÀÛ»ç |
(ÁÖ)¿¡À̾ÆÀÌÆ¼ |
¸ðµ¨¸í |
CMT-SR2000N |
Àåºñ»ç¾ç |
Sheet resistance measurement Method : contacted by four point probe Rage : 1 mohm.sq ~ 2 Mohm/sq Current Source : 10nA ~ 100mA Wafer size : up to 8inch wafer |
Ȱ¿ëºÐ¾ß |
Silicon wafer ¸¦ ÀüÀÚµ¿À¸·Î Ç¥¸éÀúÇ×À» ÃøÁ¤ÇÒ ¼ö ÀÖ´Â ÃøÁ¤ Àü¿ë PC ¸¦ ÀÌ¿ëÇÏ¿© ¿ø°ÝÁ¦¾î°¡ °¡´É, ÃøÁ¤ÇÑ Data ¸¦ ºÐ¼®ÇÒ ¼ö ÀÖ´Â ±â´É À» Á¦°ø |
¼³Ä¡Àå¼Ò |
³ª³ëÀ¶ÇÕ±â¼ú¿ø Ŭ¸°·ëµ¿ 2Ãþ Ŭ¸°·ë |
¼Ò¼Ó |
³ª³ëÀ¶ÇÕ±â¼ú¿ø |
¼º¸í |
ÀÌÁ¤ÀÍ |
ÀüÈ |
054-279-0267 |
À̸ÞÀÏ |
kb3000@postech.ac.kr |
Àåºñ¸í |
(GLOCAL)°ø°£ Àü»çü Žħ À̵¿ ÀåÄ¡(in situ probe transfer for Spantial transcriptome analysis ) |
Á¦ÀÛ»ç |
10xGENOMICS |
¸ðµ¨¸í |
Visium CytAssist |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
Áø°øÇÁ·Îºê½ºÅ×À̼Ç(Vacuum Chamber Probe Station) |
Á¦ÀÛ»ç |
MS TECH |
¸ðµ¨¸í |
M6VC |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
¿þÀÌÆÛºÐ¼® ÇÁ·Îºê ½ºÅ×À̼Ç(Wafer Prober) |
Á¦ÀÛ»ç |
Cascade Microtech |
¸ðµ¨¸í |
Summit 11000 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
ÇÁ·Îºê ½ºÅ×À̼Ç(Probe Station) |
Á¦ÀÛ»ç |
MS TECH |
¸ðµ¨¸í |
MST8000 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
ÇÁ·Îºê ½ºÅ×À̼Ç(Probe Station) |
Á¦ÀÛ»ç |
UNITEK CORPORATION |
¸ðµ¨¸í |
- |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
X-¼± ±¤ÀüÀÚ ºÐ±¤±â(X-ray Photoelectron Spectrometer (XPS) Microprobe) |
Á¦ÀÛ»ç |
Thermo Scientific |
¸ðµ¨¸í |
ESCALAB 250 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
ÁÖ»çÇü ¿ÀÁ¦ ÀüÀÚÇö¹Ì°æ(Scanning Auger Electron Spectroscopy (AES) Nanoprobe) |
Á¦ÀÛ»ç |
ULVAC-PHI |
¸ðµ¨¸í |
PHI 700 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
ÀüÀÚ¼± ¹Ì¼ÒºÎ ºÐ¼®±â(Electron Probe Microanalyzer (EPMA)) |
Á¦ÀÛ»ç |
SHIMADZU |
¸ðµ¨¸í |
EPMA-1600 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
¹ü¿ë ÇÁ·Îºê ½Ã½ºÅÛ(Universal Measurement Probe System) |
Á¦ÀÛ»ç |
TERALEADER |
¸ðµ¨¸í |
UMP100 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
400 MHz ÇÙÀÚ±â°ø¸íºÐ±¤ºÐ¼®±â(400 MHz Nuclear Magnetic Resonance (NMR) Spectrometer) |
Á¦ÀÛ»ç |
Bruker |
¸ðµ¨¸í |
Avance 400 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
3D ¿øÀÚÇö¹Ì°æ(3D Atom Probe) |
Á¦ÀÛ»ç |
CAMECA Instruments |
¸ðµ¨¸í |
LA-WATAP |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
±¹¼Ò ·¹ÀÌÁ® Àü°èÇü ¿øÀÚ´ÜÃþÇö¹Ì°æ(Local Electrode Atom Probe) |
Á¦ÀÛ»ç |
CAMECA Instruments |
¸ðµ¨¸í |
LEAP 4000X HR |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
Á֯ļöÃøÁ¤±â(Universal Probe Holder) |
Á¦ÀÛ»ç |
MBRAUN |
¸ðµ¨¸í |
MB6000 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM)) |
Á¦ÀÛ»ç |
Veeco |
¸ðµ¨¸í |
Dimension 3100 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
³ª³ë½Ã½º SPM Á¶Àý ½Ã½ºÅÛ(Nanonis Scanning Probe Microscopy (SPM) Control System) |
Á¦ÀÛ»ç |
SPECS |
¸ðµ¨¸í |
SPECS Nanonis Controller |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
1400 ¡ÆC ¼öÁ÷ Æ©ºê ¿Ã³¸® Àåºñ(1400 ¡ÆC Tube furnace) |
Á¦ÀÛ»ç |
Lenton |
¸ðµ¨¸í |
LTF-14/75/610 |
¼³Ä¡Àå¼Ò |
|
Àåºñ¸í |
¿°£¾Ð¿¬±â(Pilot 4Hi-Hot Rolling Mill) |
Á¦ÀÛ»ç |
PTW sreel solution |
¸ðµ¨¸í |
Ư¼öÁ¦ÀÛ |
¼³Ä¡Àå¼Ò |
|
Àåºñ¿ÀÇ¿©ºÎ |
¡Û |
ÀÚÀ²»ç¿ë¿©ºÎ |
¡Û |
»ç¿ë·á |
30,000¿ø/¸Å(Á÷Á¢»ç¿ë 20,000¿ø) |
Ãëµæ±Ý¾× |
\ 31,200,000 |
ÃëµæÀÏ |
2008-03-14 |
÷ºÎÆÄÀÏ |
|
URL |
http://www.fpp.co.kr/products/products_06.html |
| Sheet, Resistance, Rs, point, Ohm/sq, Thickness | |