XS
SM
MD
LG
Equipment Information
½ÃÆ® ÀúÇ× ÃøÁ¤ ½Ã½ºÅÛ(4 Point Probe)
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Equip. Info.
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10065976
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4 Point Probe
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CMT-SR2000N
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Sheet resistance measurement
Method : contacted by four point probe
Rage : 1 mohm.sq ~ 2 Mohm/sq
Current Source : 10nA ~ 100mA
Wafer size : up to 8inch wafer
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(GLOCAL)°ø°£ Àü»çü Žħ À̵¿ ÀåÄ¡(in situ probe transfer for Spantial transcriptome analysis )
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10xGENOMICS
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Visium CytAssist
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BOIC [3311È£]
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Áø°øÇÁ·Îºê½ºÅ×À̼Ç(Vacuum Chamber Probe Station)
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MS TECH
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M6VC
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C5 330È£
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¿þÀÌÆÛºÐ¼® ÇÁ·Îºê ½ºÅ×À̼Ç(Wafer Prober)
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Cascade Microtech
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Summit 11000
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C5 330È£
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ÇÁ·Îºê ½ºÅ×À̼Ç(Probe Station)
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MS TECH
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MST8000
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C5 332È£
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ÇÁ·Îºê ½ºÅ×À̼Ç(Probe Station)
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UNITEK CORPORATION
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LG¿¬±¸µ¿ 212È£
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X-¼± ±¤ÀüÀÚ ºÐ±¤±â(X-ray Photoelectron Spectrometer (XPS) Microprobe)
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Thermo Scientific
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ESCALAB 250
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RIST1µ¿ 1153È£
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ÁÖ»çÇü ¿ÀÁ¦ ÀüÀÚÇö¹Ì°æ(Scanning Auger Electron Spectroscopy (AES) Nanoprobe)
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ULVAC-PHI
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PHI 700
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RIST1µ¿ 1163È£
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ÀüÀÚ¼± ¹Ì¼ÒºÎ ºÐ¼®±â(Electron Probe Microanalyzer (EPMA))
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SHIMADZU
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EPMA-1600
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RIST1µ¿ 1194È£
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¹ü¿ë ÇÁ·Îºê ½Ã½ºÅÛ(Universal Measurement Probe System)
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TERALEADER
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UMP100
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RIST3µ¿ 3170È£
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400 MHz ÇÙÀÚ±â°ø¸íºÐ±¤ºÐ¼®±â(400 MHz Nuclear Magnetic Resonance (NMR) Spectrometer)
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Bruker
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Avance 400
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RIST3µ¿ 3391È£
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3D ¿øÀÚÇö¹Ì°æ(3D Atom Probe)
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CAMECA Instruments
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LA-WATAP
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CAMECA Instruments
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LEAP 4000X HR
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Á֯ļöÃøÁ¤±â(Universal Probe Holder)
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MBRAUN
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MB6000
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ÁÖ»ç ÇÁ·Îºê Çö¹Ì°æ(Scanning Probe Microscope (SPM))
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Veeco
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Dimension 3100
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SPECS
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SPECS Nanonis Controller
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1400 ¡ÆC ¼öÁ÷ Æ©ºê ¿­Ã³¸® Àåºñ(1400 ¡ÆC Tube furnace)
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Lenton
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LTF-14/75/610
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PTW sreel solution
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URL
http://www.fpp.co.kr/products/products_06.html
Ű¿öµå
Sheet, Resistance, Rs, point, Ohm/sq, Thickness
XS
SM
MD
LG
77 Cheongam-ro, Nam-gu, Pohang, Gyeongbuk, Republic of Korea (37673)
+82-54-279-3653
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[Àӽà °³¹ß¿µ¿ª º¸±â] 216.73.217.130